Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
author
statement of authorship
Mahdi Taheri, Natalia Cherezova, Mohammad Saeed Ansari, Maksim Jenihhin, Ali Mahani, Masoud Daneshtalab, Jaan Raik
source
25th International Symposium on Quality Electronic Design (ISQED)
publisher
year of publication
pages
8 p. : ill
conference name, date
25th International Symposium on Quality Electronic Design (ISQED), 3 April 2024 – 5 April 2024
conference location
San Francisco, California, United States
notes
Bibliogr.: 29 ref
scientific publication
teaduspublikatsioon
TalTech department
language
inglise
classifier
Taheri, M., Cherezova, N., Ansari, M.S., Jenihhin, M., Mahani, A., Daneshtalab, M., Raik, J. Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators // 25th International Symposium on Quality Electronic Design (ISQED). : IEEE, 2025. 8 p. : ill.