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fault simulation (keyword)
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1
book article
Accelerating transient fault injection campaigns by using Dynamic HDL Slicing
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore
2019
/
7 p. : ill
https://doi.org/10.1109/NORCHIP.2019.8906932
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2
book article
Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600967
book article
3
book article
DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN accelerators
Taheri, Mahdi
;
Riazati, Mohamad
;
Ahmadilivani, Mohammad Hasan
;
Jenihhin, Maksim
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Sjödin, Mikael
;
Lisper, Björn
2023 24th International Symposium on Quality Electronic Design (ISQED)
2023
/
8 p. : ill
https://doi.org/10.1109/ISQED57927.2023.10129353
book article
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
4
journal article
Distributed approach for parallel exact critical path tracing fault simulation
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
International journal of microelectronics and computer science
2010
/
p. 165-174 : ill
journal article
5
journal article
Distributed fault simulation with collaborative load balancing for VLSI circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Scalable computing : practice and experience
2011
/
p. 153-163 : ill
journal article
6
book article
Efficient fault injection based on dynamic HDL slicing technique
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece
2019
/
p. 52-53 : ill
https://doi.org/10.1109/IOLTS.2019.8854419
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
7
book article EST
/
book article ENG
Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
Taheri, Mahdi
;
Cherezova, Natalia
;
Ansari, Mohammad Saeed
;
Jenihhin, Maksim
;
Mahani, Ali
;
Daneshtalab, Masoud
;
Raik, Jaan
Proceedings of the Twenty Fifth International Symposium on Quality ElectronicDesign : ISQED 2024
2024
/
8 p. : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372
https://doi.org/10.1109/ISQED60706.2024.10528372
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
8
book article
Fast RTL fault simulation using decision diagrams and bitwise set operations
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada
2011
/
p. 164-170
https://ieeexplore.ieee.org/document/6104440
book article
9
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
10
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
11
book article
Modeling sequential circuits with shared structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Marenkov, Mihhail
;
Mironov, Dmitri
;
Viies, Vladimir
Proceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 2014
2014
/
p. 130-135 : ill
book article
12
book article
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators
Taheri, Mahdi
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Jenihhin, Maksim
;
Pappalardo, Salvatore
;
Jimenez, Paul
;
Deveautour, Bastien
;
Bosio, Alberto
2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) : 03-05 April 2024, Kielce, Poland
2024
/
p. 19–24 : ill
https://doi.org/10.1109/DDECS60919.2024.10508925
Article at Scopus
Article at WOS
book article
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
13
book article
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway
2015
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2015.7364406
book article
14
book article EST
/
book article ENG
Special session: reliability assessment recipes for DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Bosio, Alberto
;
Deveautour, Bastien
;
Dos Santos, Fernando Fernandes
;
Guerrero-Balaguera, Juan-David
;
Jenihhin, Maksim
;
Kritikakou, Angeliki
;
Sierra, Robert Limas
;
Raik, Jaan
;
Taheri, Mahdi
42nd IEEE VLSI Test Symposium, VTS 2024 : proceedings
2024
/
11 p. : ill
https://doi.org/10.1109/VTS60656.2024.10538707
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
15
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
16
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 16, displaying
1 - 16
keyword
198
1.
fault simulation
2.
fault simulation with critical path tracing
3.
high-level fault simulation
4.
Parallel Fault Simulation with Critical Path Backtracing
5.
parallel fault-simulation
6.
Fault Injection Simulation
7.
AI-based fault detection
8.
asynchronous fault detection
9.
automatic fault diagnosis
10.
bearing fault diagnosis
11.
bi-directional fault monitoring devices
12.
conditional fault collapsing
13.
control fault models
14.
critical path fault tracing
15.
cross-layer fault tolerance
16.
cross-layered fault management
17.
extended fault class
18.
fault currents
19.
fault analysis
20.
fault analysis model
21.
fault classification
22.
fault classification
23.
fault collapsing
24.
fault compensation
25.
fault coverage
26.
fault current and voltage measurements
27.
Fault current limite
28.
fault current limiter
29.
fault detection
30.
fault detection and classification
31.
fault detection and diagnoses
32.
fault detection and diagnosis
33.
fault detection and diagnostics (FDD)
34.
fault diagnosis
35.
fault diagnostic
36.
fault diagnostic resolution
37.
fault diagnostics
38.
fault dignosis
39.
fault effects
40.
fault emulation
41.
fault equivalence and dominance
42.
fault handling
43.
fault handling strategy
44.
fault indicator
45.
fault injection
46.
fault Interruption
47.
fault localization
48.
fault location
49.
fault management
50.
fault masking
51.
fault modeling
52.
fault models
53.
fault monitoring
54.
fault prediction
55.
fault protection
56.
fault redundancy
57.
fault resilience
58.
fault ride through
59.
Fault ride through enhancement
60.
fault signal
61.
fault simulastion
62.
fault tolerance
63.
fault tolerant
64.
fault tolerant control
65.
fault tolerant operation
66.
fault tolerant router design
67.
fault tolerant systems
68.
fault tree analysis
69.
fault-injection attack
70.
fault-plane solution
71.
fault-resilience
72.
fault-resistant
73.
fault-ride-through (FRT)
74.
fault-tolerance
75.
fault-tolerant
76.
Fault-tolerant (FT) converters
77.
fault-tolerant control
78.
fault-tolerant converter
79.
functional fault model
80.
high-level control fault model
81.
high-level fault coverage
82.
high-level fault model
83.
high-level functional fault model
84.
hybrid fault detection
85.
Katun fault
86.
low-level fault redundancy
87.
no fault found
88.
No-Fault-Found
89.
open circuit fault
90.
photovoltaic fault detection algorithms
91.
PV fault classification
92.
short circuit fault
93.
spectrum-based fault localization
94.
stacking fault
95.
stuck-at fault model
96.
test generation and fault diagnosis
97.
transient fault mitigation
98.
transmission lines fault
99.
annual energy simulation
100.
back traced simulation
101.
building energy simulation
102.
building simulation
103.
casting simulation
104.
CFD simulation
105.
circuit simulation
106.
CoCoViLa simulation environment
107.
computer simulation
108.
computer simulation environments
109.
cooling simulation
110.
co-simulation
111.
data simulation
112.
digital real time simulation
113.
digital shipping simulation
114.
dynamic simulation
115.
electric field simulation
116.
emergency simulation
117.
energy simulation
118.
energy simulation software
119.
environmental performance assessment and simulation
120.
finite element method (FEM) simulation
121.
finite element simulation
122.
fluid flow simulation
123.
FMS modelling and simulation
124.
fullscale simulation
125.
gait simulation
126.
hardware-in-the loop simulation
127.
Hardware-in-the-Loop simulation
128.
hospital simulation
129.
hot/cold pressing and finite element model simulation
130.
hygrothermal simulation
131.
impact scenario simulation
132.
impact-abrasive simulation
133.
intelligent simulation
134.
intelligent simulation environment
135.
LES (large eddy simulation) method
136.
logic models and simulation
137.
logic simulation
138.
long-term simulation
139.
magnetics field simulation
140.
Mathematical simulation
141.
MATLAB simulation
142.
medical simulation
143.
meso-scale simulation
144.
MICA2 simulation
145.
model building and simulation
146.
modeling and simulation
147.
modelling and simulation
148.
Monte Carlo simulation
149.
Monte Carlo simulation (MCS)
150.
multi agent simulation
151.
multiscale simulation
152.
Multi-valued Simulation for Hazard Detection in Digital Circuits
153.
numerical simulation
154.
parallel simulation
155.
phase diagram simulation
156.
power system simulation
157.
process simulation
158.
ray-tracing simulation
159.
real time simulation
160.
real-time simulation
161.
register transfer and gate level simulation
162.
response simulation
163.
rheology simulation
164.
Siemens Tecnomatix Plant Simulation (STPS) platform
165.
signal simulation
166.
signal simulation and modeling
167.
similar material simulation test
168.
simulation
169.
simulation analysis
170.
simulation and analysis
171.
simulation applications
172.
simulation based static optimization
173.
simulation based TMY
174.
simulation model
175.
simulation modeling
176.
simulation models
177.
simulation of air change
178.
simulation of energy consumption
179.
simulation software "Delphin"
180.
simulation trace
181.
simulation training
182.
simulationbased decision support
183.
simulation-based verification
184.
spinach simulation
185.
SUMO simulation
186.
supply chain simulation
187.
system level simulation
188.
systems simulation
189.
TD-DFT simulation
190.
urban simulation
191.
validation of simulation model
192.
wear simulation
193.
vehicle simulation
194.
whole building simulation
195.
visual simulation
196.
3D simulation
197.
5G New Radio simulation
198.
(co-)simulation
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