Fast extended test access via JTAG and FPGAs
statement of authorship
Sergei Devadze, Artur Jutman, Igor Aleksejev, Raimund Ubar
source
International Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings
location of publication
Washington
publisher
year of publication
pages
p. 1-7 : ill
conference name, date
40th International Test Conference ITC'2009, November 1-6, 2009
conference location
Austin, Texas
subject term
ISSN
1089-3539
ISBN
978-1-4244-4867-8
notes
Bibliogr.: 13 ref
TTÜ department
language
inglise
Devadze, S., Jutman, A., Aleksejev, I., Ubar, R.-J. Fast extended test access via JTAG and FPGAs // International Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings. Washington : International Test Conference, 2009. p. 1-7 : ill.