Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Searching

International Test Conference (publisher)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 2
Look more.. (2/150)
Export

export all inquiry results (2)
Save TXT fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

book article
2

book article

FPGA-based synthetic instrumentation for board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Odintsov, Sergei; Wenzel, ThomasProceedings : International Test Conference 20122012 / p. 1-10 : ill https://ieeexplore.ieee.org/document/6401571

book article

Number of records 2, displaying 1 - 2

1. 24th IEEE International Conference on Industrial Technology 2023
2. international relations and international political economy
3. accelerated shelf-life test
4. adaptive test strategy generation
5. antigen test
6. Applications in Test Engineering
7. ASTM G65 dry sand rubber wheel abrasion test
8. Automated Synthesis of Software-based Self-test
9. automated test environment
10. automated test pattern generation
11. automatic test case generation
12. automatic test pattern generation
13. automatic test program generation
14. Auvergne test-bed
15. battery test
16. behavioral test
17. behaviour level test generation
18. bending test
19. bit-error rate test
20. Board and System Test
21. board test
22. bounds test
23. built-in self-test
24. capillary condensation redistribution test
25. chi-square test
26. closed bottle test
27. cognitive screening test
28. compartment fire test
29. compartment test
30. cone penetration test (CPT)
31. COVID-19 antigen test
32. cutting test
33. cybersecurity test bed
34. DDR4 interconnect test
35. design and test
36. design-for-test
37. deterministic test sequences
38. diagnostic test
39. digital test
40. Digital test and testable design
41. double-pulse test
42. drawing test
43. dry droplet antimicrobial test
44. Embedded figures test
45. embedded test
46. fan pressurisation test
47. final test result prediction
48. four-point bending test
49. FPGA based test
50. FPGA-Assisted Test
51. FPGA-centric test
52. functional self-test
53. functional test generation
54. Granger causality test
55. hardness test
56. Hierarchical Multi-level Test Generation
57. high-level synthesis for test
58. high-level test data generation
59. highlevel test generation
60. high-speed serial link test
61. IEEE 9 bus test system
62. implementation-independent test generation
63. in situ tensile test in SEM
64. industrial field test
65. in-situ tensile test in SEM
66. Johansen cointegration test
67. Kolmogorov-Smirnov test
68. load test
69. logic built-in self-test
70. Luria alternating series test
71. Mann–Kendall test
72. Mann-Kendall trend test
73. memory interconnect test
74. microprocessor test
75. Model test
76. multiplier test
77. offline test generation
78. orthogonal test
79. package test analysis
80. parallel design and test
81. performance test
82. piezocone penetration test (CPTu)
83. Point Load Test index
84. pressurisation test
85. processor-centric board test
86. progressive damage test
87. provably correct test generation
88. pseudo-exhaustive test
89. purity test
90. real-time room temperature test
91. rolling thin film oven test
92. rtioco-based timed test sequences
93. seasonal Mann Kendall test
94. seismic piezocone penetration test
95. self-test
96. self-test architectures
97. sentence writing test
98. serial sevens test
99. ship towing test tank
100. similar material simulation test
101. small-scale fire test
102. small‐scale test
103. software based self-test
104. software-based self-test
105. software-based self-test (SBST)
106. soil phosphorus (P) test
107. standard test method
108. static load test
109. static-dynamic probing test (SDT)
110. stress test
111. system level test
112. teaching design and test of systems
113. tensile test
114. tensile test
115. test
116. test and evaluation platform
117. test automation
118. test bench
119. test coverage
120. test driven development
121. test driven modelling
122. test embankment
123. test equipment
124. test generation
125. test generation and fault diagnosis
126. Test Group Generation for Detecting Multiple Faults
127. test groups
128. test model design
129. test optimization
130. test packets
131. test path synthesis
132. test patterns
133. test point insertion
134. test program generation
135. test reference year
136. test replication
137. test scenario description language
138. test-bed
139. test-chips
140. test-house
141. test-pattern
142. test-suite reduction
143. Three-point bending test
144. unit root test
145. usability platform test
146. 1995 ECC benchmark test

1. International Baltic conference on engineering materials and tribology (24 : 2015 : Tallinn)
2. European Test Symposium (ETS)
3. 16PF (test)
4. Danube Adria Association for Automation and Manufacturing. International conference

match

sort

Otsing
Valikud 0

year of publication

author

TalTech department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digital Collection of TalTech Library Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu