Hierarchical test generation for digital systems based on combining bottom-up and top-down approaches
author
statement of authorship
J. Raik, R. Ubar
source
World Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 1
location of publication
[S.l.]
year of publication
pages
p. 374-381: ill
ISBN
980-07-5078-9
notes
Bibl. 27 ref
language
inglise
subject term
Raik, J., Ubar, R. Hierarchical test generation for digital systems based on combining bottom-up and top-down approaches // World Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 1. [S.l.], 1998. p. 374-381: ill.