RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems
author
statement of authorship
Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendoerfer, Christian Sauer, Anton Klotz, Michael Huebner, Joerg Nolte, Heinrich Theodor Vierhaus, Georgios Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert-Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka
source
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings
location of publication
Danvers
publisher
year of publication
pages
art. 19690741 , 6 p
conference name, date
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE 2020), 9 to 13 March, 2020
conference location
Grenoble, France
ISBN
978-3-9819263-4-7
notes
Bibliogr.: 58 ref
TalTech department
language
inglise
subject term
keyword
Jenihhin, M., Hamdioui, S., Sonza Reorda, M., Raik J. et al. RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems // 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings. Danvers : EDAA, 2020. art. 19690741 , 6 p.