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semiconductor device measurement (keyword)

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book article

FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedancePriidel, Eiko; Pesti, Ksenija; Min, Mart; Ojarand, Jaan; Märtens, Olev2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings2021 / 5 p. : ill https://doi.org/10.1109/I2MTC50364.2021.9460073

book article
Seotud publikatsioonid 1
- Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
2

journal article

Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621

journal article
Seotud publikatsioonid 1
- Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina

Number of records 2, displaying 1 - 2

1. semiconductor device measurement
2. power semiconductor device
3. semiconductor device manufacture
4. semiconductor device modeling
5. semiconductor device reliability
6. device-to-device (D2D)
7. device-to-device (D2D) communication
8. device-to-device communication
9. cardiac device therapy
10. cooling device performance
11. Counter Improvised Explosive Device (C-IED)
12. device
13. device capacity
14. device characterisation
15. Device characterization
16. device modeling
17. Discrete power device
18. energy saving device (ESD)
19. energy storage device
20. implantable medical device
21. Improvised Explosive Device (IED)
22. low-power device
23. massive device connectivity
24. medical device
25. metal semiconductor contacts
26. metal-oxide-semiconductor field-effect transistors (MOSFETs)
27. microfluidic device
28. on-device transfer learning
29. plasma-focus device
30. power semiconductor devices
31. power semiconductor switches
32. projected device density of states (PDDOS)
33. p-type transparent semiconductor
34. Real device
35. robotic device
36. semiconductor
37. semiconductor band bending
38. semiconductor crystals
39. semiconductor devices
40. semiconductor diodes
41. semiconductor doping
42. semiconductor heterojunctions
43. semiconductor technology
44. Semiconductor/electrolyte contact
45. semiconductor-metal transition
46. storage device
47. Superconducting device noise
48. Wearable device
49. wide band gap semiconductor devices
50. advanced measurement infrastructure
51. angle measurement
52. bioimpedance measurement
53. blood sugar measurement
54. business school learning rate measurement instrument
55. characteristics of phasor measurement units
56. concentration measurement
57. Contactless conductivity measurement
58. continuous measurement
59. corrosion measurement
60. current measurement
61. differential measurement
62. distribution-level phasor measurement units (D-PMUs)
63. driving dynamics measurement
64. DTS measurement
65. dynamic measurement feedback
66. effect measurement
67. efficiency measurement
68. electrical resistance measurement
69. electronic measurement
70. employees' performance measurement
71. experimental measurement
72. filter transmission measurement
73. flow measurement
74. force measurement
75. four-electrode impedance measurement
76. frequency measurement
77. harmonic measurement
78. high speed measurement
79. impedance measurement
80. impedance spectrum measurement
81. inertial measurement unit
82. inertial measurement unit (IMU)
83. input/output current measurement
84. light measurement
85. lock-in measurement
86. loss measurement
87. losses measurement
88. magnetic measurement
89. maximum permissible error (deviation) of measurement result
90. measurement
91. measurement accuracy
92. measurement and testing
93. measurement by CCD cameras
94. measurement campaign
95. measurement coil
96. measurement error in household surveys
97. Measurement errors
98. measurement feedback
99. measurement gaps
100. measurement model
101. measurement standards
102. measurement uncertainty
103. measurement units
104. micro characterization and surface roughness measurement
105. mooring measurement
106. network measurement
107. non-contact optical measurement
108. non-invasive measurement
109. optical variables measurement
110. organizational learning measurement instruments
111. organizational learning rate measurement
112. partial discharge measurement
113. passive measurement
114. perfomance measurement
115. performance measurement
116. performance measurement system
117. phasor measurement
118. phasor measurement unit
119. Phasor measurement unit (PMU)
120. phasor measurement units
121. pollution measurement
122. position measurement
123. power measurement
124. power quality measurement
125. power quality measurement equipment
126. quality performance measurement
127. radiated EMI measurement
128. real-time measurement
129. road condition measurement
130. road performance measurement
131. single far-field measurement
132. single measurement
133. single-molecule measurement
134. Spectrophotometric measurement
135. static measurement feedback
136. synchronous measurement
137. temperature measurement
138. testing of phasor measurement units
139. Time measurement
140. torque measurement
141. tracer-gas measurement
142. tyre velocity measurement
143. wave height measurement
144. wave measurement
145. wear measurement
146. vibration measurement
147. voltage measurement

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