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book article

FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedancePriidel, Eiko; Pesti, Ksenija; Min, Mart; Ojarand, Jaan; Märtens, Olev2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings2021 / 5 p. : ill https://doi.org/10.1109/I2MTC50364.2021.9460073

book article
Related publications 1
- Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
2

journal article

Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621

journal article
Related publications 1
- Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina

Number of records 2, displaying 1 - 2

1. semiconductor device measurement
2. power semiconductor device
3. semiconductor device failure
4. semiconductor device manufacture
5. semiconductor device modeling
6. semiconductor device reliability
7. device-to-device (D2D)
8. device-to-device (D2D) communication
9. device-to-device communication
10. cardiac device therapy
11. cooling device performance
12. Counter Improvised Explosive Device (C-IED)
13. device
14. device capacity
15. device characterisation
16. Device characterization
17. device modeling
18. device therapy
19. Discrete power device
20. energy saving device (ESD)
21. energy storage device
22. implantable medical device
23. Improvised Explosive Device (IED)
24. low-power device
25. massive device connectivity
26. medical device
27. metal semiconductor contacts
28. metal-oxide-semiconductor field-effect transistors (MOSFETs)
29. microfluidic device
30. motion-reduction device
31. on-device transfer learning
32. plasma-focus device
33. power semiconductor devices
34. power semiconductor switches
35. projected device density of states (PDDOS)
36. p-type transparent semiconductor
37. Real device
38. robotic device
39. semiconductor
40. semiconductor band bending
41. semiconductor crystals
42. semiconductor devices
43. semiconductor diodes
44. semiconductor doping
45. semiconductor heterojunctions
46. semiconductor technology
47. Semiconductor/electrolyte contact
48. semiconductor-metal transition
49. storage device
50. Superconducting device noise
51. Wearable device
52. wide band gap semiconductor devices
53. advanced measurement infrastructure
54. angle measurement
55. atmospheric measurement uncertainty
56. bioimpedance measurement
57. blood pressure measurement
58. blood sugar measurement
59. business school learning rate measurement instrument
60. characteristics of phasor measurement units
61. concentration measurement
62. Contactless conductivity measurement
63. continuous measurement
64. corrosion measurement
65. current measurement
66. differential measurement
67. distribution-level phasor measurement units (D-PMUs)
68. driving dynamics measurement
69. DTS measurement
70. dynamic measurement feedback
71. effect measurement
72. efficiency measurement
73. electric impedance measurement
74. electrical resistance measurement
75. electron density measurement
76. electronic measurement
77. employees' performance measurement
78. experimental measurement
79. filter transmission measurement
80. flow measurement
81. force measurement
82. four-electrode impedance measurement
83. frequency measurement
84. harmonic measurement
85. high speed measurement
86. hygrothermal measurement and modelling
87. impedance measurement
88. impedance spectrum measurement
89. Inerial Measurement Unit (IMU)
90. inertial measurement unit
91. inertial measurement unit (IMU)
92. input/output current measurement
93. light measurement
94. lock-in measurement
95. loss measurement
96. losses measurement
97. magnetic measurement
98. maximum permissible error (deviation) of measurement result
99. measurement
100. measurement accuracy
101. measurement and testing
102. measurement by CCD cameras
103. measurement campaign
104. measurement coil
105. measurement error in household surveys
106. Measurement errors
107. measurement feedback
108. measurement gaps
109. measurement model
110. measurement standards
111. measurement uncertainty
112. measurement units
113. micro characterization and surface roughness measurement
114. mooring measurement
115. network measurement
116. non-contact optical measurement
117. non-invasive measurement
118. optical variables measurement
119. organizational learning measurement instruments
120. organizational learning rate measurement
121. partial discharge measurement
122. passive measurement
123. perfomance measurement
124. performance measurement
125. performance measurement system
126. phasor measurement
127. phasor measurement unit
128. Phasor measurement unit (PMU)
129. phasor measurement units
130. pollution measurement
131. position measurement
132. power measurement
133. power quality measurement
134. power quality measurement equipment
135. quality performance measurement
136. radiated EMI measurement
137. real-time measurement
138. road condition measurement
139. road performance measurement
140. single far-field measurement
141. single measurement
142. single-molecule measurement
143. Spectrophotometric measurement
144. static measurement feedback
145. synchronous measurement
146. temperature measurement
147. testing of phasor measurement units
148. Time measurement
149. torque measurement
150. tracer-gas measurement
151. tyre velocity measurement
152. wave height measurement
153. wave measurement
154. wear measurement
155. vibration measurement
156. voltage measurement

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