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book article

FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedancePriidel, Eiko; Pesti, Ksenija; Min, Mart; Ojarand, Jaan; Märtens, Olev2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings2021 / 5 p. : ill https://doi.org/10.1109/I2MTC50364.2021.9460073

book article
Seotud publikatsioonid 1
- Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
2

journal article

Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621

journal article
Seotud publikatsioonid 1
- Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina

Number of records 2, displaying 1 - 2

1. semiconductor device measurement
2. power semiconductor device
3. semiconductor device manufacture
4. semiconductor device modeling
5. semiconductor device reliability
6. device-to-device (D2D)
7. device-to-device (D2D) communication
8. device-to-device communication
9. cardiac device therapy
10. cooling device performance
11. Counter Improvised Explosive Device (C-IED)
12. device
13. device capacity
14. device characterisation
15. Device characterization
16. device modeling
17. device therapy
18. Discrete power device
19. energy saving device (ESD)
20. energy storage device
21. implantable medical device
22. Improvised Explosive Device (IED)
23. low-power device
24. massive device connectivity
25. medical device
26. metal semiconductor contacts
27. metal-oxide-semiconductor field-effect transistors (MOSFETs)
28. microfluidic device
29. motion-reduction device
30. on-device transfer learning
31. plasma-focus device
32. power semiconductor devices
33. power semiconductor switches
34. projected device density of states (PDDOS)
35. p-type transparent semiconductor
36. Real device
37. robotic device
38. semiconductor
39. semiconductor band bending
40. semiconductor crystals
41. semiconductor devices
42. semiconductor diodes
43. semiconductor doping
44. semiconductor heterojunctions
45. semiconductor technology
46. Semiconductor/electrolyte contact
47. semiconductor-metal transition
48. storage device
49. Superconducting device noise
50. Wearable device
51. wide band gap semiconductor devices
52. advanced measurement infrastructure
53. angle measurement
54. bioimpedance measurement
55. blood pressure measurement
56. blood sugar measurement
57. business school learning rate measurement instrument
58. characteristics of phasor measurement units
59. concentration measurement
60. Contactless conductivity measurement
61. continuous measurement
62. corrosion measurement
63. current measurement
64. differential measurement
65. distribution-level phasor measurement units (D-PMUs)
66. driving dynamics measurement
67. DTS measurement
68. dynamic measurement feedback
69. effect measurement
70. efficiency measurement
71. electrical resistance measurement
72. electron density measurement
73. electronic measurement
74. employees' performance measurement
75. experimental measurement
76. filter transmission measurement
77. flow measurement
78. force measurement
79. four-electrode impedance measurement
80. frequency measurement
81. harmonic measurement
82. high speed measurement
83. hygrothermal measurement and modelling
84. impedance measurement
85. impedance spectrum measurement
86. Inerial Measurement Unit (IMU)
87. inertial measurement unit
88. inertial measurement unit (IMU)
89. input/output current measurement
90. light measurement
91. lock-in measurement
92. loss measurement
93. losses measurement
94. magnetic measurement
95. maximum permissible error (deviation) of measurement result
96. measurement
97. measurement accuracy
98. measurement and testing
99. measurement by CCD cameras
100. measurement campaign
101. measurement coil
102. measurement error in household surveys
103. Measurement errors
104. measurement feedback
105. measurement gaps
106. measurement model
107. measurement standards
108. measurement uncertainty
109. measurement units
110. micro characterization and surface roughness measurement
111. mooring measurement
112. network measurement
113. non-contact optical measurement
114. non-invasive measurement
115. optical variables measurement
116. organizational learning measurement instruments
117. organizational learning rate measurement
118. partial discharge measurement
119. passive measurement
120. perfomance measurement
121. performance measurement
122. performance measurement system
123. phasor measurement
124. phasor measurement unit
125. Phasor measurement unit (PMU)
126. phasor measurement units
127. pollution measurement
128. position measurement
129. power measurement
130. power quality measurement
131. power quality measurement equipment
132. quality performance measurement
133. radiated EMI measurement
134. real-time measurement
135. road condition measurement
136. road performance measurement
137. single far-field measurement
138. single measurement
139. single-molecule measurement
140. Spectrophotometric measurement
141. static measurement feedback
142. synchronous measurement
143. temperature measurement
144. testing of phasor measurement units
145. Time measurement
146. torque measurement
147. tracer-gas measurement
148. tyre velocity measurement
149. wave height measurement
150. wave measurement
151. wear measurement
152. vibration measurement
153. voltage measurement

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