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A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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A synthesis-agnostic behavioral fault model for high gate-level fault coverageKarputkin, Anton; Raik, JaanProceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-18 March 2016, ICC, Dresden, Germany2016 / p. 1124-1127 : ill https://ieeexplore.ieee.org/document/7459477/figures#figures

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Accelerating transient fault injection campaigns by using Dynamic HDL SlicingBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2019.8906932

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Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

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Active power losses in Estonian power transmission networkAinsaar, Karin Maria; Ülavere, Eero; Tammoja, Heiki; Valtin, Juhan14th International Symposium "Topical problems in the field of electrical and power engineering. Doctoral school of energy and geotechnology. II" : Pärnu, Estonia, January 13-18, 20142014 / p. 112-117 : ill

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Adaptive Kalman filter based data aggregation in fault-resilient Underwater Sensor NetworksVihman, Lauri; Raik, Jaan2023 24th International Conference on Digital Signal Processing (DSP)2023 / p. 1-5 https://doi.org/10.1109/DSP58604.2023.10167982

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Seotud publikatsioonid 1

Data-driven fault-resilient cross-layer sensor network architecture = Andmepõhine tõrkekindel kihtideülene sensorvõrgu arhitektuur

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Adjusted electrical equivalent circuit model of induction motor with broken rotor barsRassõlkin, Anton; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants; Petrov, Aleksei; Plokhov, Igor; Kotelnikov, AleksandrPQ2016 : the 10th International Conference 2016 Electric Power Quality and Supply Reliability Conference (PQ) : August 29-31, 2016, Tallinn, Estonia : proceedings2016 / p. 213-218 : ill https://doi.org/10.1109/PQ.2016.7724115

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Adjusted electrical equivalent circuit model of induction motor with broken rotor bars and eccentricity faultsPetrov, Aleksei; Plokhov, Igor; Rassõlkin, Anton; Vaimann, Toomas; Kallaste, Ants; Belahcen, AnouarProceeding of the 2017 IEEE 11th International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED) : [Tinos (Greece), August 29 - September 01, 2017]2017 / p. 58-64 : ill https://doi.org/10.1109/DEMPED.2017.8062334

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An advanced diagnostic approach for broken rotor bar detection and classification in DTC controlled induction motors by leveraging dynamic SHAP interaction feature selection (DSHAP-IFS) GBDT methodologyKhan, Muhammad Amir; Asad, Bilal; Vaimann, Toomas; Kallaste, AntsMachines2024 / art. 495 https://doi.org/10.3390/machines12070495

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Advances in machine fault diagnosis2022 https://doi.org/10.3390/books978-3-0365-5110-4

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Advances in machine fault diagnosisVaimann, ToomasAdvances in machine fault diagnosis2022 / p. 1-5 https://doi.org/10.3390/app11167348

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Advances in machine fault diagnosisVaimann, ToomasApplied sciences2021 / art. 7348, 5 p https://doi.org/10.3390/app11167348 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Air-core sensors operation modes for partial discharge detection and on-line diagnostics in medium voltage networksKütt, Lauri; Shafiq, Muhammad; Mõlder, Heigo; Järvik, Jaan; Lehtonen, MattiScientific Journal of Riga Technical University. Electrical, control and communication engineering2013 / p. 5-12 : ill

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Algorithms for hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Klüver, B.Proceedings of the 10th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2003 : Lodz, Poland, 26-28 June 20032003 / p. 530-535 : ill

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Analysis and improvement of resilience for long short-term memory neural networksAhmadilivani, Mohammad Hasan; Raik, Jaan; Daneshtalab, Masoud; Kuusik, Alar2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 https://doi.org/10.1109/DFT59622.2023.10313559

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Analysis of common mode and rapidly varying voltage profile on stator current harmonics of an inverter-fed induction motorSardar, Muhammad Usman; Vaimann, Toomas; Kütt, Lauri; Kallaste, Ants; Asad, Bilal; Kudelina, Karolina; Akbar, Siddique2023 IEEE 64th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, October 9-10, 2023 : conference proceedings2023 / 6 p https://doi.org/10.1109/RTUCON60080.2023.10413067

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Analysis of grain orientation and defects in Sb2Se3 solar cells fabricated by close-spaced sublimationKrautmann, Robert; Spalatu, Nicolae; Gunder, Rene; Abou-Ras, Daniel; Unold, Thomas; Schorr, Susan; Oja Acik, Ilona; Krunks, MalleGSFMT Scientific Conference 2021 : Tartu, June 14-15, 2021 : abstracts2021 / P 17 https://fmtdk.ut.ee/wp-content/uploads/2021/06/GSFMT_abstractbook_2021.pdf

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journal article EST / journal article ENG

Analysis of grain orientation and defects in Sb2Se3 solar cells fabricated by close-spaced sublimation : [journal article]Krautmann, Robert; Spalatu, Nicolae; Gunder, Rene; Abou-Ras, Daniel; Unold, Thomas; Schorr, Susan; Krunks, Malle; Oja Acik, IlonaSolar energy2021 / p. 494-500 https://doi.org/10.1016/j.solener.2021.07.022 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Seotud publikatsioonid 1

Development of Sb2Se3 and Sb2S3 thin film solar cells by close-spaced sublimation = Sb2Se3 ja Sb2S3 õhukesekileliste päikesepatareide arendamine lähidistants-sublimatsiooni meetodil

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Analysis of the vibration magnitude of an induction motor with different numbers of broken barsMartinez, Javier; Belahcen, Anouar; Muetze, AnnetteIEEE transactions on industry applications2017 / p. 2711-2720 : ill https://doi.org/10.1109/TIA.2017.2657478 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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An analytic model for fault diagnosis in power distribution systems considering unreliable alarmsWang, Chongyu; Pang, Kaiyuan; Zhang, Yong; Wen, Fushuan; Palu, Ivo; Xiong, Wen; Chen, Minghui; Shang, Huiyu2020 IEEE Power & Energy Society General Meeting (GM 2020)2020 / 5 l https://doi.org/10.1109/PESGM41954.2020.9281468

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Anomaly detection and classification in power system state estimation: Combining model-based and data-driven methodsAsefi, Sajjad; Mitrovic, Mile; Cetenovic, Dragan; Levi, Victor; Gryazina, Elena; Terzija, VladimirSustainable energy, grids and networks2023 / art. 101116 https://doi.org/10.1016/j.segan.2023.101116 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Assessment of diagnostic test for automated bug localizationTihhomirov, Valentin; Tšepurov, Anton; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [6] p. : ill

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Assessment of electricity supply interruption costs under restricted time and information resourcesRaesaar, Peeter; Tiigimägi, Eeli; Valtin, JuhanProceedings of the 2006 IASME/WSEAS International Conference on Energy & Environmental Systems : Chalkida, Greece, May 8-10, 20062006 / p. 409-415 : ill

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Asynchronous fault detection in IEEE P1687 instrument networkShibin, Konstantin; Devadze, Sergei; Jutman, ArturIEEE 23rd North Atlantic Test Workshop : 14-16 May 2014, Binghampton, New York : proceedings2014 / p. 73-78 : ill

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At-speed on-chip diagnosis of board-level interconnect faultsJutman, ArturNinth IEEE European Test Symposium : ETS 2004 : 23-26 May 2004, Corsica, France : proceedings2004 / p. 2-7 : ill https://www.researchgate.net/publication/4098807_At-speed_on-chip_diagnosis_of_board-level_interconnect_faults

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Automated area and coverage optimization of minimal latency checkersAzad, Siavoosh Payandeh; Niazmand, Behrad; Apneet Kaur; Raik, Jaan; Jervan, Gert; Hollstein, Thomas2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings2017 / p. 7-8 : ill https://doi.org/10.1109/ETS.2017.7968211

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