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151

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Experimental performance validation of Z-source DC circuit breaker for high impedance faultsPogulaguntla, Aditya; Naik Banavath, Satish; Chub, Andrii; Vinnikov, Dmitri; Singh, Rajendra2024 IEEE Sixth International Conference on DC Microgrids (ICDCM)2024 / 5 p https://doi.org/10.1109/ICDCM60322.2024.10664702 Article at Scopus Article at WOS

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152

newspaper article

Experts: No need to worry about the impact of solar storms todayPiir, Raitnews.err.ee2024 Experts: No need to worry about the impact of solar storms today

newspaper article

153

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Explainability and transparency of classifiers for air-handling unit faults using explainable artificial intelligence (XAI)Meas, Molika; Machlev, Ram; Köse, Ahmet; Tepljakov, Aleksei; Loo, Lauri; Levron, Yoash; Petlenkov, Eduard; Belikov, JuriSensors2022 / art. 6338 : ill https://doi.org/10.3390/s22176338 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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154

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Exploiting high-level descriptions for circuits fault tolerance assessmentsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza Reorda, Matteo; Raik, Jaan; Ubar, Raimund-Johannes1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, October 20-22, 19971997 / p. 212-216 https://ieeexplore.ieee.org/document/628327

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155

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Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN AcceleratorsTaheri, Mahdi; Cherezova, Natalia; Ansari, Mohammad Saeed; Jenihhin, Maksim; Mahani, Ali; Daneshtalab, Masoud; Raik, JaanProceedings of the Twenty Fifth International Symposium on Quality ElectronicDesign : ISQED 20242024 / 8 p. : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372 https://doi.org/10.1109/ISQED60706.2024.10528372 Conference proceedings at Scopus Article at Scopus Article at WOS

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Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

156

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Exploring the limits of early predictive maintenance in wind turbines applying an anomaly detection techniqueJankauskas, Mindaugas; Serackis, Artūras; Šapurov, Martynas; Pomarnacki, Raimondas; Baskys, Algirdas; Hyunh, Van Khang; Vaimann, Toomas; Zakis, JanisSensors2023 / art. 5695 https://doi.org/10.3390/s23125695 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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157

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Extended checkers for control part of routers in network-on-chipsHariharan, Ranganathan; Niazmand, Behrad; Hollstein, Thomas; Raik, Jaan; Jervan, GertMEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France2015 / p. 36-39 : ill

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158

newspaper article

Facebooki katkestus mõjutas nii ettevõtete kui ka riikide toimepidevust [Võrguväljaanne]Pärli, Merilinerr.ee2021 "Facebooki katkestus mõjutas nii ettevõtete kui ka riikide toimepidevust"

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159

newspaper article

Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike [Võrguväljaanne]ohtuleht.ee2021 "Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike"

newspaper article

160

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Failure consequence evaluation of uncontrollable district heating networkMao, Ding; Wang, Peng; Ju, Yuchen; Ni, LongSustainable cities and society2022 / art. 103593, 16 p. : ill https://doi.org/10.1016/j.scs.2021.103593 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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161

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Failure mechanisms in oil-shale pillarsPastarus, Jüri-RivaldoOil shale1994 / 3, p. 251-257: ill https://kirj.ee/wp-content/plugins/kirj/pub/OS-3-1994-251-257_20230316182205.pdf

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162

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Failure modes across the life cycle of nature-based stormwater solutions : a systematic review of planning, design, and maintenance challengesKaur, Katrin; Annus, Ivar; Caradot, Nicolas; Schütz, Paul; Tarigan, Ari K. M.; Tosa, Cristian; Truu, MurelBlue-Green Systems2025 / p. 444-467 https://doi.org/10.2166/bgs.2025.122 https://iwaponline.com/bgs/article/7/2/444/109911/Failure-modes-across-the-life-cycle-of-nature

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163

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Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

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164

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Fast fault simulation for extended class of faults in scan-path circuitsUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturProceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam2010 / p. 14-19 https://ieeexplore.ieee.org/document/5438717

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165

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Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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166

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Fast RTL fault simulation using decision diagrams and bitwise set operationsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-Johannes; Ellervee, Peeter2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada2011 / p. 164-170 https://ieeexplore.ieee.org/document/6104440

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167

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Fault aliasing of signature analyzersKemnitz, Günter; Kärger, ReinhardBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 339-346: ill

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168

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Fault analysis of manufacturing systems as additional constraint by simulationKaraulova, Tatjana; Papstel, JüriInternational journal of simulation modelling2003 / 1/2, p. 5-13 : ill

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169

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Fault analysis of manufacturing systems as additional constraint by simulationKaraulova, Tatjana; Papstel, JüriDAAAM international scientific book 20032003 / p. 295-304 : ill

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170

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Fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France2010 / p. 653-656 : ill https://ieeexplore.ieee.org/document/5537504

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171

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Fault detecting accuracy of mechanical damages in rolling bearingsKudelina, Karolina; Baraškova, Tatjana; Shirokova, Veroonika; Vaimann, Toomas; Rassõlkin, AntonMachines2022 / art. 86 https://doi.org/10.3390/machines10020086 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil

172

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Fault detection and diagnostics for HVAC systems using heat meter data, statistical features, and data miningVasman, Sofia; Sukhanov, Ivan; Thalfeldt, Martin; Petlenkov, EduardEnergy and buildings2026 / art. 117343 https://doi.org/10.1016/j.enbuild.2026.117343

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173

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Fault detection and predictive maintenance of electrical machines : perspective chapterRaja, Hadi Ashraf; Kudelina, Karolina; Asad, Bilal; Vaimann, ToomasNew Trends in Electric Machines - Technology and Applications2022 https://doi.org/10.5772/intechopen.107167

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IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaks

174

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Fault detection and protection strategy for multi-terminal HVDC grids using wavelet analysisKaur, Jashandeep; Jayasooriya, Manilka; Iqbal, Muhammad Naveed; Daniel, Kamran; Shabbir, Noman; Peterson, KristjanEnergies2025 / art. 1147 https://doi.org/10.3390/en18051147

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175

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Fault detection and protection system for the power converters with high-voltage IGBTs [Electronic resource]Vinnikov, Dmitri; Roasto, Indrek; Lehtla, TõnuICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : August 31 - September 3, 2008, Malta2008 / p. 922-925 : ill. [CD-ROM] https://ieeexplore.ieee.org/document/4675005

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