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151

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Exploiting high-level descriptions for circuits fault tolerance assessmentsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza Reorda, Matteo; Raik, Jaan; Ubar, Raimund-Johannes1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, October 20-22, 19971997 / p. 212-216 https://ieeexplore.ieee.org/document/628327

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152

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Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN AcceleratorsTaheri, Mahdi; Cherezova, Natalia; Ansari, Mohammad Saeed; Jenihhin, Maksim; Mahani, Ali; Daneshtalab, Masoud; Raik, Jaan25th International Symposium on Quality Electronic Design (ISQED)2025 / 8 p. : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372

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Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

153

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Exploring the limits of early predictive maintenance in wind turbines applying an anomaly detection techniqueJankauskas, Mindaugas; Serackis, Artūras; Šapurov, Martynas; Pomarnacki, Raimondas; Baskys, Algirdas; Hyunh, Van Khang; Vaimann, Toomas; Zakis, JanisSensors2023 / art. 5695 https://doi.org/10.3390/s23125695 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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154

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Extended checkers for control part of routers in network-on-chipsHariharan, Ranganathan; Niazmand, Behrad; Hollstein, Thomas; Raik, Jaan; Jervan, GertMEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France2015 / p. 36-39 : ill

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155

newspaper article

Facebooki katkestus mõjutas nii ettevõtete kui ka riikide toimepidevust [Võrguväljaanne]Pärli, Merilinerr.ee2021 "Facebooki katkestus mõjutas nii ettevõtete kui ka riikide toimepidevust"

newspaper article

156

newspaper article

Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike [Võrguväljaanne]ohtuleht.ee2021 "Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike"

newspaper article

157

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Failure consequence evaluation of uncontrollable district heating networkMao, Ding; Wang, Peng; Ju, Yuchen; Ni, LongSustainable cities and society2022 / art. 103593, 16 p. : ill https://doi.org/10.1016/j.scs.2021.103593 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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158

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Failure mechanisms in oil-shale pillarsPastarus, Jüri-RivaldoOil shale1994 / 3, p. 251-257: ill https://kirj.ee/wp-content/plugins/kirj/pub/OS-3-1994-251-257_20230316182205.pdf

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159

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Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

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160

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Fast fault simulation for extended class of faults in scan-path circuitsUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturProceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam2010 / p. 14-19 https://ieeexplore.ieee.org/document/5438717

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161

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Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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162

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Fast RTL fault simulation using decision diagrams and bitwise set operationsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-Johannes; Ellervee, Peeter2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada2011 / p. 164-170 https://ieeexplore.ieee.org/document/6104440

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163

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Fault aliasing of signature analyzersKemnitz, Günter; Kärger, ReinhardBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 339-346: ill

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164

journal article

Fault analysis of manufacturing systems as additional constraint by simulationKaraulova, Tatjana; Papstel, JüriInternational journal of simulation modelling2003 / 1/2, p. 5-13 : ill

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165

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Fault analysis of manufacturing systems as additional constraint by simulationKaraulova, Tatjana; Papstel, JüriDAAAM international scientific book 20032003 / p. 295-304 : ill

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166

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Fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France2010 / p. 653-656 : ill https://ieeexplore.ieee.org/document/5537504

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167

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Fault detecting accuracy of mechanical damages in rolling bearingsKudelina, Karolina; Baraškova, Tatjana; Shirokova, Veroonika; Vaimann, Toomas; Rassõlkin, AntonMachines2022 / art. 86 https://doi.org/10.3390/machines10020086 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil

168

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Fault detection and predictive maintenance of electrical machines : perspective chapterRaja, Hadi Ashraf; Kudelina, Karolina; Asad, Bilal; Vaimann, ToomasNew Trends in Electric Machines - Technology and Applications2022 https://doi.org/10.5772/intechopen.107167

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IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaks

169

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Fault detection and protection strategy for multi-terminal HVDC grids using wavelet analysisKaur, Jashandeep; Jayasooriya, Manilka; Iqbal, Muhammad Naveed; Daniel, Kamran; Shabbir, Noman; Peterson, KristjanEnergies2025 / art. 1147 https://doi.org/10.3390/en18051147

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170

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Fault detection and protection system for the power converters with high-voltage IGBTs [Electronic resource]Vinnikov, Dmitri; Roasto, Indrek; Lehtla, TõnuICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : August 31 - September 3, 2008, Malta2008 / p. 922-925 : ill. [CD-ROM] https://ieeexplore.ieee.org/document/4675005

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171

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Fault diagnosis in integrated circuits with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Evartson, Teet; Lensen, Harri10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 604-610 : ill http://dx.doi.org/10.1109/DSD.2007.4341530

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172

journal article

Fault diagnosis in VLSI devicesUbar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering1995 / 1, p. 51-67

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173

book article

Fault diagnosis of additional vibration in Cartesian robotAutsou, Siarhei21st International Symposium "Topical problems in the field of electrical and power engineering. Doctoral school of energy and geotechnology. III" : Pärnu, Estonia, June 15-18, 20222022 / p. 21-22 : ill https://www.ester.ee/record=b5504019*est

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174

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Fault diagnosis system of Cartesian robot for various belt tensionAutsou, Siarhei; Vaimann, Toomas; Rassõlkin, Anton; Kudelina, Karolina2022 International Conference on Diagnostics in Electrical Engineering (Diagnostika)2022 / 4 l https://doi.org/10.1109/Diagnostika55131.2022.9905111

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Related publications 1

Fault tolerant control and diagnosis strategies for cartesian industrial robot motion control planning system = Tõrketaluvusega juhtimis- ja diagnostikastrateegiad tööstusliku karteesianroboti liikumise planeerimise juhtimissüsteemi jaoks

175

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Fault emulation on FPGA : a feasibility studyEllervee, Peeter; Raik, Jaan; Tihhomirov, ValentinIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 92-95 : ill https://www.researchgate.net/publication/246171898_Fault_Emulation_on_FPGA_A_Feasibility_Study

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