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376

book article

An improved estimation methodology for hybrid BIST cost calculationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 297-300 : ill https://ieeexplore.ieee.org/document/1423882

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377

book article

An improved estimation technique for hybrid BIST test set generationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaDDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings2005 / p. 182-185 : ill

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378

book article

Improved fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 72-78 : ill

book article

379

book article

Improved testability calculation for digital circuitsUbar, Raimund-Johannes; Heinlaid, J.; Raun, L.19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings2001 / p. 264-270 : ill

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380

book article

Improving the efficiency of timing simulation in digital circuits by using structurally synthesized BDDsUbar, Raimund-Johannes; Jutman, Artur; Peng, Z.IEEE Norchip Conference2000 / p. 254-261

book article

381

book article

Increasing the speed of delay simulation in digital circuitsUbar, Raimund-Johannes; Jutman, ArturThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 31-34 : ill

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382

book article

Infotehnoloogia teaduskondGordon, Boris; Velmre, Enn; Einer, Lauri; Tamm, Uljas; Meister, Ants; Korsen, Viljo; Märtens, Olev; Parve, Toomas; Ubar, Raimund-Johannes; Min, MartLeiutajaid ja leiutisi Tallinna Tehnikaülikoolis 1922-20072008 / lk. 34-47 : ill https://www.ester.ee/record=b2412718*est

book article

383

newspaper article

Innovatsiooni võimalikkusest EestisUbar, Raimund-JohannesPostimees1998 / 9. apr., lk. 9

newspaper article

384

journal article

Insener projekteerib usaldust : [ka TTÜ arvutitehnika instituudi töödest]Ubar, Raimund-JohannesArvutimaailm2011 / 7/8, lk. 8-9 : ill https://artiklid.elnet.ee/record=b2423013*est

journal article

385

book article

Inseneri ja tehnoloogia võidujooksust nanomeeterdistantsil, ehk, Tehnoloogia valitsemisest ja usaldamisest : akadeemiline ettekanne 10. novembril 2010 Eesti Teaduste AkadeemiasUbar, Raimund-JohannesTallinna Tehnikaülikooli aastaraamat 20102011 / lk. 249-260

book article

386

newspaper article

Inseneride ärkamisaegUbar, Raimund-JohannesPostimees2011 / lk. 10

newspaper article

387

newspaper article

Inseneriharidus mikroelektroonika ajastulUbar, Raimund-JohannesTehnikaülikool1998 / 16. nov., lk. 6

newspaper article

388

book article

Integrated design and test generation under Internet based environment MOSCITOSchneider, Andre; Ivask, Eero; Ubar, Raimund-JohannesEuromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings2002 / p. 187-194 : ill http://dx.doi.org/10.1109/DSD.2002.1115368

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389

book article

Integration of digital test tools to the internet-based environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, Günter; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesSCI 2003 : the 7th World Multiconference on Systemics, Cybernetics and Informatics : July 27-30, 2003, Orlando, Florida, USA : proceedings. Volume VIII, Applications of Informatics and Cybernetics in Science and Engineering2003 / p. 136-141 : ill

book article

390

newspaper article

Integreeritud elektroonikasüsteemide ja biomeditsiinitehnika tippkeskusUbar, Raimund-JohannesEesti Päevaleht2012 / Eesti teaduse tippkeskused, lk. 3

newspaper article

391

book article

Integreeritud elektroonikasüsteemide ja biomeditsiinitehnika tippkeskus CEBEUbar, Raimund-JohannesTallinna Tehnikaülikooli aastaraamat 20102011 / lk. 29-40

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392

book article

Interactive presentation abstract : automated correction of design errors by edge redirection on high-level decision diagrams [Electronic resource]Karputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, JaanIEEE International High Level Design Validation and Test Workshop (HLDVT'11), November 9-11, 2011, Napa Valley, CA2011 / p. 83 : ill. [CD-ROM] http://doi.ieeecomputersociety.org/10.1109/HLDVT.2011.6113980

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393

book article

Interactive teaching software "Introduction to digital test"Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich; Orasson, Elmet45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband2000 / S. 949-954

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394

book article

Internet based test generation and fault simulationIvask, Eero; Ubar, Raimund-Johannes; Raik, Jaan; Schneider, AndreIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 57-60 : ill

book article

395

book article

Internet-based collaborative test generation with MOSCITO [Electronic resource]Schneider, Andre; Ivask, Eero; Miklos, P.; Raik, Jaan; Diener, Karl-Heinz; Ubar, Raimund-Johannes; Cibakova, Tatiana; Gramatova, ElenaSIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 20022002 / [6] p. [CD-ROM] https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF

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396

book article

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Orasson, Elmet; Wuttke, Heinz-Dietrich23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 659-662 : ill https://ieeexplore.ieee.org/document/1003344

book article

397

book article

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Evartson, Teet; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 20022002 / p. 317-320 : ill https://ieeexplore.ieee.org/document/1003344

book article

398

book article

Internet-based testability-driven test generation in the virtual environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, G.; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesInternational Federation for Information Processing IFIP : International Workshop on IP-Based SoC Design 2002 : proceedings : Grenoble, October 30-31, 20022002 / p. 357-362 : ill http://publica.fraunhofer.de/dokumente/N-287433.html

book article

399

book article

Investigating defects in digital circuits by Boolean differential equationsKruus, Helena; Orasson, Elmet; Robal, Tarmo; Ubar, Raimund-JohannesThe 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)2004 / p. 432-435

book article

400

dissertation

Investigation and development of test generation methods for control part of digital systemsBrik, Marina2002 http://www.ester.ee/record=b1688656*est

dissertation

Ubar, Raimund-Johannes (author)

types of item

CV 63

author 57

name of the person 28

subject term 1