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5326
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings
2000
/
p. 69-74 : ill
https://ieeexplore.ieee.org/document/873781
book article
5327
book article
Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patterns
Ubar, Raimund-Johannes
;
Jutman, Artur
Proceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 1999
1999
/
p. 437-442 : ill
https://www.sciencedirect.com/science/article/pii/S0026271499002036
book article
5328
book article
A hierarchical Dirichlet process model for joint part-of-speech and morphology induction
Sirts, Kairit
;
Alumäe, Tanel
NAACL HLT 2012 : the 2012 Conference of the North American Chapter of the Association for Computational Linguistics : Human Language Technologies : proceedings of the conference : June 3-8, 2012, Montreal, Canada
2012
/
p. 407-416 : ill
https://www.researchgate.net/publication/262277910_A_hierarchical_Dirichlet_process_model_for_joint_part-of-speech_and_morphology_induction
book article
5329
book article
Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Evartson, Teet
;
Lensen, Harri
;
Aarna, Margit
5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada
2007
/
[6] p. [CD-ROM]
book article
5330
book article
Hierarchical fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
International Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings
2001
/
p. 181-184 : ill
book article
5331
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
5332
book article
Hierarchical identification of untestable faults in sequential circuits
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
;
Kruus, Margus
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 668-671 : ill
http://dx.doi.org/10.1109/DSD.2007.4341539
book article
5333
book article
Hierarchical language for development of distributed algorithms
Kaldma, Tarmo
Proceedings of the Fourth Symposium on Programming Languages and Software Tools, Visegrad, Hungary, June 9-10, 1995
1995
/
p. 195-208
book article
5334
book article
Hierarchical test generation based on alternative graph model
Ubar, Raimund-Johannes
Proceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 1995
1995
/
p. 18
book article
5335
journal article
Hierarchical test generation for combinational circuits with real defects coverage
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2002
/
p. 1141-1149 : ill
https://www.sciencedirect.com/science/article/pii/S002627140200080X
journal article
5336
book article
Hierarchical test generation for complex digital systems with control and data processing parts
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 43-52
book article
5337
book article
Hierarchical test generation for digital systems
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Mixed design of integrated circuits and systems
1998
/
p. 131-136: ill
https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_20
book article
5338
book article
Hierarchical test generation for digital systems based on combining bottom-up and top-down approaches
Raik, Jaan
;
Ubar, Raimund-Johannes
World Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 1
1998
/
p. 374-381: ill
book article
5339
book article
Hierarchical test generation with multi-level decision diagram models
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998
1998
/
p. 26-33
https://www.academia.edu/67811738/Hierarchical_Test_Generation_with_Multi_Level_Decision_Diagram_Models?hb-g-sw=7883185
book article
5340
book article
Hierarchical test generation. SEMI show slides
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 53-64
book article
5341
book article
Hierarchical test synthesis for digital systems using alternative graph model
Ubar, Raimund-Johannes
Quantitative aspects of designing and validating dependable computing systems
1995
book article
5342
book article
High definition gelling agent from the local seaweed
Friedenthal, Margus
;
Sirendi, Meelis
;
Vokk, Raivo
;
Köster, M.
Jordbruk og samfunn : kongresrapport : NJF XXI kongress, As, 28. juni - 1. juli, 1999
1999
/
p. 180
book article
5343
book article
High efficient photovoltaics in Estonia
Altosaar, Mare
;
Bereznev, Sergei
;
Kauk, Marit
;
Krunks, Malle
;
Krustok, Jüri
;
Mellikov, Enn
;
Raudoja, Jaan
;
Varema, Tiit
Proc. 3rd Workshop held at JRC Ispra, 2-3 Oct. 2003
2004
/
p. 179-190
book article
5344
book article
High frequency intrinsic localized modes in solids: an example of metallic Ni
Hižnjakov, Vladimir
;
Haas, Mati
;
Klopov, Mihhail
;
Šelkan, Aleksander
Book of abstracts. Programme : 3rd Bilateral Estonian-German Workshop “Strong Nonlinear Vibronic and Electronic Interactions in Solids” : Cottbus, Germany, June 13-15, 2011
2011
/
p. 39
book article
5345
book article
High level fault modeling in digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Brik, Marina
;
Raik, Jaan
Synergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 2
2004
/
p. 486-491
book article
5346
journal article
High order iterative methods for decomposition-coordination problems
Vaarmann, Otu
Technological and economic development of economy
2005
/
4, p. 6
https://www.tandfonline.com/doi/abs/10.1080/13928619.2006.9637723
journal article
5347
journal article
High order iterative methods for decomposition-coordination problems
Vaarmann, Otu
Technological and economic development of economy
2006
/
1, p. 56-61
journal article
5348
book article
High order iterative methods for decomposition-coordination problems
Vaarmann, Otu
Workshop of the European Working Group on Metaheuristics "Metaheuristics and Large Scale Optimization"
2005
/
p. 15
https://www.tandfonline.com/doi/abs/10.1080/13928619.2006.9637723
book article
5349
book article
High order iterative methods for problems in mathematical modelling
Vaarmann, Otu
The Third International Conference : Tools for Mathematical Modelling : June 18-23, Saint-Petersburg : book of abstracts
2001
/
p. 58
book article
5350
book article
High order iterative methods for problems in mathematical modelling
Vaarmann, Otu
Tools for mathematical modelling
2001
/
p. 161-168
book article
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5326 - 5350
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