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51
book article
Automated test pattern generator with constraint solver
Viilukas, Taavi
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
lk. 33-36
book article
52
book article
Automated test program synthesis for digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
Proc. of 7th International Conference
2005
/
p. 171-180
book article
53
book article
Automated XML-based test modelling for mixed-signal circuits
Mellik, Andres
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 203-204 : ill
book article
54
book article EST
/
book article ENG
Automatic distribution of local testers for testing distributed systems
Vain, Jüri
;
Halling, Evelin
;
Kanter, Gert
;
Anier, Aivo
;
Pal, Deepak
Databases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 2016
2016
/
p. 297-310 : ill
https://doi.org/10.3233/978-1-61499-714-6-297
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
55
book article
Automatic GUI model generation : state of the art
Kull, Andres
ISSREW 2012 : 23rd IEEE International Symposium on Software Reliability Engineering Supplemental Proceedings : 27-30 November 2012, Dallas, Texas, USA
2012
/
p. 207-212
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6405443
book article
56
book article
Automatic SoC level test path synthesis based on partial functional models
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
2011 Asian Test Symposium (ATS) : New Delhi, India
2011
/
p. 532-538
https://ieeexplore.ieee.org/document/6114730
book article
57
book article
Automatic synthesis of asynchronous circuits from synchronous RTL descriptions
Öberg, Johnny
;
Plosila, Juha
;
Ellervee, Peeter
Proceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 2005
2005
/
p. 200-205 : ill
https://ieeexplore.ieee.org/document/1597024/keywords#keywords
book article
58
book article
Automatic system for testing of dynamic quality of PC plug-in A/D boards
Pokorny, Martin
;
Roztocil, Jaroslav
;
Haasz, Vladimir
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 61-62: ill
book article
59
book article
Automatic test generation system for VLSI
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997
1997
/
p. 255-258
book article
60
book article
Automation of testing beyond the SoCs
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
lk. 29-32 : ill
book article
61
journal article
Automation of the 3-phase induction motor type test place for industrial use
Kuusk, Leho
;
Laugis, Juhan
Baltic electrical engineering review
1998
/
1, p. 10-12
journal article
62
book article EST
/
book article ENG
Bbuzz : a Bit-aware fuzzing framework for network protocol systematic reverse engineering and analysis
Blumbergs, Bernhards
;
Vaarandi, Risto
MILCOM 2017 - 2017 IEEE Military Communications Conference : Baltimore, Maryland, USA, 23-25 October 2017
2017
/
p. 707-712
https://doi.org/10.1109/MILCOM.2017.8170785
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
63
book article
Behavior of carbonate-rich fuels in AFBC and PFBC conditions
Ots, Arvo
;
Arro, Hendrik
;
Pihu, Tõnu
;
Prikk, Arvi
Proceedings of the 15th International Conference on Fluidized Bed Combustion : May 16-19, 1999, Savannah, Georgia [CD-ROM]
1999
/
20 p
https://www.osti.gov/biblio/20006717
book article
64
book article
Behavioral level modeling of digital systems for testing purposes
Ubar, Raimund-Johannes
42nd International Conference, Ilmenau, Germany, September 22-25, 1997. Part 1
1997
/
p. 510-515
book article
65
book article
A benchmark suite for evaluating the efficiency of test tools
Kruus, Helena
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Gorev, Maksim
;
Pesonen, Vadim
;
Devadze, Sergei
;
Orasson, Elmet
;
Brik, Marina
;
Min, Mart
;
Annus, Paul
;
Kruus, Margus
;
Meigas, Kalju
BEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia
2012
/
p. 85-88 : ill
book article
66
book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
67
book article
A BIST scheme for testing mixed analogue and digital circuits
Robson, Malcolm
;
Russel, Gordon
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 183-186: ill
book article
68
book article
Built-in self diagnosis with multiple signature analyzers in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 29-34 : ill
book article
69
book article
A CAD system for teaching digital test
Ubar, Raimund-Johannes
;
Ivask, Eero
;
Paomets, Priidu
;
Raik, Jaan
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 369-372: ill
book article
70
journal article EST
/
journal article ENG
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Microprocessors and microsystems
2020
/
art. 103117, 12 p
https://doi.org/10.1016/j.micpro.2020.103117
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
71
book article
Calculation of testability measures on structurally synthesized binary decision diagrams
Ubar, Raimund-Johannes
;
Heinlaid, J.
;
Raik, Jaan
;
Raun, L.
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 179-182: ill
book article
72
journal article
Case study in testing digital systems
Ubar, Raimund-Johannes
Baltic electronics
1995
/
1, p. 24-27
journal article
73
book article
Case study-based performance evaluation of reactive planning tester
Kull, Andres
;
Raiend, Kullo
;
Vain, Jüri
;
Kääramees, Marko
Model-based Testing in Practice : 2nd Workshop on Model-based Testing in Practice(MoTiP 2009) : Enschede, The Netherlands, June 23, 2009 : proceedings
2009
/
p. 87-96 : ill
https://www.etis.ee/Portal/Publications/Display/c507fc75-771f-419a-bf67-571af65fdb66
book article
74
journal article EST
/
journal article ENG
Circular production, designing, and mechanical testing of polypropylene-based reinforced composite materials : statistical analysis for potential automotive and nuclear applications
Hussain, Abrar
;
Podgurski, Vitali
;
Goljandin, Dmitri
;
Antonov, Maksim
;
Sergejev, Fjodor
;
Krasnou, Illia
Polymers
2023
/
art. 3410, 30 p. : ill
https://doi.org/10.3390/polym15163410
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Related publications
1
Development of sustainable polypropylene based composites = Polüpropeeni baasil jätkusuutlike komposiitide arendus
75
book article
Code coverage analysis for concurrent programming languages using high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
Proceedings of the 12th European Workshop on Dependable Computing : EWDC 2009 : Toulouse, France, May 14-15, 2009
2009
/
[4] p. : ill
https://hal.archives-ouvertes.fr/hal-00381559
book article
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