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32901
journal article EST
/
journal article ENG
High-intensity interval and moderate-intensity continuous training on cerebral energy metabolism in older rats.
Marcourt, Cecile
;
Rivera, Claudio
;
Tuvikene, Jürgen
;
Langeard, Antoine
;
Esvald, Eli-Eelika
;
Cabrera-Cabrera, Florencia
;
Timmusk, Tõnis
;
Temprado, Jean-Jacques
;
Laurin, Jerome
GeroScience
2025
/
16 p
https://doi.org/10.1007/s11357-025-01820-5
journal article EST
/
journal article ENG
32902
book article
High-K ZrO2 thin films by chemical spray pyrolysis method [Online resource]
Oluwabi, Abayomi Titilope
;
Oja Acik, Ilona
;
Katerski, Atanas
;
Krunks, Malle
Tartu Ülikooli ASTRA projekt PER ASPERA : Funktsionaalsed materjalid ja tehnoloogiad : [7-8 märtsil 2018, Tallinn : teesid]
GSFMT Scientific Conference 2018 : Tallinn, March 7-8, 2018 : abstracts
2018
/
1 p
http://fmtdk.ut.ee/teesid-2018/
book article
32903
journal article
High-key paljundus
Fotokunst
1930
/
lk. 153-154
journal article
32904
journal article EST
/
journal article ENG
High-level axioms for graphical linear algebra
Paixao, Joao
;
Rufino, Lucas
;
Sobocinski, Pawel Maria
Science of computer programming
2022
/
art. 102791 ; 26 p
https://doi.org/10.1016/j.scico.2022.102791
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
32905
newspaper article
High-level CERN delegation visiting Estonia [Online resource]
baltictimes.com
2021
"High-level CERN delegation visiting Estonia"
newspaper article
32906
book article
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
book article
32907
book article
High-level combined deterministic and pseudo-exhuastive test generation for RISC processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
book article
32908
book article
High-level decision diagram based fault models for targeting FSMs
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 353-358 : ill
http://dx.doi.org/10.1109/DSD.2006.60
book article
32909
book article
High-Level Decision Diagram manipulations for code coverage analysis
Minakova, Karina
;
Reinsalu, Uljana
;
Tšepurov, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 207-210 : ill
book article
32910
book article
High-level decision diagram simulation for diagnosis and soft-error analysis
Raik, Jaan
;
Repinski, Urmas
;
Jenihhin, Maksim
;
Chepurov, Anton
Design and test technology for dependable systems-on-chip
2011
/
p. 294-309 : ill
https://www.igi-global.com/chapter/high-level-decision-diagram-simulation/51406
book article
32911
book article
High-level decision diagrams based coverage metrics for verification and test
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
2009
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2009.4813792
book article
32912
book article
High-level decision diagrams for improving simulation performance of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Morawiec, Adam
SCI 2000 : World Multiconference on Systemics, Cybernetics and Informatics : July 23-26, 2000, Orlando, Florida, USA : proceedings. Volume IX, Industrial Systems
2000
/
p. 62-67 : ill
https://hal.science/hal-01396447v1
book article
32913
book article
High-level design error diagnosis using backtrace on decision diagrams
Raik, Jaan
;
Repinski, Urmas
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers
2010
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2010.5669486
book article
32914
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
32915
book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
32916
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
32917
dissertation
High-level implementation-independent software-based self-test for RISC type microprocessors = Mikroprotsessorite tarkvarapõhine implementatsioonist mittesõltuv funktsionaalne enesekontroll
Oyeniran, Adeboye Stephen
2020
https://digikogu.taltech.ee/et/Item/08a75fbb-3f71-4fe4-b3d0-3f37a9a5f36d
dissertation
32918
book article
High-level intellectual property obfuscation via decoy constants
Aksoy, Levent
;
Nguyen, Quang-Linh
;
Almeida, Felipe
;
Raik, Jaan
;
Flottes, Marie-Lise
;
Dupuis, Sophie
;
Pagliarini, Samuel Nascimento
2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) : Torino, Italy, 28-30 June 2021
2021
/
p. 1-7
https://doi.org/10.1109/IOLTS52814.2021.9486714
book article
32919
book article
High-level modeling and testing of multiple control faults in digital systems
Jasnetski, Artjom
;
Oyeniran, Adeboye Stephen
;
Tšertov, Anton
;
Schölzel, Mario
;
Ubar, Raimund-Johannes
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/DDECS.2016.7482445
book article
32920
book article
High-level path activation technique to speed up sequential circuit test generation
Raik, Jaan
;
Ubar, Raimund-Johannes
European Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany
1999
/
p. 84-89 : ill
https://ieeexplore.ieee.org/document/804289
book article
32921
book
High-level regional mapping of CO2 emission sources, utilization industry and infrastructure in the Baltic Sea and Mediterranean Sea regions
Ringstad, Cathrine
;
Falck da Silva, Eirik
;
Skagestad, Ragnhild
;
Heyn, Richard
;
Biragnet, Cécile
;
Frykman, Peter
;
Anthonsen, Karen Lyng
;
Gravaud, Isaline
;
Wójcicki, Adam
;
Šogenova, Alla
;
Šogenov, Kazbulat
;
Sınayuç, Çağlar
;
Yıldırım, Betül
;
Bulbul, Sevtac
;
Sousa, Leandro-Henrique
;
Perimenis, Anastasios
2023
https://doi.org/10.5281/zenodo.14392847
book
32922
book article
High-level specification of games
Henno, Jaak
Towards Intelligent Engineering and Information Technology
2009
/
p. 307-322
https://link.springer.com/chapter/10.1007/978-3-642-03737-5_22
book article
32923
book article
High-level synthesis and test in the MOSCITO-based virtual laboratory
Schneider, Andre
;
Diener, Karl-Heinz
;
Jervan, Gert
;
Peng, Z.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Hollstein, Thomas
;
Glesner, M.
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 287-290 : ill
book article
32924
dissertation
High-level synthesis of control and memory intensive applications : thesis submitted to the Royal Institute of Technology in partial fulfillment of the requirements for the degree of Doctor of Technology
Ellervee, Peeter
2000
dissertation
32925
book article
High-level synthesis of control and memory intensive communication systems
Ellervee, Peeter
Eighth Annual IEEE International ASIC Conference and Exhibit : proceedings : Stouffer Renaissance Austin Hotel, Austin, Texas, September 18-22, 1995
1995
/
p. 185-191 : ill
book article
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