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32901

book article

High-Level Decision Diagram manipulations for code coverage analysisMinakova, Karina; Reinsalu, Uljana; Tšepurov, Anton; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 207-210 : ill

book article

32902

book article

High-level decision diagram simulation for diagnosis and soft-error analysisRaik, Jaan; Repinski, Urmas; Jenihhin, Maksim; Chepurov, AntonDesign and test technology for dependable systems-on-chip2011 / p. 294-309 : ill https://www.igi-global.com/chapter/high-level-decision-diagram-simulation/51406

book article

32903

book article

High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

book article

32904

book article

High-level decision diagrams for improving simulation performance of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Morawiec, AdamSCI 2000 : World Multiconference on Systemics, Cybernetics and Informatics : July 23-26, 2000, Orlando, Florida, USA : proceedings. Volume IX, Industrial Systems2000 / p. 62-67 : ill https://hal.science/hal-01396447v1

book article

32905

book article

High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

book article

32906

book article

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

book article

32907

book article

High-level functional test generation for microprocessor modulesOyeniran, Adeboye Stephen; Ubar, Raimund-JohannesProceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 20192019 / p. 356-361 : ill https://doi.org/10.23919/MIXDES.2019.8787131

book article

32908

journal article

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanJournal of electronic testing : theory and applications2020 / p. 87-103 https://doi.org/10.1007/s10836-020-05856-7

journal article

32909

dissertation

High-level implementation-independent software-based self-test for RISC type microprocessors = Mikroprotsessorite tarkvarapõhine implementatsioonist mittesõltuv funktsionaalne enesekontrollOyeniran, Adeboye Stephen2020 https://digikogu.taltech.ee/et/Item/08a75fbb-3f71-4fe4-b3d0-3f37a9a5f36d

dissertation

32910

book article

High-level intellectual property obfuscation via decoy constantsAksoy, Levent; Nguyen, Quang-Linh; Almeida, Felipe; Raik, Jaan; Flottes, Marie-Lise; Dupuis, Sophie; Pagliarini, Samuel Nascimento2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) : Torino, Italy, 28-30 June 20212021 / p. 1-7 https://doi.org/10.1109/IOLTS52814.2021.9486714

book article

32911

book article

High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445

book article

32912

book article

High-level path activation technique to speed up sequential circuit test generationRaik, Jaan; Ubar, Raimund-JohannesEuropean Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany1999 / p. 84-89 : ill https://ieeexplore.ieee.org/document/804289

book article

32913

book

High-level regional mapping of CO2 emission sources, utilization industry and infrastructure in the Baltic Sea and Mediterranean Sea regionsRingstad, Cathrine; Falck da Silva, Eirik; Skagestad, Ragnhild; Heyn, Richard; Biragnet, Cécile; Frykman, Peter; Anthonsen, Karen Lyng; Gravaud, Isaline; Wójcicki, Adam; Šogenova, Alla; Šogenov, Kazbulat; Sınayuç, Çağlar; Yıldırım, Betül; Bulbul, Sevtac; Sousa, Leandro-Henrique; Perimenis, Anastasios2023 https://doi.org/10.5281/zenodo.14392847

book

32914

book article

High-level specification of gamesHenno, JaakTowards Intelligent Engineering and Information Technology2009 / p. 307-322 https://link.springer.com/chapter/10.1007/978-3-642-03737-5_22

book article

32915

book article

High-level synthesis and test in the MOSCITO-based virtual laboratorySchneider, Andre; Diener, Karl-Heinz; Jervan, Gert; Peng, Z.; Raik, Jaan; Ubar, Raimund-Johannes; Hollstein, Thomas; Glesner, M.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 287-290 : ill

book article

32916

dissertation

High-level synthesis of control and memory intensive applications : thesis submitted to the Royal Institute of Technology in partial fulfillment of the requirements for the degree of Doctor of TechnologyEllervee, Peeter2000

dissertation

32917

book article

High-level synthesis of control and memory intensive communication systemsEllervee, PeeterEighth Annual IEEE International ASIC Conference and Exhibit : proceedings : Stouffer Renaissance Austin Hotel, Austin, Texas, September 18-22, 19951995 / p. 185-191 : ill

book article

32918

book article

High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167

book article

32919

book article

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

book article

32920

book article

High-level test synthesis with hierarchical test generationJervan, Gert; Eles, Petru; Peng, Zebo; Raik, Jaan; Ubar, Raimund-Johannes17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings1999 / p. 291-296

book article

32921

book article

Highlight of photocurrent generation in garbon-based nanohybrids combined with HfO2 nanoparticlesRauwel, Protima; Galeckas, Augustinas; Ducroquet, Frederiquet; Rauwel, Erwan5th International Conference on Competitive Materials and Technology Processes : Miskolc-Lillafüred, Hungary, October 8-12, 2018 : book of abstracts2018 / p. 166 https://www.ic-cmtp5.eu/doc/book_of_abstract_iccmtp5.pdf

book article

32922

journal article

Highlights from REHVA Supporters’ Seminar 2015Kurnitski, JarekThe REHVA European HVAC journal2015 / 56-59

journal article

32923

book article

Highlights of Estonian Engineering and Technology SciencesHigher Education and Research in Estonia2019 / p. 45 : ill https://www.digar.ee/viewer/et/nlib-digar:434236/368591/page/47 https://www.ester.ee/record=b5246114*est

book article

32924

journal article

Highlights of the physical oceanography of the Gulf of Finland reflecting potential climate changesSoomere, Tarmo; Leppäranta, Matti; Myrberg, KaiBoreal environment research2009 / p. 152-165 : ill

journal article

32925

book article EST / book article ENG

Highly active Fe-N/C oxygen electrocatalysts based on silicon carbide derived carbonTeppor, Patrick; Jäger, Rutha; Hints, J.; Volobujeva, Olga; Valk, Peeter; Koppel, Miriam; Lust, EnnPolymer Electrolyte Fuel Cells & Electrolyzers 20 (PEFC & E 20)2020 / p. 607 - 615 https://doi.org/10.1149/09809.0607ecst Conference Proceedings at Scopus Article at Scopus

book article EST / book article ENG

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