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99126

journal article

Tesla ja uued surmakiiredRaadio1934 / lk. 281

journal article

99127

newspaper article

Tesla konkurendiks pürgiv Eesti superakude tootja Skeleton kutsus Tallinna Tehnikaülikooli appi maailma tippkeskust looma [Võrguväljaanne]geenius.ee2021 "Tesla konkurendiks pürgiv Eesti superakude tootja Skeleton kutsus Tallinna Tehnikaülikooli appi maailma tippkeskust looma"

newspaper article

99128

newspaper article

Tesman alustas kolledžihoone rekonstrueerimistMeie Maa2003 / 16. dets., lk. 1

newspaper article

99129

newspaper article

TEST ⟩ Kas sina tead, kuidas hinnata elektrisüsteemi seisundit ja miks rekonstrueeritakse tramme? Pane end proovile! [Võrguväljaanne], Kas sina tead, kuidas hinnata elektrisüsteemi seisundit ja miks rekonstrueeritakse tramme? Pane end proovile! [Võrguväljaanne]postimees.ee2022 "Kas sina tead, kuidas hinnata elektrisüsteemi seisundit ja miks rekonstrueeritakse tramme? Pane end proovile!"

newspaper article

99130

book

Test : inglise keele test keskastmeleKokkota, Valmar2005 https://www.ester.ee/record=b2007894*est

book

99131

book article

Test and calibration laboratories accreditation system in EstoniaKulderknup, Edi; Nanits, Mats-MaiduProceedings of the Second National DAAAM Conference in Estonia : Science'961997 / p. 63-67: ill

book article

99132

book article

A test bench to study propulsion drives of electric vehicles [Electronic resource]Rassõlkin, Anton; Vodovozov, ValeryCPE 2013 : 2013 International Conference on Compatibility and Power Electronics (CPE) : June 5-7, 2013, Ljubljana, Slovenia : conference proceedings2013 / p. 275-279 : ill [CD-ROM]

book article

99133

book article

A test bench to study propulsion drives of electric vehicles with a supercapacitor storage system [Electronic resource]Rassõlkin, Anton; Vodovozov, ValeryМеждународная Научно-Техническая Конференция "Силовая Электроника и Энергоэффективность" : 23-27.IX 2013, Алушта, Крым2013 / [3] p. : ill [CD-ROM]

book article

99134

book article

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, VineethInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 33-37 : ill

book article

99135

book article

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

book article

99136

book article

Test cost minimization for hybrid BISTJervan, Gert; Peng, Zebo; Ubar, Raimund-JohannesIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings2000 / p. 283-298 : ill https://ieeexplore.ieee.org/abstract/document/887168

book article

99137

journal article

Test cover calculation in digital systems with word-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaВестник Томского государственного университета2002 / с. 315-319 : ил

journal article

99138

book article

Test development and deployment tool-set for mixed-signal and digital devicesMellik, Andres; Raik, JaanBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 163-166 : ill

book article

99139

book article

Test driven domain modellingPiho, Gunnar; Tepandi, Jaak; Parman, Marko; Puusep, Viljam; Roost, MartMIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings2011 / p. 576-581 https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5967121

book article

99140

journal article EST / journal article ENG

A test for the generic strong-accessibility of meromorphic nonlinear systemsCarravetta, Francesco; Sarafrazi, Mohammad Amin; Bartosiewicz, Zbigniew; Kotta, ÜlleIEEE transactions on automatic control2020 / p. 867-873 https://doi.org/10.1109/TAC.2019.2921645 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

99141

book

Test für praktische deutsche GrammatikLomakina, Valentina1987 https://www.ester.ee/record=b2170574*est

book

99142

book article

Test generation : a hierarchical approachJervan, Gert; Ubar, Raimund-Johannes; Peng, Z.; Eles, PetruSystem-level test and validation of hardware/software systems2005 / p. 67-81 : ill

book article

99143

journal article

Test generation and knowledge base browsing facilities in expert system shell HELIParmakson, PriitTallinna Tehnikaülikooli Toimetised1991 / lk. 26-40: ill

journal article

99144

book article

Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill

book article

99145

book article

Test generation for digital systemsUbar, Raimund-JohannesDigest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy1983 / p. 374-377

book article

99146

book article

Test generation for digital systems at functional levelUbar, Raimund-Johannes; Kuchcinski, Ktzysztof; Peng, Z.Research report LiTH-IDA-R-90-06, Linköping University, Sweden1990 / p. 1-21

book article

99147

book article

Test generation for digital systems based on alternative graphsUbar, Raimund-JohannesDependable Computing - EDCC-1 : First European Dependable Computing Conference, Berlin, Germany, October 1994 : proceedings1994 / p. 151-164: ill

book article

99148

journal article

Test generation for expert systems with fuzzy truth valuesTepandi, JaakBulletin for studies and exchanges in fuzziness and its applications1989 / p. 83-92

journal article

99149

book article

Test generation for finite state machinesUbar, Raimund-Johannes; Brik, MarinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 233-236: ill

book article

99150

book article

Test generation for microprocessor control mechanismsLohuaru, Tõnu; Ubar, Raimund-JohannesFTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)1987 / p. 305-311

book article

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