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99151

book article

Test generation for microprocessors on alternative graphsAlango, Villem; Kont, Toomas; Ubar, Raimund-Johannes33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik1988 / p. 11-14

book article

99152

book article

Test generation for sequential digital systems based on symbolic simulationSkobtsov, Vadim; Skobtsov, Yu.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 341-344: ill

book article

99153

book article

Test generation techniques and algorithmsUbar, Raimund-Johannes; Gramatova, Elena; Fisherova, MariaHandbook of testing electronic systems2005 / p. 99-173 : ill

book article

99154

book article

Test generation with structurally synthesized BDD modelsRaik, Jaan; Ubar, Raimund-JohannesProceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 19981998 / p. 66-68

book article

99155

book article

Test method for determining radiation absorptivity and emissivity coefficients of ACSR conductorsKiitam, Ivar18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]2019 / p. 185-186 : ill https://www.ester.ee/record=b5183874*est

book article

99156

journal article

Test method for the total content of non-volatile phenols in wastewaterJohannes, Ille; Mölder, Leevi; Tiikma, LaineOil shale1998 / 3, p. 232-238

journal article

99157

journal article

Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocolsBengtsson, Tomas; Kumar, Shashi; Ubar, Raimund-Johannes; Jutman, Artur; Peng, ZeboIET computers and digital techniques2008 / 6, p. 445-460 https://www.diva-portal.org/smash/record.jsf?dswid=-5073&aq2=%5B%5B%5D%5D&c=39&af=%5B%5D&searchType=SIMPLE&sortOrder2=title_sort_asc&language=en&pid=diva2%3A290043&aq=%5B%5B%7B%22personId%22%3A%22authority-person%3A23389%22%7D%5D%5D&sf=all&aqe=%5B%5D&sortOrder=author_sort_asc&onlyFullText=false&noOfRows=50

journal article

99158

book article

Test methods for determination of design parameters for fastenersFranke, Steffen; Franke, Bettina; Tuhkanen, EeroDesign of connections in timber structures : a state-of-the-art report by COST action FP1402/WG32018 / p. 33–59 : ill https://www.costfp1402.tum.de/fileadmin/w00btl/www/All_Members/Sandhaas__C.__Munch-Andersen__J._Dietsch__P.__Design_of_Connections_in_Timber_Structures.pdf

book article

99159

book article

Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148

book article

99160

book article

Test pattern generation for microprocessor systems on the alternative graph modelUbar, Raimund-JohannesProceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 19831985 / p. 403-410

book article

99161

dissertation

Test program generation for microprocessor systemsDušina, Julia1993 https://www.ester.ee/record=b2090526*est

dissertation

99162

book article

Test results of practical value-centric business development methodologyRandmaa, Merili; Otto, Tauno; Howard, Thomas J.Proceedings of NordDesign 2014 Conference2014 / p. 642-651 : ill

book article

99163

book article

Test scenario generator learning for model-based testing of mobile robotsKanter, Gert; Liibert, Marti IngmarSystem assurances : modeling and management2022 / p. 67-84 https://doi.org/10.1016/B978-0-323-90240-3.00005-9

book article

99164

journal article EST / journal article ENG

Test scenario specification language for model-based testingHalling, Evelin; Vain, Jüri; Boyarchuk, Artem; Illiashenko, OlegInternational Journal of Computing2019 / p. 408-421 : ill http://www.computingonline.net/computing/article/view/1611 https://doi.org/10.47839/ijc.18.4.1611 Journal metrics at Scopus Article at Scopus

journal article EST / journal article ENG

99165

book article

Test set minimization using bipartite graphsMarkus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 175-178: ill

book article

99166

book article

Test setup for measuring medium voltage power cable and joint temperature in high current tests using thermocouples [Online resource]Taklaja, Paul; Kiitam, Ivar; Hyvönen, Petri; Klüss, Joni34th Electrical Insulation Conference : Hotel Bonaventure, Montreal, Qc, Canada, 19-22 June 2016 : proceedings2016 / p. 480-483 : ill https://doi.org/10.1109/EIC.2016.7548642

book article

99167

book article

Test strategy for a 486 computer multichip moduleMagnhagen, BengtBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 339-340: ill

book article

99168

book article

Test synthesis from register-transfer level descriptionsRaik, Jaan; Paomets, PriiduBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 311-314: ill

book article

99169

journal article

Test synthesis with alternative graphsUbar, Raimund-JohannesIEEE design & test of computers1996 / Spring, p. 48-57: ill

journal article

99170

journal article

Test system for fault detection and diagnosis in microprocessor control devicesUbar, Raimund-Johannes; Lohuaru, Tõnu; Männisalu, Mati; Pukk, P.; Vanamölder, E.Tallinna Tehnikaülikooli Toimetised1990 / lk. 63-77: ill

journal article

99171

book article

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China2003 / p. 318-325 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

book article

99172

journal article

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, MaksimJournal of computer science and technology2006 / 6, p. 907-912 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

journal article

99173

book article

Test time minimization for hybrid BIST with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 112-116 : ill https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf

book article

99174

newspaper article

TEST: Gümnaasiumi maateaduse olümpiaadi küsimused [Võrguväljaanne]postimees.ee2021 "TEST: Gümnaasiumi maateaduse olümpiaadi küsimused"

newspaper article

99175

newspaper article

TEST: Kui hästi tunned meditsiinitehnoloogiat? [Võrguväljaanne]postimees.ee2021 "TEST: Kui hästi tunned meditsiinitehnoloogiat?"

newspaper article

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