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Filosoofia ja loogika testid [Elektrooniline teavik]Meos, Indrek2020 https://filosoofia.indrekmeos.xyz/testid/

book

52

book article

FTGEN - система генерирования функциональных тестовUbar, Raimund-Johannes; Dušina, Julia; Zaugarov, Viktor; Крупнова Е.; Storožev, SergeiProceedings of CAD-93 : new information technologies for science, education and business, Yalta, May 4-13, 19931993 / p. 123-125

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53

book article

Functional built-in self-test for processor cores in SoCUbar, Raimund-Johannes; Indus, Viljar; Kalmend, Oliver; Evartson, Teet; Orasson, Elmet30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 20122012 / p. 1-4 : ill https://ieeexplore.ieee.org/document/6403148

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54

book article

Functional test program generation for digital systemsUbar, Raimund-Johannes; Dušina, Julia; Krupnova, Helena; Storožev, Sergei; Zaugarov, ViktorTestmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 19941994 / p. 14-18: ill

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55

newspaper article

Geneetiline test aitab arstidel määrata sobivaima ravimi ja annuseLaanetu, Mari-Liis; Viigimaa, Margusmu.ee2024 Geneetiline test aitab arstidel määrata sobivaima ravimi ja annuse

newspaper article

56

book article

Generating tests from EFSM models using guided model checking and iterated search refinmentErnits, Juhan-Peep; Kull, Andres; Raiend, Kullo; Vain, JüriFormal Approach to Software Testing and Runtime Verification : First Combined International Workshops FATES 2006 and RV 2006 : Seattle, WA, USA, August 15-16, 2006 : revised selected papers2006 / p. 85-99 https://link.springer.com/chapter/10.1007/11940197_6

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57

book article

A global methodology for test program generation starting from high level specificationsStorojev, Sergei; Leveugle, Regis; Saucier, GabrieleBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 305-311: ill https://www.ester.ee/record=b2150914*est

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58

journal article

Hierarchical approaches to test generation and fault simulationUbar, Raimund-JohannesRadioelectronics and informatics2003 / p. 204

journal article

59

book article

Hierarchical defect level test quality analysisBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

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60

book article

Hierarchical test generation based on alternative graph modelUbar, Raimund-JohannesProceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 19951995 / p. 18

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61

book article

Hierarchical test generation for complex digital systems with control and data processing partsUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 43-52

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62

book article

Hierarchical test generation. SEMI show slidesUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 53-64

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63

book article

Hierarchical test synthesis for digital systems using alternative graph modelUbar, Raimund-JohannesQuantitative aspects of designing and validating dependable computing systems1995

book article

64

dissertation

High-level implementation-independent software-based self-test for RISC type microprocessors = Mikroprotsessorite tarkvarapõhine implementatsioonist mittesõltuv funktsionaalne enesekontrollOyeniran, Adeboye Stephen2020 https://digikogu.taltech.ee/et/Item/08a75fbb-3f71-4fe4-b3d0-3f37a9a5f36d

dissertation

65

book article

High-level test synthesis with hierarchical test generationJervan, Gert; Eles, Petru; Peng, Zebo; Raik, Jaan; Ubar, Raimund-Johannes17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings1999 / p. 291-296

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66

book article

HomeLabKits - implementation and usageJaanus, Martin; Kukk, Vello; Umbleja, Kadri; Gordon, Boris; Pikkov, MihhailBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 331-334 : ill

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67

book article

Hybrid BIST scheduling for NoC-based SoCsJervan, Gert; Shchenova, Tatjana; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 141-144 : ill https://ieeexplore.ieee.org/document/4126966

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68

book article

Interrelation between word structure and types of language testsNovikova, E.S.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 69-70

book article

69

dissertation

Investigation and development of test generation methods for control part of digital systemsBrik, Marina2002 http://www.ester.ee/record=b1688656*est

dissertation

70

journal article EST / journal article ENG

Is information and communication technology satisfying educational needs at school?Ferraro, SimonaComputers & Education2018 / p. 194-204 : ill https://doi.org/10.1016/j.compedu.2018.04.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

71

book article

Java applets support for an asynchronous-mode learning of digital design and testJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichITHET 2003 proceedings : 4th International Conference on Information Technology Based Higher Education and Training : July 7-9, 2003, Marrakech, Morocco2003 / p. 397-401 : ill https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=92f0b0e5011a2192d5a1b98baa751cb8cd2f7ff3

book article

72

newspaper article

Kas oskad vastata aegade keerulisima maateaduste olümpiaadi küsimustele?postimees.ee2022 "Kas oskad vastata aegade keerulisima maateaduste olümpiaadi küsimustele?"

newspaper article

73

newspaper article

Kas tead, kes on rahalehm ja millega üks FIE tegelema ei pea? Pane end proovile! [Võrguväljaanne]postimees.ee2022 Kas tead, kes on rahalehm ja millega üks FIE tegelema ei pea? Pane end proovile!

newspaper article

74

book article

Kiirmeetod paberi toksilisuse määramiseks, milles testorganismidena kasutatakse fotobaktereidKahru, Anne; Põllumaa, Lee; Külm, I.; Kanger, K.EMS 96 teaduskonverents, 6.-7. juuni 1996, Tallinn = EMS 96 Scientific Conference, 6-7 June 1996, Tallinn1996 / poster 18

book article

75

journal article

Knowledge-based test generation from specificationsTepandi, JaakProceedings of the Estonian Academy of Sciences. Engineering1997 / 2, p. 127-142: ill

journal article

testid (subject term)

types of item

subject term 4