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26

book article

Digitaalsüsteemide diagnostika Tallinna TehnikaülikoolisUbar, Raimund-JohannesTeadusmõte Eestis : tehnikateadused2002 / lk. 107-113 : ill

book article

27

dissertation

Digital test in WEB-based environmentIvask, Eero2006 https://www.ester.ee/record=b2158119*est

dissertation

28

book article

Distributed approach for genetic test generation in the field of digital electronicsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIntelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 20082008 / p. 127-136

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29

journal article

Effective self adaptive multiple source localization technique by primal dual interior point method in binary sensor networksKhan, Muhidul Islam; Xia, KewenIEEE communications letters2017 / p. 1119-1122 : ill https://doi.org/10.1109/LCOMM.2017.2657508

journal article

30

book article

E-learning environment in the area of digital microelectronicsJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichITHET 2004 : proceedings of the Fifth International Conference on Information Technology based Higher Education and Training : 31 May - 2 June, 2004, Istanbul, Turkey2004 / p. 278-283 : ill

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31

book article

E-learning of digital logicRobal, Tarmo; Brik, Marina; Aarna, MargitEWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden2006 / p. 120-123 : ill

book article

32

book article

E-learning tools for teaching self-test of digital electronicsJutman, Artur; Gramatova, Elena; Pikula, T.; Ubar, Raimund-Johannes15 EAEEIE International Conference on Innovation in Education for Electrical and Information Engineering : Sofia, Bulgaria, May 27-29, 20042004 / p. 267-272 : ill

book article

33

book article

E-learning tools for teaching the decomposition based digital synthesisSudnitsõn, Aleksander; Kruus, MargusEWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden2006 / p. 63-66 https://pld.ttu.ee/~kruus/EWME_06_sudn.pdf

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34

book article EST / book article ENG

Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, JaanVLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers2016 / p. 23-45 : ill https://doi.org/10.1007/978-3-319-46097-0_2 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

35

book article

FPGA platform based digital design educationMihhailov, Dmitri; Kruus, Margus; Sudnitsõn, AleksanderProceedings of the 9th International Conference on Computer Systems and Technologies and Workshop for PhD Students in Computing : CompSysTech'2008. Vol. 374, ACM International Conference Proceeding Series2008 / p. IV.4-1 - IV.4-6 : ill https://dl.acm.org/doi/pdf/10.1145/1500879.1500938

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36

book article

Functional level testability analysis for digital circuitsUbar, Raimund-Johannes; Kuchcinski, KtzysztofETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 19931993 / p. 545-546

book article

37

journal article

Hierarchical physical defect reasoning in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Brik, MarinaEstonian journal of engineering2011 / 3, p. 185-200

journal article

38

book article

Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-Johannes10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 596-603 : ill http://dx.doi.org/10.1109/DSD.2007.4341529

book article

39

book

Hybrid built-in self-test and test generation techniques for digital systemsJervan, Gert2005 https://www.ester.ee/record=b2177537*est

book

40

book article

Investigating defects in digital circuits by Boolean differential equationsKruus, Helena; Orasson, Elmet; Robal, Tarmo; Ubar, Raimund-JohannesThe 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)2004 / p. 432-435

book article

41

dissertation

Investigation and development of test generation methods for control part of digital systemsBrik, Marina2002 http://www.ester.ee/record=b1688656*est

dissertation

42

dissertation

Methods for improving the accuracy and efficiency of fault simulation in digital systems = Meetodid digitaalsüsteemide rikete simuleerimise täpsuse ja efektiivsuse tõstmiseksKõusaar, Jaak2019 https://digi.lib.ttu.ee/i/?11667

dissertation

43

book

MikroprotsessortehnikaLehtla, Tõnu; Kulmar, Lembit1995 https://www.ester.ee/record=b1054894*est

book

44

journal article

Module level defect simulation in digital circuitsKuzmicz, Wieslaw; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering2001 / 4, p. 253-268

journal article

45

book article

Multi-valued simulation of digital circuits with structurally synthesized binary decision diagramsUbar, Raimund-JohannesMultiple valued logic. Vol. 41998 / p. 141-157

book article

46

journal article EST / journal article ENG

Overview of digital twin platforms for EV applicationsMohamed, Mahmoud Ibrahim Hassanin; Rjabtšikov, Viktor; Gilbert, RolandoSensors2023 / art. 1414, 15 p. : ill https://doi.org/10.3390/s23031414 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

47

book article

Research environment for teaching digital testIvask, Eero; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 468-473 : ill https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf

book article

48

dissertation

Selected issues of modeling, verification and testing of digital systemsJutman, Artur2004 https://www.ester.ee/record=b1989760*est

dissertation

49

journal article

Silmade asemel, ehk, Lihtne digitaalne ostsilloskoop arvutileSinivee, VeljoArvutikasutaja2005 / 2, lk. 10-12 : ill https://artiklid.elnet.ee/record=b1050354*est

journal article

50

book article

Simulation-based verification with APRICOT framework using high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesEast-West Design & Test Symposium : Moscow, September 18-21, 20092009 / p. 13-16 : ill

book article

digitaalelektroonika (subject term)

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