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digitaalelektroonika (subject term)
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1
book article
Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systems
Ubar, Raimund-Johannes
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 285-292: ill
book article
2
book article
An ontology-based intelligent learning object for teaching the basics of digital logic
Robal, Tarmo
;
Kann, Taavi
;
Kalja, Ahto
2011 IEEE International Conference on Microelectronic Systems Education (MSE) : 5-6 June 2011, San Diego, CA, USA
2011
/
p. 106-107
book article
3
journal article
Application of structurally synthesized binary decision diagrams for timing simulation of digital circuits
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings of the Estonian Academy of Sciences. Engineering
2001
/
4, p. 269-288 : ill
journal article
4
book
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia)
Rang, Toomas
;
Min, Mart
;
Ubar, Raimund-Johannes
1994
book
5
book
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia)
1994
https://www.ester.ee/record=b2150914*est
book
6
book
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
Rang, Toomas
2002
http://www.ester.ee/record=b2150914*est
book
7
book
BEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia
2004
https://www.ester.ee/record=b1982896*est
book
8
book
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
http://www.ester.ee/record=b2150914*est
book
9
book
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
Rang, Toomas
2006
http://www.ester.ee/record=b2150914*est
book
10
book
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
Rang, Toomas
2008
http://www.ester.ee/record=b2150914*est
book
11
book
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 4-6, 2010, Tallinn, Estonia
Rang, Toomas
2010
http://www.ester.ee/record=b2150914*est
book
12
book
BEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia
2012
http://www.ester.ee/record=b2150914*est
book
13
book
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
Rang, Toomas
2014
http://www.ester.ee/record=b2150914*est
book
14
book
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
Rang, Toomas
2016
http://www.ester.ee/record=b2150914*est
book
15
book
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
Rang, Toomas
;
Min, Mart
;
Ubar, Raimund-Johannes
1996
https://www.ester.ee/record=b2150914*est
book
16
book article
A BIST scheme for testing mixed analogue and digital circuits
Robson, Malcolm
;
Russel, Gordon
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 183-186: ill
book article
17
book article
Calculation of the diagnosibility of digital circuits without using fault models
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 159-162 : ill
book article
18
journal article
Case study in testing digital systems
Ubar, Raimund-Johannes
Baltic electronics
1995
/
1, p. 24-27
journal article
19
book article
Collaborative distributed computing in the field of digital electronics testing
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Balanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings
2010
/
p. 145-152
book article
20
book article
Collaborative distributed fault simulation for digital electronic circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Intelligent Distributed Computing IV : proceedings of the 4th International Symposium on Intelligent Distributed Computing - IDC 2010 : Tangier, Morocco, September 2010
2010
/
p. 67-76
book article
21
book article
Defect-oriented modul-level fault diagnosis in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
2011
/
p. 81-86
book article
22
book
Digitaalelektroonika : laboratoorsete tööde kogumik
1994
http://www.ester.ee/record=b1065462*est
book
23
book
Digitaalelektroonika alused : skeemid : abimaterjal loengute jälgimise ja konspekteerimise hõlbustamiseks
1994
https://www.ester.ee/record=b1065765*est
book
24
journal article
Digitaali disain - ideest realisatsioonini
Ellervee, Peeter
A & A
2008
/
lk. 6-10 : ill
https://artiklid.elnet.ee/record=b1021438*est
journal article
25
book
Digitaalsüsteemide diagnostika
Ubar, Raimund-Johannes
2005
http://www.ester.ee/record=b2097071*est
book
Number of records 57, displaying
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