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51
book article
Integrated design and test generation under Internet based environment MOSCITO
Schneider, Andre
;
Ivask, Eero
;
Ubar, Raimund-Johannes
Euromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings
2002
/
p. 187-194 : ill
http://dx.doi.org/10.1109/DSD.2002.1115368
book article
52
book article EST
/
book article ENG
Kalman-filter based maximum power point tracking for a single-stage grid-connected photovoltaic system
Farrokhi, Ehsan
;
Ghoreishy, Hoda
;
Ahmadiahangar, Roya
;
Rosin, Argo
IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society
2021
/
Code 173927
https://doi.org/10.1109/IECON48115.2021.9589653
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
53
book article
Measurement and operation based condition monitoring methodology for high voltage circuit breakers
Asefi, Sajjad
;
Andreesen, Guido
;
Leinakse, Madis
;
Kilter, Jako
;
Kalmet, Tauri
;
Manninen, Henri
;
Landsberg, Mart
2022 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe) : proceedings
2022
/
Art. 184786
https://doi.org/10.1109/ISGT-Europe54678.2022.9960521
book article
54
book article
Modelling sound conflict management for virtual-enterprise collaboration
Narendra, Nanjangud C.
;
Norta, Alexander
;
Mahunnah, Msury
;
Maggi, Fabrizio Maria
2014 IEEE International Conference on Services Computing SCC 2014 : 27 June-2 July 2014, Anchorage, Alaska : proceedings
2014
/
p. 813-820 : ill
book article
55
book article
Morphable compression architecture for efficient configuration in CGRAs
Jafri, Syed Mohammad Asad Hassan
;
Tajammul, Muhammad Adeel
;
Ellervee, Peeter
2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings
2014
/
p. 42-49 : ill
book article
56
book article
Multi-level fault simulation of digital systems on decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
The First IEEE International Workshop on Electronic Design, Test and Applications : DELTA 2002, 29-31 January 2002, Christchurch, New Zealand : proceedings
2002
/
p. 86-91 : ill
book article
57
book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
58
book article
NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chip
Hollstein, Thomas
;
Azad, Siavoosh Payandeh
;
Kogge, Thilo
;
Ying, Haoyuan
;
Hofmann, Klaus
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 75-78 : ill
http://dx.doi.org/10.1109/DDECS.2015.30
book article
59
book article
Off-line testing of delay faults in NoC interconnects
Bengtsson, Tomas
;
Jutman, Artur
;
Kumar, Shashi
;
Peng, Zebo
;
Ubar, Raimund-Johannes
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 677-680 : ill
http://dx.doi.org/10.1109/DSD.2006.72
book article
60
book article
Open data as enabler of public service co-creation : exploring the drivers and barriers
Toots, Maarja
;
McBride, Keegan David Braun
;
Kalvet, Tarmo
;
Krimmer, Robert Johannes
Proceedings of the 7th International Conference for E-Democracy and Open Government CeDEM17 : Danube University Krems, Krems, Austria, 17-19 May 2017
2017
/
p. 102-112 : tab
https://doi.org/10.1109/CeDEM.2017.12
book article
61
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 2007
2007
/
p. 71-77
https://ieeexplore.ieee.org/document/4297319
book article
62
book article
Power-constrained hybrid BIST test scheduling in an abort-on-first-fail test environment
He, Zhiyuan
;
Jervan, Gert
;
Peng, Zebo
;
Eles, Petru
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 83-86 : ill
https://ieeexplore.ieee.org/document/1559782
book article
63
book article
Recognition and analysis of the contours drawn during the Poppelreuter's test
Nõmm, Sven
;
Bardõš, Konstantin
;
Mašarov, Ilja
;
Kozhenkina, Julia
;
Toomela, Aaro
;
Toomsoo, Toomas
2016 15th IEEE International Conference on Machine Learning and Applications : 18-20 December 2016, Anaheim, California : proceedings
2016
/
p. 170-175 : ill
http://doi.org//10.1109/ICMLA.2016.0036
book article
64
book article
A reference architecture for a national e-learning infrastructure
Saay, Mohammad Salim
;
Norta, Alexander
9th IEEE/ACM International Conference on Utility and Cloud Computing : UCC 2016 : 6-9 December 2016, Tongji University, Shanghai, China : proceedings
2016
/
p. 404-409 : ill
https://doi.org/10.1145/2996890.3007894
book article
65
book article
Remote and virtual laboratories in problem-based learning scenarios
Wuttke, Heinz-Dietrich
;
Ubar, Raimund-Johannes
;
Henke, Karsten
2010 IEEE International Symposium on Multimedia ISM 2010 : 13-15 December 2010, Taichung, Taiwan : proceedings
2010
/
p. 377-382 : ill
http://dx.doi.org/10.1109/ISM.2010.63
book article
66
book article
Re-using chip level DFT at board level
Gu, Xinli
;
Jutman, Artur
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
2012
/
1 p
book article
67
book article
Revolver : a high-performance MIMD architecture for collision free computing
Öberg, I.
;
Ellervee, Peeter
Euromicro Conference : proceedings : 24th Euromicro Conference : Västerås, Sweden, August 25-27, 1998. Vol. 1
1998
/
p. 301-308
https://ieeexplore.ieee.org/document/711814
book article
68
book article
RFID-based communications for a self-organizing robot swarm
Tammet, Tanel
;
Vain, Jüri
;
Puusepp, Andres
;
Reilent, Enar
;
Kuusik, Alar
SASO 2008 : Second IEEE International Conference on Self-Adaptive and Self-Organizing Systems : 20-24 October, 2008, Venice, Italy : proceedings
2008
/
p. 45-54
https://ieeexplore.ieee.org/document/4663409
book article
69
book article
Sequential circuit test generation using decision diagram models
Raik, Jaan
;
Ubar, Raimund-Johannes
Design, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings
1999
/
p. 736-740: ill
https://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/1999/date99/pdffiles/11e_1.pdf
book article
70
book article EST
/
book article ENG
Series buck-boost partial power converter based on the push-pull converter
Abdel-Rahim, Omar
;
Chub, Andrii
;
Blinov, Andrei
;
Vinnikov, Dmitri
IECON 2022 : 48th Annual Conference of the IEEE Industrial Electronics Society : 17-20 Oct. 2022
2022
/
code. 184962
https://doi.org/10.1109/IECON49645.2022.9968574
Conference Proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
71
book article EST
/
book article ENG
Special session: reliability assessment recipes for DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Bosio, Alberto
;
Deveautour, Bastien
;
Dos Santos, Fernando Fernandes
;
Guerrero-Balaguera, Juan-David
;
Jenihhin, Maksim
;
Kritikakou, Angeliki
;
Sierra, Robert Limas
;
Raik, Jaan
;
Taheri, Mahdi
42nd IEEE VLSI Test Symposium, VTS 2024
2024
/
11 p. : ill
https://doi.org/10.1109/VTS60656.2024.10538707
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
72
book article
SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 223-228 : ill
book article
73
book article
SSBDDs and double topology for multiple fault reasoning
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 2012
2012
/
p. 23-28
book article
74
book article
Supply air temperature control in air handling unit based on federated learning
Eik, Marika
;
Nourollahi Hokmabad, Hossein
;
Köse, Ahmet
;
Husev, Oleksandr
;
Belikov, Juri
2024 IEEE Power and Energy Society General Meeting, PESGM 2024, Seattle, 21 July 25 July, 2024
2024
/
5 p. : ill
https://doi.org/10.1109/PESGM51994.2024.10688759
Conference proceedings at Scopus
Article at Scopus
book article
75
book article
SystemC-based loose models for simulation speed-up by abstraction of RTL IP cores
Abrar, Syed Saif
;
Jenihhin, Maksim
;
Raik, Jaan
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 71-74 : ill
http://dx.doi.org/10.1109/DDECS.2015.39
book article
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