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book article EST
/
book article ENG
Comprehensive performance and robustness analysis of 2D turn models for network-on-chips
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Janson, Karl
;
Kogge, Thilo
;
Raik, Jaan
;
Jervan, Gert
;
Hollstein, Thomas
2017 IEEE International Symposium on Circuits and Systems (ISCAS)
2017
/
p. 1476-1479 : ill
https://doi.org/10.1109/ISCAS.2017.8050634
Conference proceedings at Scopus
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book article EST
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book article ENG
Number of records 1, displaying
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keyword
40
1.
minimal path
2.
Gyroid Triply periodic minimal surfaces (TPMS)
3.
minimal bactericidal concentration
4.
minimal generator
5.
minimal ideal
6.
minimal inhibitory concentration
7.
minimal state space realization
8.
minimal transversal
9.
split-p triply periodic minimal surface
10.
triply periodic minimal surface (TPMS)
11.
triply periodic minimal surfaces
12.
triply periodic minimal surfaces (TPMS)
13.
control and data path tests
14.
critical path
15.
critical path fault tracing
16.
critical path identification
17.
critical path method
18.
critical path tracing
19.
deformation path
20.
development path
21.
fault simulation with critical path tracing
22.
feasible path generation
23.
helical path separation
24.
human path rehabilitation
25.
mean free path
26.
multi-path
27.
NBTI-critical path
28.
NBTI-induced path delay estimation
29.
Parallel Fault Simulation with Critical Path Backtracing
30.
path analyses
31.
path dependency
32.
path identification
33.
path loss model
34.
path planning
35.
reaction path
36.
shortest path
37.
shortest-path
38.
test path synthesis
39.
timing-critical path
40.
tracking path
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