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book article
Comprehensive performance and robustness analysis of 2D turn models for network-on-chips
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Janson, Karl
;
Kogge, Thilo
;
Raik, Jaan
;
Jervan, Gert
;
Hollstein, Thomas
2017 IEEE International Symposium on Circuits and Systems (ISCAS)
2017
/
p. 1476-1479 : ill
https://doi.org/10.1109/ISCAS.2017.8050634
book article
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keyword
35
1.
minimal path
2.
minimal bactericidal concentration
3.
minimal ideal
4.
minimal inhibitory concentration
5.
minimal state space realization
6.
minimal transversal
7.
split-p triply periodic minimal surface
8.
triply periodic minimal surfaces
9.
control and data path tests
10.
critical path
11.
critical path fault tracing
12.
critical path identification
13.
critical path method
14.
critical path tracing
15.
deformation path
16.
development path
17.
fault simulation with critical path tracing
18.
feasible path generation
19.
helical path separation
20.
human path rehabilitation
21.
mean free path
22.
multi-path
23.
NBTI-critical path
24.
NBTI-induced path delay estimation
25.
path analyses
26.
path dependency
27.
path identification
28.
path loss model
29.
path planning
30.
reaction path
31.
shortest path
32.
shortest-path
33.
test path synthesis
34.
timing-critical path
35.
tracking path
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