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Jenihhin, Maksim (TalTech author)
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26
book article
Automated test bench generation for high-level synthesis flow ABELITE
Viilukas, Taavi
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Baranov, Samary
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2011) : Sevastopol, Ukraine, September 9-12, 2011
2011
/
p. 13-16 : ill
https://ieeexplore.ieee.org/document/6116601
book article
27
book article
BASTION : board and SoC test instrumentation for ageing and no failure found
Jutman, Artur
;
Lotz, Christophe
;
Larsson, Erik
;
Sonza Reorda, Matteo
;
Jenihhin, Maksim
;
Raik, Jaan
Proceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland
2017
/
p. 115-120 : ill
https://doi.org/10.23919/DATE.2017.7926968
book article
28
journal article EST
/
journal article ENG
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Microprocessors and microsystems
2020
/
art. 103117, 12 p
https://doi.org/10.1016/j.micpro.2020.103117
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
29
book article
Can a HW development and research environment be convenient, scalable and free? zamiaCAD : open-source platform for hardware design and analysis : [invited talk]
Jenihhin, Maksim
Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 2012
2012
/
p. 548-549
book article
30
book article
Challenges of reliability assessment and enhancement in autonomous systems
Jenihhin, Maksim
;
Sonza Reorda, Matteo
;
Balakrishnan, Aneesh
;
Alexandrescu, Dan
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)
2019
/
6 p
https://doi.org/10.1109/DFT.2019.8875379
book article
Related publications
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
31
book article
Code coverage analysis for concurrent programming languages using high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
Proceedings of the 12th European Workshop on Dependable Computing : EWDC 2009 : Toulouse, France, May 14-15, 2009
2009
/
[4] p. : ill
https://hal.archives-ouvertes.fr/hal-00381559
book article
32
book article
Code coverage analysis using high-level decision diagrams [Electronic resource]
Raik, Jaan
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Ellervee, Peeter
2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008
2008
/
p. 201-207 : ill. [CD-ROM]
https://ieeexplore.ieee.org/document/4538786
book article
33
book article
Combining dynamic slicing and mutation operators for ESL correction
Repinski, Urmas
;
Hantson, Hanno
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France
2012
/
[6] p. : ill
https://ieeexplore.ieee.org/document/6233020
book article
34
book article
Composing graph theory and deep neural networks to evaluate SEU type soft error effects
Balakrishnan, Aneesh
;
Lange, Thomas
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Jenihhin, Maksim
9th Mediterranean Conference on Embedded Computing (MECO'2020), Budva, Montenegro, 8-11 June 2020
2020
https://doi.org/10.1109/MECO49872.2020.9134279
book article
Related publications
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
35
dissertation
Comprehensive abstraction of VHDL RTL cores to ESL SystemC = Register-siirde taseme VHDL kirjelduste kompleksne abstraheerimine süsteemitaseme SystemC mudeliteks
Abrar, Syed Saif
2016
http://www.ester.ee/record=b4564850*est
dissertation
36
book article
Constraint-based hierarchical untestability identification for synchronous sequential circuits
Raik, Jaan
;
Rannaste, Anna
;
Jenihhin, Maksim
;
Viilukas, Taavi
;
Ubar, Raimund-Johannes
;
Fujiwara, Hideo
Sixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim
2011
/
p. 147-152
book article
37
book article
Constraint-based hierarchical untestability identification for syncronous sequential circuits
Viilukas, Taavi
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Rannaste, Anna
;
Jenihhin, Maksim
;
Fujiwara, Hideo
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 139-142 : ill
book article
38
book article
Constraint-based test pattern generation at the register-transfer level
Viilukas, Taavi
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria
2010
/
p. 352-357 : ill
http://dx.doi.org/10.1109/DDECS.2010.5491752
book article
39
book article
Cost-effective fault tolerance for CNNs using parameter vulnerability based hardening and pruning
Ahmadilivani, Mohammad Hasan
;
Mousavi, Seyedhamidreza
;
Raik, Jaan
;
Daneshtalab, Masoud
;
Jenihhin, Maksim
2024 IEEE 30th International Symposium on On-line Testing and Robust System Design (IOLTS) : IOLTS 2024 : July 03rd-05th 2024, Rennes, Brittany, France
2024
/
7 p
https://doi.org/10.1109/IOLTS60994.2024.10616072
Article at Scopus
Article at WOS
book article
Related publications
1
Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
40
book
CREDES Summer School : Dependable Systems Design : handouts
2011
http://www.ester.ee/record=b2891192*est
book
41
book article
DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN accelerators
Taheri, Mahdi
;
Riazati, Mohamad
;
Ahmadilivani, Mohammad Hasan
;
Jenihhin, Maksim
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Sjödin, Mikael
;
Lisper, Björn
2023 24th International Symposium on Quality Electronic Design (ISQED)
2023
/
8 p. : ill
https://doi.org/10.1109/ISQED57927.2023.10129353
book article
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
42
book article
DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability Assessment
Ahmadilivani, Mohammad Hasan
;
Taheri, Mahdi
;
Raik, Jaan
;
Daneshtalab, Masoud
;
Jenihhin, Maksim
IEEE European Test Symposium (ETS) : Venice, Italy, 22-26 May 2023 : proceedings
2023
/
6 p. : ill
https://doi.org/10.1109/ETS56758.2023.10174133
book article
Related publications
2
Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
43
journal article
DeepVigor+: Scalable and Accurate Semi-Analytical Fault Resilience Analysis for Deep Neural Networks
Ahmadilivani, Mohammad Hasan
;
Raik, Jaan
;
Daneshtalab, Masoud
;
Jenihhin, Maksim
arXiv.org
2024
/
14 p. : ill
https://doi.org/10.48550/arXiv.2410.15742
journal article
Related publications
1
Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
44
book article
Dependability evaluation in fault-tolerant systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ellervee, Peeter
Computer Science Meets Automation : 10-13 September 2007 : proceedings. Volume II
2007
/
p. 147-152 : ill
https://www.db-thueringen.de/receive/dbt_mods_00008864
book article
45
book article
Design error diagnosis using backtrace algorithm on decision diagrams
Repinski, Urmas
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
p. 93-96
book article
46
book article EST
/
book article ENG
Designing reliable cyber-physical systems
Aleksandrowicz, Gadi
;
Arbel, Eli
;
Bloem, Roderick
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Jutman, Artur
;
Raik, Jaan
;
Shibin, Konstantin
Languages, design methods, and tools for electronic system design : selected contributions from FDL 2016
2018
/
p. 15-38 : ill
https://doi.org/10.1007/978-3-319-62920-9_2
Conference Proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
47
book article
Designing reliable cyber-physical systems : overview associated to the special session at FDL'16
Aleksandrowicz, Gadi
;
Arbel, Eli
;
Bloem, Roderick
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Jutman, Artur
;
Raik, Jaan
;
Shibin, Konstantin
The 2016 Forum on Specification & Design Languages : proceedings : Bremen, Germany, September 14-16, 2016
2016
/
[8] p. : ill
https://doi.org/10.1109/FDL.2016.7880382
book article
48
book article
A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Fieback, Moritz
;
Wu, Lizhou
;
Jenihhin, Maksim
;
Taouil, Mottaqiallah
;
Hamdioui, Said
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
2020
/
p. 792-797
https://doi.org/10.23919/DATE48585.2020.9116278
book article
49
book article
Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis
Hantson, Hanno
;
Repinski, Urmas
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
2012
/
[6 p.] : ill
https://ieeexplore.ieee.org/document/6261234
book article
50
book article
Diagnostic modeling of digital systems with multi-level decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Jenihhin, Maksim
Design and test technology for dependable systems-on-chip
2011
/
p. 92-118 : ill
https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams
book article
Number of records 195, displaying
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1.
Jenihhin, Maksim
2.
Andrijaškin, Maksim
3.
Antonov, Maksim
4.
Butsenko, Maksim
5.
Dolinin, Maksim
6.
Gorev, Maksim
7.
Kuleša, Maksim
8.
Maksim, I.
9.
Maksim, Tiit
10.
Mõttus, Maksim
11.
Ošeka, Maksim
12.
Radzvilovits, Maksim
13.
Ruchkin, Maksim
14.
Saat, Maksim
15.
Sitnikov, Maksim
16.
Säkki, Maksim
17.
Zelenski, Maksim
CV
9
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gazizov, Maksim 1918-?
5.
Oseka, Maksim
6.
Osheka, Maksim
7.
Ošeka, Maksim
8.
Saat, Maksim
9.
Säkki, Maksim
name of the person
7
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gorev, Maksim
5.
Gorki, Maksim, pseud., 1868-1936
6.
Ošeka, Maksim
7.
Saat, Maksim
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