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Jenihhin, Maksim (TalTech author)
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101
book article
Keynote: cost-efficient reliability for Edge-AI chips
Jenihhin, Maksim
;
Taheri, Mahdi
;
Cherezova, Natalia
;
Ahmadilivani, Mohammad Hasan
;
Selg, Hardi
;
Jutman, Artur
;
Shibin, Konstantin
;
Tsertov, Anton
;
Devadze, Sergei
;
Kodamanchili, Rama Mounika
;
Rafiq, Ahsan
;
Raik, Jaan
;
Daneshtalab, Masoud
2024 IEEE 25th Latin American Test Symposium (LATS)
2024
/
2 p
https://doi.org/10.1109/LATS62223.2024.10534610
Article at Scopus
book article
Related publications
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
102
book article
Layout to logic defect analysis for hierarchical test generation
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
;
Rakowski, Michal
Proceedings of the 2007 IEEE Workshop on Design and Diagnostic Circuits and Systems : April 11-13, 2007, Krakow, Poland
2007
/
p. 35-40 : ill
http://dx.doi.org/10.1109/DDECS.2007.4295251
book article
103
book article
Localization of bugs in processor designs using zamiaCAD framework
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Jenihhin, Maksim
;
Raik, Jaan
13th International Workshop on Microprocessor Test and Verification (MTV 2012) Common Challenges and Solutions : Austin, USA, December 10–12, 2012
2012
/
p. 1-6
https://ieeexplore.ieee.org/document/6519733
book article
104
book article
Measuring and identifying aging-critical paths in FPGAs
Pfeifer, Petr
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Pliva, Zdenek
MEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France
2015
/
p. 56-61 : ill
book article
105
book article
A methodology for automated mining of compact and accurate assertion sets
Heidari Iman, Mohammad Reza
;
Raik, Jaan
;
Jenihhin, Maksim
;
Jervan, Gert
;
Ghasempouri, Tara
2021 IEEE Nordic Circuits and Systems Conference (NorCAS) : Oslo, Norway, October 26-27
2021
/
7 p. : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9599865
https://doi.org/10.1109/NorCAS53631.2021.9599865
book article
106
dissertation
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
Taheri, Mahdi
2025
https://www.ester.ee/record=b5728368*est
https://digikogu.taltech.ee/et/Item/9cf79768-17bc-44ec-a828-e4ccf6cf93f1
https://doi.org/10.23658/taltech.4/2025
dissertation
Related publications
14
APPRAISER : DNN fault resilience analysis employing approximation errors
DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN accelerators
Special session : approximation and fault resiliency of DNN accelerators
A systematic literature review on hardware reliability assessment methods for deep neural networks
AdAM: adaptive fault-tolerant approximate multiplier for edge DNN accelerators
Special session: reliability assessment recipes for DNN accelerators
Keynote: cost-efficient reliability for Edge-AI chips
Enhancing fault resilience of QNNs by selective neuron splitting
DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability Assessment
Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators
FORTUNE: A Negative Memory Overhead Hardware-Agnostic Fault TOleRance TechniqUe in DNNs
Heterogeneous Approximation of DNN HW Accelerators based on Channels Vulnerability
107
dissertation
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
Bagbaba, Ahmet Cagri
2022
https://doi.org/10.23658/taltech.9/2022
https://digikogu.taltech.ee/et/Item/58b0b89d-b1ba-4a73-ba53-850910d697b5
https://www.ester.ee/record=b5491885*est
dissertation
Related publications
10
Accelerating transient fault injection campaigns by using Dynamic HDL Slicing
Efficient fault injection based on dynamic HDL slicing technique
Special session : AutoSoC - a suite of open-source automotive SoC benchmarks
Representing gate-level SET faults by multiple SEU faults on RT-level
Improving the confidence level in functional safety simulation tools for ISO 26262
Use of formal methods for verification and optimization of fault lists in the scope of ISO26262
Efficient methodology for ISO26262 functional safety verification
Combining fault analysis technologies for ISO26262 functional safety verification
Determined-safe faults identification : a step towards ISO26262 hardware compliant designs
Automated identification of application-dependent safe faults in automotive systems-on-a-chips
108
journal article
Mixed hierarchical-functional fault models for targeting sequential cores
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
;
Jenihhin, Maksim
Journal of systems architecture
2008
/
3/4, p. 465-477 : ill
https://www.sciencedirect.com/science/article/abs/pii/S1383762107001166
journal article
109
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
110
book article
ML-based online design error localization for RISC-V implementations
Selg, Hardi
;
Jenihhin, Maksim
;
Ellervee, Peeter
;
Raik, Jaan
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) : IOLTS 2023 : July 3rd-5th, 2023, Platanias, Chania (Crete), Greece : proceedings
2023
/
7 p.
https://doi.org/10.1109/IOLTS59296.2023.10224864
book article
111
book article
MLC: a machine learning based checker for soft error detection in embedded processors
Nosrati, Nooshin
;
Jenihhin, Maksim
;
Navabi, Zainalabedin
Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
2022
/
Code 183305
https://doi.org/10.1109/IOLTS56730.2022.9897309
Article at Scopus
Article at WOS
book article
112
book article
Modeling for multi-view interference analysis of design aspects in MPSoC designs
Vain, Jüri
;
Apneet Kaur
;
Tsiopoulos, Leonidas
;
Raik, Jaan
;
Jenihhin, Maksim
RESCUE 2017 : Workshop on Reliability, Security and Quality : ETS17 Fringe Workshop, May 25-26, 2017, Limassol, Cyprus
2017
/
p. 1-6
http://www.ets17.org.cy/workshop/rescue-workshop.html
book article
113
book article
Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors
Balakrishnan, Aneesh
;
Lange, Thomas
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Jenihhin, Maksim
2019 NASA/ESA conference on adaptive hardware and systems AHS 2019 : proceedings
2019
/
p. 72-78 : ill
https://doi.org/10.1109/AHS.2019.00007
book article
Related publications
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
114
book article
Modeling microprocessor faults on high-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Jenihhin, Maksim
;
Istenberg, Martin
;
Wuttke, Heinz-Dietrich
DSN 2008 : supplemental : 2008 IEEE International Conference on Dependable Systems & Networks With FTCS & DCC (DSN) : June 24-27, 2008, Anchorage, Alaska
2008
/
p. C17-C22 : ill. [CD-ROM]
https://webhost.laas.fr/TSF/WDSN08/2ndWDSN08(LAAS)_files/Slides/WDSN08S-04-Ubar.pdf
book article
115
book article
Modeling soft-error reliability under variability
Balakrishnan, Aneesh
;
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Hamdioui, Said
;
Jenihhin, Maksim
;
Alexandrescu, Dan
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021
2021
/
p. 1-6
https://doi.org/10.1109/DFT52944.2021.9568295
book article
Related publications
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
116
book article
Multi-view modeling for MPSoC design aspects [Online resource]
Vain, Jüri
;
Apneet Kaur
;
Tsiopoulos, Leonidas
;
Raik, Jaan
;
Jenihhin, Maksim
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600986
book article
117
book article
Mutation analysis for systemC designs at TLM
Guarnieri, Valerio
;
Bombieri, Nicola
;
Pravadelli, Graziano
;
Fummi, Franco
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 2011
2011
/
[6] p
https://ieeexplore.ieee.org/document/5985925
book article
118
book article
Mutation analysis with high-level decision diagrams
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
;
Guglielmo, Giuseppe di
;
Fummi, Franco
LATW2010 : 11th Latin-American TestWorkshop, March 28-31, 2010, Punta del Este, Uruguay
2010
/
[6] p. [CD-ROM]
https://ieeexplore.ieee.org/document/5550336
book article
119
book article
Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensors
Ubar, Raimund-Johannes
;
Vargas, Fabian
;
Jenihhin, Maksim
;
Raik, Jaan
MEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 2013
2013
/
[1] p
book article
120
book article
New categories of Safe Faults in a processor-based Embedded System
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
;
Oyeniran, Adeboye Stephen
;
Piumatti, Davide
;
Raik, Jaan
;
Sonza Reorda, Matteo
;
Ubar, Raimund-Johannes
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
2019
/
4 p. : ill
https://doi.org/10.1109/DDECS.2019.8724642
book article
121
book article
A novel fault-tolerant logic style with self-checking capability
Taheri, Mahdi
;
Sheikhpour, Saeideh
;
Mahani, Ali
;
Jenihhin, Maksim
Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
2022
/
art. 183305 : ill
https://doi.org/10.1109/IOLTS56730.2022.9897818
book article
122
book article
On antagonism between side-channel security and soft-error reliability in BNN inference engines
Lai, Xinhui
;
Lange, Thomas
;
Balakrishnan, Aneesh
;
Alexandrescu, Dan
;
Jenihhin, Maksim
IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)
2021
/
p. 1-6
https://doi.org/10.1109/VLSI-SoC53125.2021.9606981
book article
Related publications
1
Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid
123
book article
On BTI aging rejuvenation in memory address decoders
Gürsoy, Cemil Cem
;
Kraak, Daniel
;
Ahmed, Foisal
;
Taouil, Mottaqiallah
;
Jenihhin, Maksim
;
Hamdioui, Said
2022 IEEE 23rd Latin American Test Symposium, LATS 2022
2022
/
Code 184360
https://doi.org/10.1109/LATS57337.2022.9936940
book article
124
book article
On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Squillero, Giovanni
;
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 335-340 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920313
book article
125
book article
On reusability of verification assertions for testing
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Tšepurov, Anton
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 151-154 : ill
book article
Number of records 195, displaying
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1.
Jenihhin, Maksim
2.
Andrijaškin, Maksim
3.
Antonov, Maksim
4.
Butsenko, Maksim
5.
Dolinin, Maksim
6.
Gorev, Maksim
7.
Kuleša, Maksim
8.
Maksim, I.
9.
Maksim, Tiit
10.
Mõttus, Maksim
11.
Ošeka, Maksim
12.
Radzvilovits, Maksim
13.
Ruchkin, Maksim
14.
Saat, Maksim
15.
Sitnikov, Maksim
16.
Säkki, Maksim
17.
Zelenski, Maksim
CV
9
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gazizov, Maksim 1918-?
5.
Oseka, Maksim
6.
Osheka, Maksim
7.
Ošeka, Maksim
8.
Saat, Maksim
9.
Säkki, Maksim
name of the person
7
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gorev, Maksim
5.
Gorki, Maksim, pseud., 1868-1936
6.
Ošeka, Maksim
7.
Saat, Maksim
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