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book article

High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

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52

book article

High-level decision diagrams for improving simulation performance of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Morawiec, AdamSCI 2000 : World Multiconference on Systemics, Cybernetics and Informatics : July 23-26, 2000, Orlando, Florida, USA : proceedings. Volume IX, Industrial Systems2000 / p. 62-67 : ill https://hal.science/hal-01396447v1

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53

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High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

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54

book article

How to generate high quality tests for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, Jaan2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 22004 / p. 459-462 : ill http://dx.doi.org/10.1109/SMICND.2004.1403048

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55

book article

Intelligent decision making approach for performance evaluation of a robot-based manufacturing cellKangru, Tavo; Riives, Jüri; Otto, Tauno; Pohlak, Meelis; Mahmood, KashifASME 2018 International Mechanical Engineering Congress and Exposition : Pittsburgh, Pennsylvania, USA, November 9–15, 20182018 / Paper No. IMECE2018-86666, pp. V002T02A092; 10 p. : ill http://doi.org/10.1115/IMECE2018-86666

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56

journal article

Mixed hierarchical-functional fault models for targeting sequential coresRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi; Jenihhin, MaksimJournal of systems architecture2008 / 3/4, p. 465-477 : ill https://www.sciencedirect.com/science/article/abs/pii/S1383762107001166

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57

book article

Modeling microprocessor faults on high-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, Maksim; Istenberg, Martin; Wuttke, Heinz-DietrichDSN 2008 : supplemental : 2008 IEEE International Conference on Dependable Systems & Networks With FTCS & DCC (DSN) : June 24-27, 2008, Anchorage, Alaska2008 / p. C17-C22 : ill. [CD-ROM] https://webhost.laas.fr/TSF/WDSN08/2ndWDSN08(LAAS)_files/Slides/WDSN08S-04-Ubar.pdf

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58

book article

Multi-level fault simulation of digital systems on decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaThe First IEEE International Workshop on Electronic Design, Test and Applications : DELTA 2002, 29-31 January 2002, Christchurch, New Zealand : proceedings2002 / p. 86-91 : ill

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59

book article

Multiple fault testing in systems-on-chip with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen; Schölzel, Mario; Vierhaus, Heinrich TheodorProceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 20152015 / p. 66-71 : ill http://dx.doi.org/10.1109/IDT.2015.7396738

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60

book article

Multi-valued simulation of digital circuits with structurally synthesized binary decision diagramsUbar, Raimund-JohannesMultiple valued logic. Vol. 41998 / p. 141-157

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61

book article

Multi-valued simulation with binary decision diagramsUbar, Raimund-Johannes; Raik, JaanProceedings IEEE European Test Workshop, Cagliari, Italy, May 28-30, 19971997 / p. 28-29

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62

book article

Mutation analysis with high-level decision diagramsHantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Tšepurov, Anton; Ubar, Raimund-Johannes; Guglielmo, Giuseppe di; Fummi, FrancoLATW2010 : 11th Latin-American TestWorkshop, March 28-31, 2010, Punta del Este, Uruguay2010 / [6] p. [CD-ROM] https://ieeexplore.ieee.org/document/5550336

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63

book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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64

book article

New method of testability calculation to guide RT-level test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-Johannes4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 20032003 / p. 46-51 : ill https://link.springer.com/article/10.1007/s10836-005-5288-5

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65

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On automatic software-based self-test program generation based on high-Level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 177 http://dx.doi.org/10.1109/LATW.2016.7483357

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66

book article

On SSBDD model size & complexityJutman, ArturECS'03 : proceedings of the 4th Electronic Circuits and Systems Conference : September 11-12, 2003, Bratislava, Slovakia2003 / p. 17-22 https://pld.ttu.ee/~artur/papers/SSBDD_Model_Size-ECS03.pdf

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67

book article

Optimization of structurally synthesized BDDsUbar, Raimund-Johannes; Vassiljeva, T.; Raik, Jaan; Jutman, Artur; Tombak, Mati; Peder, AhtiProceedings of the Fourth IASTED International Conference on Modelling, Simulation, and Optimization : August 17-19, 2004, Kavai, Hawaii, USA2004 / p. 234-240 : ill https://www.academia.edu/22101496/Optimization_of_structurally_synthesized_BDDs

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68

journal article

Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 303-324 : ill http://dx.doi.org/10.2298/FUEE1103303U

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69

book article

Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesProceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland2011 / p. 1-10 : ill https://scindeks-clanci.ceon.rs/data/pdf/0353-3670/2011/0353-36701103303U.pdf

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70

book article

Parallel fault analysis on structurally synthesized BDDsDevadze, Sergei; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 47-50 : ill

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71

book article

Probabilistic equivalence checking based on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 423-428 : ill https://ieeexplore.ieee.org/document/5783130

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72

journal article

PSL assertion checking using temporally extended high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2009 / 6, p. 289-300 : ill https://pld.ttu.ee/home/maksim/phd_papers/%5B11%5D%20latw%2708.pdf

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73

book article

PSL assertion checking with temporally extended high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 49-54 : ill https://pld.ttu.ee/~maksim/phd_papers/%5B11%5D%20latw%2708.pdf

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74

book article

PSL assertions based verification with HLDD toolsJenihhin, MaksimInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 17-20 : ill

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75

journal article EST / journal article ENG

Ranking strategic objectives in a strategy map based on logarithmic fuzzy preference programming and similarity methodSafari, Hossein; Khanmohammadi, Ehsan; Maleki, Meysam; Cruz-Machado, Virgilio; Ševtšenko, EduardManagement Systems in Production Engineering2019 / p. 153-161 : ill https://doi.org/10.1515/mspe-2019-0025 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

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