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51
book article
Discrete gravitational search algorithm for solving finite state machine inference problem
Spitšakova, Margarita
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 63-66 : ill
book article
52
newspaper article
Droonide lihtsus ja odavus võimaldab neid sõjas massiliselt kasutada [Võrguväljaanne]
Klementi, Joakim
err.ee
2022
Droonide lihtsus ja odavus võimaldab neid sõjas massiliselt kasutada
newspaper article
53
newspaper article
Eesti teadlased loodavad panna putukrobotile pähe tehisaru
Raik, Jaan
novaator.err.ee
2024
Eesti teadlased loodavad panna putukrobotile pähe tehisaru
Эстонские ученые создают робота-насекомого с искусственным интеллектом
newspaper article
54
book article
Eesti teaduse nähtamatud hiiglased
Raik, Jaan
Teadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]
2019
/
lk. 161-168 : ill., fot
https://www.ester.ee/record=b5208765*est
book article
55
journal article EST
/
journal article ENG
Elliptic-curve crypto processor for RFID applications
Rashid, Muhammad
;
Jamal, Sajjad Shaukat
;
Khan, Sikandar Zulqarnain
;
Alharbi, Adel R.
;
Aljaedi, Amer
;
Imran, Malik
Applied Sciences (Switzerland)
2021
/
art. 7079
https://doi.org/10.3390/app11157079
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
56
book article
Equivalent transformations of structurally synthesized BDDs and applications
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Viies, Vladimir
2019 8th Mediterranean Conference on Embedded Computing (MECO)
2019
/
6 p. : ill
https://doi.org/10.1109/MECO.2019.8760283
book article
57
journal article
Error sources in analog ASICs and ways for their minimization
Mihhailov, Juri
International journal of engineering and applied sciences (EAAS)
2013
/
p. 32-41 : ill
journal article
58
journal article
Esimene üldkasutatav mikrokontrollerkiip TMS 1000
Toomsalu, Arvo
A & A
2008
/
2, lk. 9-16 : ill
journal article
59
book
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
Cantarella, JD
2005
https://www.ester.ee/record=b2300865*est
book
60
journal article EST
/
journal article ENG
Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuits
Pagliarini, Samuel Nascimento
;
Benites, Luis
;
Martins, Mayler
;
Rech, Paolo
;
Kastensmidt, Fernanda
IEEE transactions on nuclear science
2021
/
p. 1045-1053
https://doi.org/10.1109/TNS.2021.3070643
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
61
book article
Fast test cost calculation for hybrid BIST in digital systems
Orasson, Elmet
;
Raidma, Rein
;
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Peng, Zebo
Euromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings
2001
/
p. 318-325 : ill
https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f
book article
62
book article
Fault collapsing with linear complexity in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France
2010
/
p. 653-656 : ill
https://ieeexplore.ieee.org/document/5537504
book article
63
book article
Fault diagnosis in integrated circuits with BIST
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
;
Evartson, Teet
;
Lensen, Harri
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 604-610 : ill
http://dx.doi.org/10.1109/DSD.2007.4341530
book article
64
journal article
Fault diagnosis in VLSI devices
Ubar, Raimund-Johannes
Proceedings of the Estonian Academy of Sciences. Engineering
1995
/
1, p. 51-67
journal article
65
journal article
Fault effect reasoning in digital systems by topological view on low- and high-level decision diagrams
Ubar, Raimund-Johannes
Вестник Томского государственного университета. Управление, вычислительная техника и информатика
2014
/
p. 99-113 : ill
http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107
journal article
66
book article
Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDs
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings
2006
/
p. 97-102 : ill
book article
67
book article
Faults and fault models for integrated circuits and systems [Electronic resource] : [slides]
Ubar, Raimund-Johannes
Design and Test Technology for Dependable Hardware/Software Systems : DEDIS/DAAD Summer Academy : BTU Cottbus, Sept. 1st-12th, 2008
2008
/
[64] p. : ill. [CD-ROM]
book article
68
book article
Finite state machines with datapath partitioning for low power synthesis
Sudnitsõn, Aleksander
Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000
2001
/
p. 163-168 : ill
book article
69
book article
Foreword to the 12th IEEE DDECS Symposium
Pliva, Zdenek
;
Manhaeve, Hans
;
Renovell, Michel
;
Novak, Ondrej
;
Ubar, Raimund-Johannes
;
Drabkova, Jindra
Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 15-17, 2009, Liberec, Czech Republic
2009
/
p. iii
http://dx.doi.org/10.1109/DDECS.2009.5012081
book article
70
journal article
From virtual characterization to test-chips : DFM analysis through pattern enumeration
Martins, Mayler G.A.
;
Pagliarini, Samuel Nascimento
;
Isgenc, Mehmet Meric
;
Pileggi, Larry
IEEE transactions on computer-aided design of integrated circuits and systems
2020
/
p. 520-532
https://doi.org//10.1109/TCAD.2018.2889772
journal article
71
book article
Gate-level modelling of NBTI-induced delays under process variations
Copetti, Thiago
;
Cardoso Medeiros, Guilherme
;
Bolzani Poehls, Leticia
;
Vargas, Fabian
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 75-80 : ill
http://dx.doi.org/10.1109/LATW.2016.7483343
book article
72
dissertation
Hardware realization of lattice-based post-quantum cryptography = Võrel põhinev post-kvant-krüptograafia riistvaraline realisatsioon
Imran, Malik
2023
https://www.ester.ee/record=b5571216*est
https://doi.org/10.23658/taltech.33/2023
https://digikogu.taltech.ee/et/Item/75aeb070-cb8b-4511-beaf-cbea3fca147d
https://www.ester.ee/record=b5571216*est
dissertation
Seotud publikatsioonid
6
An experimental study of building blocks of lattice-based NIST post-quantum cryptographic algorithms
An open-source library of large integer polynomial multipliers
Design space exploration of SABER in 65nm ASIC
High-speed SABER key encapsulation mechanism in 65nm CMOS
A versatile and flexible multiplier generator for Large integer polynomials
High-speed design of postquantum cryptography with optimized hashing and multiplication
73
book
Hardware/software co-design for programmable systems-on-chip
Sklyarov, Valery
;
Skliarova, Iouliia
;
Silva, João
;
Rjabov, Artjom
;
Sudnitsõn, Aleksander
;
Cardoso, Cláudia
2014
http://www.ester.ee/record=b3087107*est
book
74
book article
High-level decision diagram based fault models for targeting FSMs
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 353-358 : ill
http://dx.doi.org/10.1109/DSD.2006.60
book article
75
book article
High-Level Decision Diagram manipulations for code coverage analysis
Minakova, Karina
;
Reinsalu, Uljana
;
Tšepurov, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 207-210 : ill
book article
Number of records 208, displaying
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