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FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedancePriidel, Eiko; Pesti, Ksenija; Min, Mart; Ojarand, Jaan; Märtens, Olev2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings2021 / 5 p. : ill https://doi.org/10.1109/I2MTC50364.2021.9460073

book article
Related publications 1
- Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
2

journal article EST / journal article ENG

Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Related publications 1
- Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina

Number of records 2, displaying 1 - 2

1. semiconductor device measurement
2. power semiconductor device
3. semiconductor device failure
4. semiconductor device manufacture
5. semiconductor device modeling
6. Semiconductor device packaging
7. semiconductor device reliability
8. device-to-device (D2D)
9. device-to-device (D2D) communication
10. device-to-device communication
11. cardiac device therapy
12. cooling device performance
13. Counter Improvised Explosive Device (C-IED)
14. device
15. device capacity
16. device characterisation
17. Device characterization
18. device modeling
19. device therapy
20. Discrete power device
21. energy saving device (ESD)
22. energy storage device
23. implantable medical device
24. Improvised Explosive Device (IED)
25. low-power device
26. massive device connectivity
27. medical device
28. metal semiconductor contacts
29. metal-oxide-semiconductor field-effect transistors (MOSFETs)
30. microfluidic device
31. motion-reduction device
32. on-device transfer learning
33. plasma-focus device
34. power semiconductor devices
35. power semiconductor switches
36. projected device density of states (PDDOS)
37. p-type transparent semiconductor
38. Real device
39. robotic device
40. semiconductor
41. semiconductor band bending
42. semiconductor crystals
43. semiconductor devices
44. semiconductor diodes
45. semiconductor doping
46. semiconductor heterojunctions
47. semiconductor technology
48. Semiconductor/electrolyte contact
49. semiconductor-metal transition
50. storage device
51. Superconducting device noise
52. Wearable device
53. wide band gap semiconductor devices
54. advanced measurement infrastructure
55. angle measurement
56. atmospheric measurement uncertainty
57. bioimpedance measurement
58. blood pressure measurement
59. blood sugar measurement
60. business school learning rate measurement instrument
61. characteristics of phasor measurement units
62. concentration measurement
63. Contactless conductivity measurement
64. continuous measurement
65. corrosion measurement
66. current measurement
67. differential measurement
68. distribution-level phasor measurement units (D-PMUs)
69. driving dynamics measurement
70. DTS measurement
71. dynamic measurement feedback
72. effect measurement
73. efficiency measurement
74. electric impedance measurement
75. electrical resistance measurement
76. electron density measurement
77. electronic measurement
78. employees' performance measurement
79. Energy efficiency measurement
80. experimental measurement
81. filter transmission measurement
82. flow measurement
83. force measurement
84. four-electrode impedance measurement
85. frequency measurement
86. harmonic measurement
87. high speed measurement
88. hygrothermal measurement and modelling
89. impedance measurement
90. impedance spectrum measurement
91. Inerial Measurement Unit (IMU)
92. inertial measurement unit
93. inertial measurement unit (IMU)
94. input/output current measurement
95. light measurement
96. lock-in measurement
97. loss measurement
98. losses measurement
99. magnetic measurement
100. maximum permissible error (deviation) of measurement result
101. measurement
102. measurement accuracy
103. measurement and testing
104. measurement by CCD cameras
105. measurement campaign
106. measurement coil
107. measurement error in household surveys
108. Measurement errors
109. measurement feedback
110. measurement gaps
111. measurement model
112. measurement standards
113. measurement uncertainty
114. measurement units
115. micro characterization and surface roughness measurement
116. mooring measurement
117. network measurement
118. non-contact optical measurement
119. non-invasive measurement
120. optical variables measurement
121. organizational learning measurement instruments
122. organizational learning rate measurement
123. partial discharge measurement
124. passive measurement
125. perfomance measurement
126. performance measurement
127. performance measurement system
128. phasor measurement
129. phasor measurement unit
130. Phasor measurement unit (PMU)
131. phasor measurement units
132. pollution measurement
133. position measurement
134. power measurement
135. power quality measurement
136. power quality measurement equipment
137. quality performance measurement
138. radiated EMI measurement
139. real-time measurement
140. road condition measurement
141. road performance measurement
142. single far-field measurement
143. single measurement
144. single-molecule measurement
145. Spectrophotometric measurement
146. static measurement feedback
147. synchronous measurement
148. temperature measurement
149. testing of phasor measurement units
150. Time measurement
151. torque measurement
152. tracer-gas measurement
153. tyre velocity measurement
154. wave height measurement
155. wave measurement
156. wear measurement
157. vibration measurement
158. voltage measurement

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