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journal article EST
/
journal article ENG
Automated identification of application-dependent safe faults in automotive systems-on-a-chips
Bagbaba, Ahmet Cagri
;
Augusto da Silva, Felipe
;
Sonza Reorda, Matteo
;
Hamdioui, Said
;
Jenihhin, Maksim
;
Sauer, Christian
Electronics
2022
/
art. 319
https://doi.org/10.3390/electronics11030319
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journal article EST
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journal article ENG
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
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keyword
25
1.
diagnostic coverage
2.
code coverage
3.
code-coverage
4.
conceptual coverage
5.
coverage
6.
coverage factor
7.
fault coverage
8.
gaps in coverage
9.
high-level fault coverage
10.
insurance coverage
11.
NB-IoT coverage
12.
Security Coverage
13.
stress coverage
14.
test coverage
15.
5G coverage
16.
diagnostic data
17.
diagnostic resolution
18.
diagnostic test
19.
diagnostic tools
20.
diagnostic traces
21.
fault diagnostic
22.
fault diagnostic resolution
23.
In vitro diagnostic medical devices
24.
random diagnostic tests
25.
rapid diagnostic tests
subject term
1
1.
Laser Diagnostic Instruments
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