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journal article

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanJournal of electronic testing : theory and applications2020 / p. 87-103 https://doi.org/10.1007/s10836-020-05856-7

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book article

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

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book article

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

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book article EST / book article ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

Number of records 4, displaying 1 - 4

1. high-level fault coverage
2. high-level control fault model
3. high-level fault model
4. high-level fault simulation
5. high-level functional fault model
6. fault coverage
7. logic level and high level BDDs
8. low-level fault redundancy
9. high level DD (HLDD)
10. high level synthesis
11. high-level control faults
12. high-level decision diagram
13. high-level decision diagrams
14. high-level decision diagrams (HLDD) synthesis
15. high-level expert group on AI
16. high-level synthesis
17. High-Level Synthesis (HLS)
18. high-level synthesis for test
19. high-level test data generation
20. High-Pressure High-Temperature Spark Plasma Sintering
21. code coverage
22. code-coverage
23. conceptual coverage
24. coverage
25. coverage factor
26. diagnostic coverage
27. gaps in coverage
28. insurance coverage
29. NB-IoT coverage
30. Security Coverage
31. stress coverage
32. test coverage
33. 5G coverage
34. asynchronous fault detection
35. automatic fault diagnosis
36. bearing fault diagnosis
37. bi-directional fault monitoring devices
38. conditional fault collapsing
39. control fault models
40. critical path fault tracing
41. cross-layer fault tolerance
42. cross-layered fault management
43. extended fault class
44. fault currents
45. fault analysis
46. fault analysis model
47. fault classification
48. fault classification
49. fault collapsing
50. fault compensation
51. fault current and voltage measurements
52. Fault current limite
53. fault current limiter
54. fault detection
55. fault detection and diagnoses
56. fault detection and diagnosis
57. fault diagnosis
58. fault diagnostic
59. fault diagnostic resolution
60. fault diagnostics
61. fault dignosis
62. fault effects
63. fault emulation
64. fault equivalence and dominance
65. fault handling
66. fault handling strategy
67. fault indicator
68. fault injection
69. Fault Injection Simulation
70. fault Interruption
71. fault localization
72. fault location
73. fault management
74. fault masking
75. fault modeling
76. fault models
77. fault monitoring
78. fault prediction
79. fault protection
80. fault redundancy
81. fault resilience
82. fault ride through
83. Fault ride through enhancement
84. fault signal
85. fault simulastion
86. fault simulation
87. fault simulation with critical path tracing
88. fault tolerance
89. fault tolerant
90. fault tolerant control
91. fault tolerant operation
92. fault tolerant router design
93. fault tolerant systems
94. Fault Tree Analysis
95. fault-injection attack
96. fault-plane solution
97. fault-resilience
98. fault-resistant
99. fault-ride-through (FRT)
100. fault-tolerance
101. fault-tolerant
102. Fault-tolerant (FT) converters
103. fault-tolerant control
104. fault-tolerant converter
105. functional fault model
106. Katun fault
107. no fault found
108. No-Fault-Found
109. open circuit fault
110. parallel fault-simulation
111. short circuit fault
112. spectrum-based fault localization
113. stuck-at fault model
114. test generation and fault diagnosis
115. transient fault mitigation
116. transmission lines fault

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