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journal article

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanJournal of electronic testing : theory and applications2020 / p. 87-103 https://doi.org/10.1007/s10836-020-05856-7

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book article

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

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book article

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

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book article EST / book article ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

Number of records 4, displaying 1 - 4

1. high-level fault coverage
2. high-level control fault model
3. high-level fault model
4. high-level fault simulation
5. high-level functional fault model
6. fault coverage
7. logic level and high level BDDs
8. low-level fault redundancy
9. high level DD (HLDD)
10. high level of security
11. high level synthesis
12. high-level control faults
13. high-level decision diagram
14. high-level decision diagrams
15. high-level decision diagrams (HLDD) synthesis
16. High-level Decision Diagrams for Modeling Digital Systems
17. high-level expert group on AI
18. high-level synthesis
19. High-Level Synthesis (HLS)
20. high-level synthesis for test
21. high-level test data generation
22. High-Pressure High-Temperature Spark Plasma Sintering
23. code coverage
24. code-coverage
25. conceptual coverage
26. coverage
27. coverage factor
28. diagnostic coverage
29. gaps in coverage
30. insurance coverage
31. NB-IoT coverage
32. Security Coverage
33. stress coverage
34. test coverage
35. 5G coverage
36. AI-based fault detection
37. asynchronous fault detection
38. automatic fault diagnosis
39. bearing fault diagnosis
40. bi-directional fault monitoring devices
41. conditional fault collapsing
42. control fault models
43. critical path fault tracing
44. cross-layer fault tolerance
45. cross-layered fault management
46. extended fault class
47. fault currents
48. fault analysis
49. fault analysis model
50. fault classification
51. fault classification
52. fault collapsing
53. fault compensation
54. fault current and voltage measurements
55. Fault current limite
56. fault current limiter
57. fault detection
58. fault detection and classification
59. fault detection and diagnoses
60. fault detection and diagnosis
61. fault detection and diagnostics (FDD)
62. fault diagnosis
63. fault diagnostic
64. fault diagnostic resolution
65. fault diagnostics
66. fault dignosis
67. fault effects
68. fault emulation
69. fault equivalence and dominance
70. fault handling
71. fault handling strategy
72. fault indicator
73. fault injection
74. Fault Injection Simulation
75. fault Interruption
76. fault localization
77. fault location
78. fault management
79. fault masking
80. fault modeling
81. fault models
82. fault monitoring
83. fault prediction
84. fault protection
85. fault redundancy
86. fault resilience
87. fault ride through
88. Fault ride through enhancement
89. fault signal
90. fault simulastion
91. fault simulation
92. fault simulation with critical path tracing
93. fault tolerance
94. fault tolerant
95. fault tolerant control
96. fault tolerant operation
97. fault tolerant router design
98. fault tolerant systems
99. fault tree analysis
100. fault-injection attack
101. fault-plane solution
102. fault-resilience
103. fault-resistant
104. fault-ride-through (FRT)
105. fault-tolerance
106. fault-tolerant
107. Fault-tolerant (FT) converters
108. fault-tolerant control
109. fault-tolerant converter
110. functional fault model
111. hybrid fault detection
112. Katun fault
113. no fault found
114. No-Fault-Found
115. open circuit fault
116. Parallel Fault Simulation with Critical Path Backtracing
117. parallel fault-simulation
118. photovoltaic fault detection algorithms
119. PV fault classification
120. short circuit fault
121. spectrum-based fault localization
122. stacking fault
123. stuck-at fault model
124. test generation and fault diagnosis
125. transient fault mitigation
126. transmission lines fault

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