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Kostin, Sergei (author)

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26

journal article EST / journal article ENG

Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuitsJenihhin, Maksim; Squillero, Giovanni; Tihhomirov, Valentin; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2016 / p. 273-289 : ill https://doi.org/10.1007/s10836-016-5589-x Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
27

book article

Identifying NBTI-critical paths in nanoscale logicUbar, Raimund-Johannes; Vargas, Fabian; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei; Bolzani Poehls, Leticia16th Euromicro Conference series on Digital System Design : DSD 2013 : proceedings : 4-6 September 2013, Santander, Spain2013 / p. 136-141 : ill

book article
28

book article

Investigations of the diagnosibility of digital networks with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil2009 / [6] p. : ill

book article
29

book article

Macro level defect-oriented diagnosability of digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 149-152 : ill

book article
30

book article

Macro level defect-oriented diagnosability of digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 53-56 : ill

book article
31

book article

Multiple fault diagnosis with BDD based Boolean differential equationsUbar, Raimund-Johannes; Raik, Jaan; Kostin, Sergei; Kõusaar, JaakBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 77-80 : ill

book article
32

book article

Multiple stuck-at-fault detection theoremUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 / p. 236-241 : ill

book article
33

book article

A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915

book article
34

book article

On-line monitoring of dialysis adequacy using diasens optical sensor: accurate Kt/V estimation by smoothing algorithmsTalisainen, Aleksei; Kostin, Sergei; Karai, Deniss; Fridolin, Ivo; Ubar, Raimund-JohannesBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 273-276 : ill

book article
35

book article

Parallel critical path tracing fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanProceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 20182018 / p. 305-310 : ill https://doi.org/10.23919/MIXDES.2018.8436880

book article
36

book article EST / book article ENG

PrefaceHollstein, Thomas; Raik, Jaan; Kostin, Sergei; Tšertov, Anton; O’Connor, Ian; Reis, RicardoVLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability, 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016 : Revised Selected Papers2017 / p. V-VI https://link.springer.com/book/10.1007/978-3-319-67104-8 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG
37

book article

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

book article
38

book article

A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

book article
39

dissertation

Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemidKostin, Sergei2012 https://www.ester.ee/record=b2757857*est

dissertation
40

book article

SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 223-228 : ill

book article
41

book article

SSBDDs and double topology for multiple fault reasoningUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 20122012 / p. 23-28

book article
42

book article

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

book article
43

book article

Teaching research in the laboratory using diagnosis environment for digital systemsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Aarna, Margit; Brik, Marina; Wuttke, Heinz-Dietrich2009 EAEEIE annual conference : 20th Annual Conference of the European Association for Education in Electrical and Information Engineering : Valencia, Spain, June 22-24, 20092009 / p. 280-283 https://ieeexplore.ieee.org/document/5335462

book article
44

book article

A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 79-82 : ill http://www.ester.ee/record=b2150914*est

book article
45

book article

A tool for teaching hierarchical fault diagnosis in digital circuitsUbar, Raimund-Johannes; Kostin, Sergei; Orasson, Elmet; Evartson, Teet; Brik, MarinaProceedings of 9th European Workshop on Microelectronics Education – EWME’12 : Grenoble, France, May 9-11, 20122012 / p. 1-4

book article
46

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 46, displaying 26 - 46

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1. Kostin, Sergei
2. Anikin, Sergei
3. Astapov, Sergei
4. Bereznev, Sergei
5. Bogatenkov, Sergei
6. Jermolajev, Sergei
7. Kaganski, Sergei, 1987-
8. Letunovitš, Sergei
9. Nazarenko, Sergei
10. Pavlov, Sergei
11. Preis, Sergei, 1959-
12. Sabanov, Sergei, 1974-
13. Soldatov, Sergei, 1933-2003
14. Žari, Sergei
15. Žigailov, Sergei

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