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Kostin, Sergei (TTÜ author)
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26
book article
Hierarchical timing-critical paths analysis in sequential circuits
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
;
Devadze, Sergei
;
Kostin, Sergei
2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain
2018
/
6 p. : ill
https://doi.org/10.1109/PATMOS.2018.8464176
book article
27
book article
How to prove that a circuit is fault-free?
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey
2012
/
p. 427-430 : ill
https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free
book article
28
journal article
Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits
Jenihhin, Maksim
;
Squillero, Giovanni
;
Tihhomirov, Valentin
;
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 273-289 : ill
http://dx.doi.org/10.1007/s10836-016-5589-x
journal article
29
book article
Identifying NBTI-critical paths in nanoscale logic
Ubar, Raimund-Johannes
;
Vargas, Fabian
;
Jenihhin, Maksim
;
Raik, Jaan
;
Kostin, Sergei
;
Bolzani Poehls, Leticia
16th Euromicro Conference series on Digital System Design : DSD 2013 : proceedings : 4-6 September 2013, Santander, Spain
2013
/
p. 136-141 : ill
book article
30
book article
Investigations of the diagnosibility of digital networks with BIST
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil
2009
/
[6] p. : ill
book article
31
book article
Macro level defect-oriented diagnosability of digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 149-152 : ill
book article
32
book article
Macro level defect-oriented diagnosability of digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
lk. 53-56 : ill
book article
33
book article
Multiple fault diagnosis with BDD based Boolean differential equations
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Kostin, Sergei
;
Kõusaar, Jaak
BEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia
2012
/
p. 77-80 : ill
book article
34
book article
Multiple stuck-at-fault detection theorem
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
/
p. 236-241 : ill
book article
35
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
36
book article
On-line monitoring of dialysis adequacy using diasens optical sensor: accurate Kt/V estimation by smoothing algorithms
Talisainen, Aleksei
;
Kostin, Sergei
;
Karai, Deniss
;
Fridolin, Ivo
;
Ubar, Raimund-Johannes
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 273-276 : ill
book article
37
book article
Parallel critical path tracing fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
Proceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 2018
2018
/
p. 305-310 : ill
https://doi.org/10.23919/MIXDES.2018.8436880
book article
38
book article
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG
Palermo, N.
;
Tihhomirov, Valentin
;
Copetti, Thiago
;
Jenihhin, Maksim
;
Raik, Jaan
;
Kostin, Sergei
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
2015
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2015.7102405
book article
39
dissertation
Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemid
Kostin, Sergei
2012
https://www.ester.ee/record=b2757857*est
dissertation
40
book article
SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 223-228 : ill
book article
41
book article
SSBDDs and double topology for multiple fault reasoning
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 2012
2012
/
p. 23-28
book article
42
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
43
book article
Teaching research in the laboratory using diagnosis environment for digital systems
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Aarna, Margit
;
Brik, Marina
;
Wuttke, Heinz-Dietrich
2009 EAEEIE annual conference : 20th Annual Conference of the European Association for Education in Electrical and Information Engineering : Valencia, Spain, June 22-24, 2009
2009
/
p. 280-283
https://ieeexplore.ieee.org/document/5335462
book article
44
book article
A tool for teaching hierarchical fault diagnosis in digital circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Orasson, Elmet
;
Evartson, Teet
;
Brik, Marina
Proceedings of 9th European Workshop on Microelectronics Education – EWME’12 : Grenoble, France, May 9-11, 2012
2012
/
p. 1-4
book article
45
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 45, displaying
26 - 45
previous
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author
79
1.
Kostin, Sergei
2.
Astapov, Sergei
3.
Avanessov, Sergei
4.
Balõbin, Sergei
5.
Bereznev, Sergei
6.
Bogatenkov, Sergei
7.
Bogovski, Sergei
8.
Bonomanko, Sergei
9.
Buatšidze, Sergei
10.
Demidov, Sergei
11.
Devadze, Sergei
12.
Dokelin, Sergei
13.
Dolgov, Sergei
14.
Dolin, Sergei
15.
Falko, Sergei
16.
Jakovlev, Sergei
17.
Jegorov, Sergei
18.
Jekimov, Sergei
19.
Jurkin, Sergei
20.
Kaganski, Sergei
21.
Khakalo, Sergei
22.
Kholodkevich, Sergei
23.
Kiparissov, Sergei
24.
Konstantinov, Sergei
25.
Kopanchuk, Sergei
26.
Kopantšuk, Sergei
27.
Kornilov, Sergei
28.
Kramarenko, Sergei
29.
Kulikov, Sergei
30.
Letunovitš, Sergei
31.
Linevitš, Sergei
32.
Lugovski, Sergei
33.
Lukaševitš, Sergei
34.
Melentjev, Sergei
35.
Metlev, Sergei
36.
Mihhailov, Sergei
37.
Missenjov, Sergei
38.
Nazarenko, Sergei
39.
Odintsov, Sergei
40.
Ovsjanski, Sergei
41.
Pavlov, Sergei
42.
Pravkin, Sergei
43.
Preis, Sergei
44.
Roshtshin, Sergei
45.
Rudenja, Sergei
46.
Sabanov, Sergei
47.
Sazhin, Sergei
48.
Seeland, Sergei
49.
Shvarev, Sergei
50.
Silvestrov, Sergei
51.
Slepuhhov, Sergei
52.
Sokolov, Sergei
53.
Soldatov, Sergei
54.
Storojev, Sergei
55.
Storožev, Sergei
56.
Strik, Sergei
57.
Studzinsky, Sergei
58.
Zaitsev, Sergei V.
59.
Zarembo, Sergei
60.
Zhigailov, Sergei
61.
Zimakov, Sergei
62.
Zonov, Sergei
63.
Zub, Sergei
64.
Tamm, Sergei
65.
Tatarly, Sergei
66.
Teljakovski, Sergei
67.
Teterin, Sergei
68.
Tisler, Sergei
69.
Trashchenkov, Sergei
70.
Tšekrõžov, Sergei
71.
Tšeredišenko, Sergei
72.
Tšudinov, Sergei
73.
Vakulenko, Sergei
74.
Vlassov, Sergei
75.
Vorobjov, Sergei
76.
Yakneen, Sergei
77.
Yurchenko, Sergei
78.
Žari, Sergei
79.
Žigailov, Sergei
CV
45
1.
Kostin, Sergei
2.
Astapov, Sergei 1988
3.
Berezin, Sergei 1970
4.
Bereznev, Sergei 1968
5.
Buatšidze, Sergei
6.
Buatzidze, Sergei 1905-1975
7.
Demidov, Sergei
8.
Devadze, Sergei 1981
9.
Dokelin, Sergei 1917-1987
10.
Jakušev, Sergei 1964
11.
Kaganski, Sergei 1987
12.
Konstantinov, Sergei 1909-1984
13.
Kramarenko, Sergei 1980
14.
Kristafovitš, Sergei 1972
15.
Krištafovitš, Sergei
16.
Laks, Sergei 1901-1942
17.
Letunovitš, Sergei 1958
18.
Malnov, Sergei 1956
19.
Martinson, Sergei 1963
20.
Menšutin, Sergei 1919
21.
Nazarenko, Sergei 1955
22.
Odintsov, Sergei 1988
23.
Ovtsov, Sergei
24.
Pavlov, Sergei 1977
25.
Ponomar, Sergei
26.
Preis, Sergei 1959
27.
Rebane, Sergei 1974
28.
Rudenja, Sergei 1965
29.
Sabanov, Sergei 1974
30.
Schilling, Sergei 1881-1947
31.
Soldatov, Sergei 1933-2003
32.
Storozhev, Sergei
33.
Storožev, Sergei 1966
34.
Zari, Sergei
35.
Zimakov, Sergei 1975
36.
Zub, Sergei 1978
37.
Tamm, Sergei 1956
38.
Tisler, Sergei 1967
39.
Tšekrižov, Sergei
40.
Tšekrõžov, Sergei 1950
41.
Tšudinov, Sergei 1920
42.
Tupailo, Sergei 1965
43.
Urba, Sergei, 1899-1943
44.
Urbanovitš, Sergei
45.
Žari, Sergei 1987-
name of the person
15
1.
Kostin, Sergei
2.
Anikin, Sergei
3.
Astapov, Sergei
4.
Bereznev, Sergei
5.
Bogatenkov, Sergei
6.
Jermolajev, Sergei
7.
Kaganski, Sergei, 1987-
8.
Letunovitš, Sergei
9.
Nazarenko, Sergei
10.
Pavlov, Sergei
11.
Preis, Sergei, 1959-
12.
Sabanov, Sergei, 1974-
13.
Soldatov, Sergei, 1933-2003
14.
Žari, Sergei
15.
Žigailov, Sergei
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