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VLSI-ahelad (subject term)
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26
dissertation
Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemides
Kruus, Helena
2011
dissertation
27
journal article
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement
Blyzniuk, M.
;
Kazymyra, I.
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2001
/
p. 2023-2040 : ill
https://www.sciencedirect.com/science/article/pii/S0026271401000920
journal article
28
book article
Representing transparency conditions in test generation for VLSI by decision diagrams
Ubar, Raimund-Johannes
Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997
1997
/
p. 213-216
book article
29
book
Riistvara kirjeldamiskeel - VHDL : metoodiline materjal
Tammemäe, Kalle
2003
http://www.ester.ee/record=b1605950*est
book
30
book
Riistvara kirjeldamiskeel VHDL : metoodiline materjal
Tammemäe, Kalle
2002
http://www.ester.ee/record=b1605950*est
book
31
journal article
Runtime contention and bandwidth-aware adaptive routing selection strategies for networks-on-chip
Samman, Faizal
;
Hollstein, Thomas
;
Glesner, Manfred
IEEE transactions on parallel and distributed systems
2013
/
p. 1411-1421 : ill
journal article
32
dissertation
System-level design of timing-sensitive network-on-chip based dependable systems = Kiipvõrkudel põhinevate ajakriitiliste ja töökindlate süsteemide kõrgtaseme disain
Tagel, Mihkel
2012
https://www.ester.ee/record=b2778263*est
dissertation
33
book article
Test synthesis from register-transfer level descriptions
Raik, Jaan
;
Paomets, Priidu
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 311-314: ill
book article
34
book
Проектирование контролепригодных дискретных систем : учебное пособие
Ubar, Raimund-Johannes
1988
https://www.ester.ee/record=b1225400*est
book
Number of records 34, displaying
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