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book article

Graph embedding in boolean hypercubeFomina, Jelena; Zakrevskij, ArkadijBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 131-134 : ill

book article

27

book article

Hierarchical test generation for finite state machinesBrik, Marina; Ubar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 319-324: ill

book article

28

dissertation

High-level synthesis of control and memory intensive applications : thesis submitted to the Royal Institute of Technology in partial fulfillment of the requirements for the degree of Doctor of TechnologyEllervee, Peeter2000

dissertation

29

dissertation

Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseksOrasson, Elmet2007 https://www.ester.ee/record=b2305436*est

dissertation

30

book article

Multi-level test generation and fault diagnosis for finite state machinesUbar, Raimund-Johannes; Brik, MarinaDependable computing : proceedings / EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 19961996 / p. 264-281: ill

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31

book article

On SSBDD model size & complexityJutman, ArturECS'03 : proceedings of the 4th Electronic Circuits and Systems Conference : September 11-12, 2003, Bratislava, Slovakia2003 / p. 17-22 https://pld.ttu.ee/~artur/papers/SSBDD_Model_Size-ECS03.pdf

book article

32

dissertation

Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemidesKruus, Helena2011

dissertation

33

journal article

Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvementBlyzniuk, M.; Kazymyra, I.; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2001 / p. 2023-2040 : ill https://www.sciencedirect.com/science/article/pii/S0026271401000920

journal article

34

book article

Representing transparency conditions in test generation for VLSI by decision diagramsUbar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 213-216

book article

35

book

Riistvara kirjeldamiskeel - VHDL : metoodiline materjalTammemäe, Kalle2003 http://www.ester.ee/record=b1605950*est

book

36

book

Riistvara kirjeldamiskeel VHDL : metoodiline materjalTammemäe, Kalle2002 http://www.ester.ee/record=b1605950*est

book

37

journal article EST / journal article ENG

Runtime contention and bandwidth-aware adaptive routing selection strategies for networks-on-chipSamman, Faizal; Hollstein, Thomas; Glesner, ManfredIEEE transactions on parallel and distributed systems2013 / p. 1411-1421 : ill https://doi.org/10.1109/TPDS.2012.200 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

38

dissertation

System-level design of timing-sensitive network-on-chip based dependable systems = Kiipvõrkudel põhinevate ajakriitiliste ja töökindlate süsteemide kõrgtaseme disainTagel, Mihkel2012 https://www.ester.ee/record=b2778263*est

dissertation

39

book article

Test synthesis from register-transfer level descriptionsRaik, Jaan; Paomets, PriiduBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 311-314: ill

book article

40

journal article EST / journal article ENG

The optimization, design and performance of the FBCM23 ASIC for the upgraded CMS beam monitoring systemKaplon, Jan; Wegrzyn, Grzegorz; Shibin, Konstantin; Barendregt, MarnixJournal of instrumentation2024 / art. C02026, 6 p. : ill https://doi.org/10.1088/1748-0221/19/02/C02026 Conference proceedings at Scopus Article at Scopus Conference proceedings at WOS Article at WOS

journal article EST / journal article ENG

41

book article

Turbo tester : a CAD system for teaching digital testJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics education : proceedings of the 2nd European Workshop held in Noordwijkerhout, The Netherlands, 14-15 May 19981998 / p. 287-290: ill https://link.springer.com/chapter/10.1007/978-94-011-5110-8_66

book article

42

journal article

VLSI kõrgtaseme sünteesTammemäe, KalleArvutustehnika ja Andmetöötlus1993 / 1, lk. 25-31

journal article

43

book article

VLSI system level codesign toolkit AKKATammemäe, Kalle; O'Nils, Mattias; Tornemo, Anders; Tenhunen, HannuNORCHIP Conference '96 : 14th conference, Helsinki, 4-5 November 19961996 / p. 1-7: ill https://www.researchgate.net/publication/2407722_VLSI_system_level_codesign_toolkit_AKKA

book article

44

book article

xTractor : an academic high-level synthesis tool for control and memory intensive applicationsEllervee, PeeterUniversity Booth at Design and Test in Europe : DATE'05 : Munich, Germany, 20052005 / ? p https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=6db1d71884b75b47fb27ae86b91b61894e57fd18

book article

45

book

Проектирование контролепригодных дискретных систем : учебное пособиеUbar, Raimund-Johannes1988 https://www.ester.ee/record=b1225400*est

book

VLSI-ahelad (subject term)

types of item

subject term 4

keyword 2