Searching - TalTech Research Portal

display

sort

351

book article

Nanomaterials Al-Al4-C3 studied by "In-situ Tensile Test in SEM"Besterci, Michal; Velgosova, Oksana; Ivan, Jozef; Hvizdoš, Pavol; Kvackaj, Tibor; Kulu, Priit18th International Baltic Conference : Engineering Materials & Tribology : BALTMATTRIB-2009 : October 22-23, 2009, Tallinn, Estonia : abstracts2009 / p. 73

book article

352

book article

Narkotestri arendamine narkootikumide tuvastamiseks süljesSaar-Reismaa, Piret; Erme, E.; Kulp, Maria; Gorbatšova, Jelena; Kaljurand, Mihkel; Vaher, Merike; Mazina-Šinkar, JekaterinaXXXIV Eesti keemiapäevad : 100. aastapäeva teaduskonverentsi teesid2019 / lk. 27 https://www.ester.ee/record=b5208044*est

book article

353

journal article

Natural apeaking and how to assess itPajupuu, Hille; Kerge, Krista; Meister, Lya; Asu, Eva Liina; Alp, PilviTrames2010 / 2, p. 120-140 : ill https://www.researchgate.net/publication/238451077_Natural_speaking_and_how_to_assess_it

journal article

354

book article

New built-in self-test scheme for SoC interconnectJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanThe 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV2005 / p. 19-24 : ill https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect

book article

355

book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article

356

book article

New foreign language text-books as objects of testingRapoport, I.; Petrova, N.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 77

book article

357

book article

New method of testability calculation to guide RT-level test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-Johannes4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 20032003 / p. 46-51 : ill https://link.springer.com/article/10.1007/s10836-005-5288-5

book article

358

book article

New system of testing pupils' abilities in British schoolsGizatullin, N.; Koptelova, N.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 36-37

book article

359

book article EST / book article ENG

A new test suite reduction approach based on hypergraph minimal transversal miningTrabelsi, Shaima; Bennani, Mohamed Taha; Ben Yahia, SadokFuture Data and Security Engineering : 6th International Conference, FDSE 2019, Nha Trang City, Vietnam, November 27–29, 2019, Proceedings2019 / p. 15-30 https://doi.org/10.1007/978-3-030-35653-8_2 Conference proceeding at Scopus Article at Scopus Conference proceeding at WOS Article at WOS

book article EST / book article ENG

360

book article

Noise behavioral model of testing systemBrygilewicz, Volodymyr; Wojciechowski, JacekBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 57-60: ill

book article

361

book article

A novel artificial neural networks based automatic adaptive fault detection technique for analog circuitsPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 167-170 : ill

book article

362

book article

NP-hard graph problems' algorithms testing guidelines : artificial intelligence principles and testing as a serviceKumlander, DenissAdvances in computer and information sciences and engineering2008 / p. 114-118 : ill https://link.springer.com/chapter/10.1007/978-1-4020-8739-4_20

book article

363

book article

NP-hard graph problems' algorithms testing guidlines : artificial intelligence principles and testing as a serviceKumlander, DenissInnovative techniques in instruction technology, e-learning, e-assessment, and education2008 / p. 112-116 https://link.springer.com/chapter/10.1007/978-1-4020-8739-4_20

book article

364

journal article EST / journal article ENG

A numerical study for plant-independent evaluation of fractional-order PID controller performanceAlagoz, Baris Baykant; Tepljakov, Aleksei; Yeroglu, Celaleddin; Gonzalez, Emmanuel A.; Hossein Nia, S. Hassan; Petlenkov, EduardIFAC-PapersOnLine2018 / p. 539-544 : ill https://doi.org/10.1016/j.ifacol.2018.06.151 Conference proceedings at Scopus Article at Scopus Article at WOS

journal article EST / journal article ENG

365

book article

Off-line testing of crosstalk induced glitch faults in NoC InterconnectsBengtsson, Tomas; Kumar, Shashi; Jutman, Artur; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 221-225 : ill http://dx.doi.org/10.1109/NORCHP.2006.329215

book article

366

book article

Off-line testing of delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Peng, Zebo; Ubar, Raimund-Johannes9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 677-680 : ill http://dx.doi.org/10.1109/DSD.2006.72

book article

367

book article

On automatic software-based self-test program generation based on high-Level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 177 http://dx.doi.org/10.1109/LATW.2016.7483357

book article

368

book article

On coverage of timing related faults at board levelJutman, Artur; Aleksejev, Igor; Devadze, Sergei2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings2016 / [2] p. : ill https://doi.org/10.1109/ETS.2016.7519295

book article

369

book article

On efficient logic-level simulation of digital circuits represented by the SSBDD modelJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 621-624 : ill https://ieeexplore.ieee.org/document/1003334

book article

370

book article

On mutating UPPAAL timed automata to assess robustness of web servicesSiavashi, Faezeh; Truscan, Dragos; Vain, JüriProceedings of the 11th International Joint Conference on Software Technologies (ICSOFT 2016). Vol. 1, ICSOFT-EA2016 / p. 15-26 : ill http://dx.doi.org/10.5220/0005970800150026

book article

371

book article

On reusability of verification assertions for testingJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Tšepurov, AntonBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 151-154 : ill

book article

372

book article

On reusability of verification assertions for testingJenihhin, Maksim; Raik, JaanInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 43-46 : ill

book article

373

book article EST / book article ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

374

book article EST / book article ENG

On testing microservice systemsKoschel, Arne; Astrova, Irina; Bartels, Mirco; Helmers, Mark; Lyko, MarcelProceedings of the Future Technologies Conference (FTC) 2020 ; vol. 32021 / p. 597–609 https://doi.org/10.1007/978-3-030-63092-8_40 Conference Proceedings at Scopus Article at Scopus

book article EST / book article ENG

375

book article

On the combined use of HLDDs and EFSMs for functional ATPGDi Guglielmo, Giuseppe; Fummi, Franco; Jenihhin, Maksim; Pravadelli, Graziano; Raik, Jaan; Ubar, Raimund-Johannes5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia2007 / p. 503-508 : ill

book article

testimine (subject term)

types of item

subject term 1

keyword 1