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testimine (subject term)
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476
newspaper article
Tallinnas avati NATO DIANA piirkondlik keskus
Eesti Elu : [Kanada ajaleht]
2024
/
lk. 2
newspaper article
477
newspaper article
TalTech käivitab 5G testvõrgud. Eesti firmad saavad arendada teenuseid välisturgudele
Kald, Indrek
ituudised.ee
2023
TalTech käivitab 5G testvõrgud. Eesti firmad saavad arendada teenuseid välisturgudele
newspaper article
478
newspaper article
TalTechis hakatakse testima 6G võrku. Margus Rohtla: „Oleks vaid minu õpingute ajal sellised võimalused olnud!“
Lindpere, Elle Isabel
forte.delfi.ee
2023
TalTechis hakatakse testima 6G võrku. Margus Rohtla: „Oleks vaid minu õpingute ajal sellised võimalused olnud!“
newspaper article
479
journal article
Tarkvara omaduste parandamine kasutatavuse testimise kaudu
Eessaar, Erki
A & A
1999
/
2, lk. 26-31
journal article
480
journal article
Tarkvara testimisest ja testijatest Eestis
Markvardt, Maili
A & A
2010
/
3, lk. 62-65
journal article
481
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
482
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
483
book article
Teaching digital test with BIST analyzer
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
2008
/
p. 123-128 : ill
http://dx.doi.org/10.1109/EAEEIE.2008.4610171
book article
484
journal article
Tehnikaülikoolis on uus katseseade, mis võib välja panna Abramsi tanki kaalu
Ehitaja
2023
/
lk. 35 : fot
https://www.ester.ee/record=b1072123*est
https://artiklid.elnet.ee/record=b2904596*est
journal article
485
book article
Temporally extended high-level decision diagrams for PSL assertions simulation
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings : Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May 2008, Verbania, Italy
2008
/
p. 61-68 : ill
https://ieeexplore.ieee.org/document/4556029
book article
486
book article
Tension stiffening model based on test data of RC beams
Idnurm, Siim
;
Bacinskas, Darius
;
Gribniak, Viktor
;
Sokolov, Aleksandr
;
Kaklauskas, Gintaris
The 10th International Conference "Modern Building Materials, Structures and Techniques" : May 19-21, 2010, Lithuania : selected papers
2010
/
p. 810-814 : ill
https://www.researchgate.net/publication/265635200_Tension-stiffening_model_based_on_test_data_of_RC_beams
book article
487
journal article
10th IEEE European Test Symposium
Ubar, Raimund-Johannes
;
Prinetto, Paolo
;
Raik, Jaan
IEEE journal of design & test of computers
2005
/
p. 480-481 : phot
http://dx.doi.org/10.1109/MDT.2005.106
journal article
488
book article
"Tervis ruudus", ehk, Tippkeskuse CEBE lugu
Ubar, Raimund-Johannes
Teadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]
2019
/
lk. 200-215 : ill., fot
https://www.ester.ee/record=b5208765*est
book article
489
book article
Test cost minimization for hybrid BIST
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
2000
/
p. 283-298 : ill
https://ieeexplore.ieee.org/abstract/document/887168
book article
490
book article
Test development and deployment tool-set for mixed-signal and digital devices
Mellik, Andres
;
Raik, Jaan
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 163-166 : ill
book article
491
book article
Test driven domain modelling
Piho, Gunnar
;
Tepandi, Jaak
;
Parman, Marko
;
Puusep, Viljam
;
Roost, Mart
MIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings
2011
/
p. 576-581
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5967121
book article
492
book article
Test generation for control faults in digital systems
Dušina, Julia
;
Brik, Marina
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 325-330: ill
book article
493
book article
Test generation for digital systems
Ubar, Raimund-Johannes
Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy
1983
/
p. 374-377
book article
494
book article
Test generation for digital systems at functional level
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
;
Peng, Z.
Research report LiTH-IDA-R-90-06, Linköping University, Sweden
1990
/
p. 1-21
book article
495
book article
Test generation for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 233-236: ill
book article
496
book article
Test generation for microprocessor control mechanisms
Lohuaru, Tõnu
;
Ubar, Raimund-Johannes
FTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)
1987
/
p. 305-311
book article
497
book article
Test generation for microprocessors on alternative graphs
Alango, Villem
;
Kont, Toomas
;
Ubar, Raimund-Johannes
33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik
1988
/
p. 11-14
book article
498
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
499
book article
Test method for determining radiation absorptivity and emissivity coefficients of ACSR conductors
Kiitam, Ivar
18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]
2019
/
p. 185-186 : ill
https://www.ester.ee/record=b5183874*est
book article
500
journal article
Test method for the total content of non-volatile phenols in wastewater
Johannes, Ille
;
Mölder, Leevi
;
Tiikma, Laine
Oil shale
1998
/
3, p. 232-238
journal article
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