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testimine (subject term)
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576
journal article
Tehnikaülikoolis on uus katseseade, mis võib välja panna Abramsi tanki kaalu
Ehitaja
2023
/
lk. 35 : fot
https://www.ester.ee/record=b1072123*est
https://artiklid.elnet.ee/record=b2904596*est
journal article
577
book article
Temporally extended high-level decision diagrams for PSL assertions simulation
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings : Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May 2008, Verbania, Italy
2008
/
p. 61-68 : ill
https://ieeexplore.ieee.org/document/4556029
book article
578
book article
Tension stiffening model based on test data of RC beams
Idnurm, Siim
;
Bacinskas, Darius
;
Gribniak, Viktor
;
Sokolov, Aleksandr
;
Kaklauskas, Gintaris
The 10th International Conference "Modern Building Materials, Structures and Techniques" : May 19-21, 2010, Lithuania : selected papers
2010
/
p. 810-814 : ill
https://www.researchgate.net/publication/265635200_Tension-stiffening_model_based_on_test_data_of_RC_beams
book article
579
journal article
10th IEEE European Test Symposium
Ubar, Raimund-Johannes
;
Prinetto, Paolo
;
Raik, Jaan
IEEE journal of design & test of computers
2005
/
p. 480-481 : phot
http://dx.doi.org/10.1109/MDT.2005.106
journal article
580
book article
"Tervis ruudus", ehk, Tippkeskuse CEBE lugu
Ubar, Raimund-Johannes
Teadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]
2019
/
lk. 200-215 : ill., fot
https://www.ester.ee/record=b5208765*est
book article
581
book article
Test cost minimization for hybrid BIST
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
2000
/
p. 283-298 : ill
https://ieeexplore.ieee.org/abstract/document/887168
book article
582
book article
Test development and deployment tool-set for mixed-signal and digital devices
Mellik, Andres
;
Raik, Jaan
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 163-166 : ill
book article
583
book article
Test driven domain modelling
Piho, Gunnar
;
Tepandi, Jaak
;
Parman, Marko
;
Puusep, Viljam
;
Roost, Mart
MIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings
2011
/
p. 576-581
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5967121
book article
584
book article
Test generation for control faults in digital systems
Dušina, Julia
;
Brik, Marina
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 325-330: ill
book article
585
book article
Test generation for digital systems
Ubar, Raimund-Johannes
Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy
1983
/
p. 374-377
book article
586
book article
Test generation for digital systems at functional level
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
;
Peng, Z.
Research report LiTH-IDA-R-90-06, Linköping University, Sweden
1990
/
p. 1-21
book article
587
book article
Test generation for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 233-236: ill
book article
588
book article
Test generation for microprocessor control mechanisms
Lohuaru, Tõnu
;
Ubar, Raimund-Johannes
FTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)
1987
/
p. 305-311
book article
589
book article
Test generation for microprocessors on alternative graphs
Alango, Villem
;
Kont, Toomas
;
Ubar, Raimund-Johannes
33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik
1988
/
p. 11-14
book article
590
book article
Test generation for sequential digital systems based on symbolic simulation
Skobtsov, Vadim
;
Skobtsov, Yu.
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 341-344: ill
book article
591
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
592
book article
Test generation with structurally synthesized BDD models
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 1998
1998
/
p. 66-68
book article
593
book article
Test method for determining radiation absorptivity and emissivity coefficients of ACSR conductors
Kiitam, Ivar
18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]
2019
/
p. 185-186 : ill
https://www.ester.ee/record=b5183874*est
book article
594
journal article
Test method for the total content of non-volatile phenols in wastewater
Johannes, Ille
;
Mölder, Leevi
;
Tiikma, Laine
Oil shale
1998
/
3, p. 232-238
journal article
595
book article
Test pattern generation at the behavioral level from VHDL circuit description containing several processes
Gramatova, Elena
;
Bezakova, Jana
;
Cibakova, Tatiana
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 145-148
book article
596
dissertation
Test program generation for microprocessor systems
Dušina, Julia
1993
https://www.ester.ee/record=b2090526*est
dissertation
597
book article
Test scenario generator learning for model-based testing of mobile robots
Kanter, Gert
;
Liibert, Marti Ingmar
System assurances : modeling and management
2022
/
p. 67-84
https://doi.org/10.1016/B978-0-323-90240-3.00005-9
book article
598
journal article EST
/
journal article ENG
Test scenario specification language for model-based testing
Halling, Evelin
;
Vain, Jüri
;
Boyarchuk, Artem
;
Illiashenko, Oleg
International Journal of Computing
2019
/
p. 408-421 : ill
http://www.computingonline.net/computing/article/view/1611
https://doi.org/10.47839/ijc.18.4.1611
Journal metrics at Scopus
Article at Scopus
journal article EST
/
journal article ENG
599
book article
Test set minimization using bipartite graphs
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 175-178: ill
book article
600
book article
Test strategy for a 486 computer multichip module
Magnhagen, Bengt
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 339-340: ill
book article
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