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701
book
Water hammer and column separation due to accidential simultaneous closure of control valves in a large scale two-phase flow experimental test rig
Bergant, Anton
;
Westende, Jos M.C.van't
;
Koppel, Tiit
;
Gale, Janez
;
Hou, Qingzhi
;
Pandula, Zoltan
;
Tijsseling, Arris S.
2010
https://www.researchgate.net/publication/280624441_Water_hammer_and_column_separation_due_to_accidental_simultaneous_closure_of_control_valves_in_a_large-scale_two-phase_flow_experimental_test_rig
book
702
book article
Water hammer and column separation due to accidential simultaneous closure of control valves in a large scale two-phase flow experimental test rig
Bergant, Anton
;
Westende, Jos M.C.van't
;
Koppel, Tiit
;
Gale, Janez
;
Hou, Qingzhi
;
Pandula, Zoltan
;
Tijsseling, Arris S.
Proceedings of the ASME 2010 Pressure Vessels & Piping Division/K-PVP Conference : PVP2010 : July 18-22, 2010, Bellevue, Washington, USA
2010
/
[10] p.: ill
https://www.researchgate.net/publication/280624441_Water_hammer_and_column_separation_due_to_accidental_simultaneous_closure_of_control_valves_in_a_large-scale_two-phase_flow_experimental_test_rig
book article
703
book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
704
book article
Web based tools for synthesis and testing of digital devices
Devadze, Sergei
;
Jutman, Artur
;
Kruus, Margus
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
Proceedings of the International Conference on Computer Systems and Technologies (e-Learning) : CompSysTech'2002, Sofia, Bulgaria, 20-21 June
2002
/
p. 1.9-1 - 1.9-6 : ill
https://www.researchgate.net/publication/250738271_Web_Based_Tools_for_Synthesis_and_Testing_of_Digital_Devices
book article
705
book article
Web services testing in e-learning environments
Õunapuu, Enn
;
Tepandi, Jaak
Second International Conference on Multimedia and Information & Communication Technologies in Education (m-ICTE 2003) : Badajoz, Spain, 2003
2003
/
p. 1170-1177
book article
706
book article
Web-based environment for digital electronics test tools
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Schneider, Andre
Virtual Enterprises and collaborative networks : IFIP 18th World Computer Congress [and] TC5/WG5.5 - 5th Working Conference on Virtual Enterprises : 22-27 August 2004, Toulouse, France
2004
/
p. 435-442 : ill
https://link.springer.com/chapter/10.1007/1-4020-8139-1_46
book article
707
book article
Web-based framework for parallel distributed test [Electronic resource]
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008
2008
/
p. 271-274 : ill. [CD-ROM]
https://ieeexplore.ieee.org/document/4538800
book article
708
newspaper article
WebTT - digitaalskeemide testimine ja diagnostikaalaste õppelaborite e-keskkond : [TTÜ arvutitehnika instituut esitles e-Ülikooli konverentsil kolme õppetöös kasutatavat süsteemi]
Robal, Tarmo
;
Orasson, Elmet
Mente et Manu
2005
/
5. mai, lk. 5 : fot
https://www.ester.ee/record=b1242496*est
newspaper article
709
book article
Verification of new 1000 [degree] C tester designed for investigation of wear-corrosion properties of advanced materials for high temperature applications
Antonov, Maksim
;
Hussainova, Irina
;
Kimmari, Eduard
;
Juhani, Kristjan
Proceedings of the 6th International Conference of DAAAM Baltic "Industrial Engineering" : 24-26th April 2008, Tallinn, Estonia. [2]
2008
/
p. 395-399 : ill
http://innomet.ttu.ee/daaam08/online/Materials%20Engineering/Antonov.pdf
book article
710
book article
Verification of the test quality
Matrosova, Anjela
;
Bochun, Tatiana
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 307-310: ill
book article
711
book article
Verification, testing and validation of rule-based expert systems
Tepandi, Jaak
Preprints 11th IFAC World Congress "Automatic Control in the Service of Mankind" : Tallinn, Estonia, USSR, August 13-17, 1990. Vol. 7
1990
/
p. 162-167
book article
712
book article
VHDL based test generation system
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 1998
1998
/
p. 145-148
book article
713
book article
VHDL design debug framework based on zamiaCAD
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2013 : Design Automation and Test in Europe, March 18-22, 2013, Grenoble, France
2013
/
[1] p. : ill
book article
714
book article
VILAB test generation tools running under the MOSCITO system
Schneider, Andre
;
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
VILAB User Forum : Györ, Hungary, 2001
2001
/
[12] p
book article
715
newspaper article
Õpilastele tarnib kiirteste uus firma
Hussar, Karoliina
Eesti Päevaleht
2021
/
Lk. 7
https://dea.digar.ee/article/eestipaevaleht/2021/11/24/7.5
newspaper article
716
journal article
Über einige Probleme der Testsatzanalyse für digitale Systeme
Ubar, Raimund-Johannes
Wissenschaftliche Zeitschrift
1976
/
p. 447-449
https://www.ester.ee/record=b1516616*est
journal article
717
journal article
Über einige Probleme der Testsatzanalyse für digitale Systeme
Ubar, Raimund-Johannes
Nachrichtentechnik, Elektronik : technisch-wissenschaftlishe Zeitschrift für die gesamte elektronische Nachrichtentechnik
1977
/
p. 149-150
https://www.ester.ee/record=b1550811*est
journal article
718
book article
Алгоритм оценки качества вероятностного тестирования цифровых схем
Grigorjeva, Ksenja
Машинное проектирование электронных устройств и систем
1989
/
с. 97-103
book article
719
journal article
Анализ диагностических тестов для комбинационных цифровых схем методом обратного прослеживания неисправностей
Ubar, Raimund-Johannes
Автоматика и телемеханика
1977
/
с. 168-176
https://www.ester.ee/record=b1515055*est
journal article
720
book article
Анализ методов тестирования микропроцессоров
Toomsalu, Arvo
Синтез и диагностика цифровых устройств и систем
1982
/
с. 53-62 : илл
https://www.ester.ee/record=b1328194*est
https://digikogu.taltech.ee/et/Item/febd586e-d7fa-4fbd-bf41-40576a75f94b
book article
721
newspaper article
В волости Раэ тестируют беспилотные автобусы
Stolitsa.ee
2023
В волости Раэ тестируют беспилотные автобусы
newspaper article
722
newspaper article
В Ласнамяэ до 29 апреля можно прокатиться на беспилотном автобусе [Online resource]
rus.err.ee
2022
"В Ласнамяэ до 29 апреля можно прокатиться на беспилотном автобусе"
newspaper article
723
book article
Вероятностное тестирование цифровых схем и альтернативные графы
Ubar, Raimund-Johannes
Машинное проектирование электронных устройств и систем
1989
/
с. 89-96
book article
724
book article
Генерирование групповых тестов для цифровых схем на модели альтернативных графов
Kivi, E.
;
Ubar, Raimund-Johannes
Тезисы докладов XXXI студенческой научно-технической конференции
1980
/
с. 52-55
https://www.ester.ee/record=b1319482*est
book article
725
book article
Генерирование реализации шума на ЭВМ
Lumberg, Tõnu
;
Ots, Avo
Тезисы докладов XXXI студенческой научно-технической конференции
1980
/
с. 60
https://www.ester.ee/record=b1319482*est
book article
Number of records 769, displaying
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