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176

journal article

FPGA-based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tammemäe, Kalle; Ubar, Raimund-JohannesIET computers and digital techniques2007 / 2, p. 70-76 : ill https://ieeexplore.ieee.org/abstract/document/1423822

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177

journal article

Fracture micromechanism of Cu-Cr-Zr system by "in-situ tensile test in SEM"Besterci, Michal; Ivan, Jozef; Kulu, Priit; Arensburger, Daniil; Velgosova, OksanaActa metallurgica Slovaca2000 / p. 20-24

journal article

178

book article

A framework for improving web application user interfaces through immediate evaluationMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 283-296 : ill https://doi.org/10.3233/978-1-61499-714-6-283

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179

book article

Fully synchronized acoustomechanical testing of skin : biomechanical measurements of nonclassical nonlinear parametersLints, Martin; Dos Santos, Serge; Kozena, Colette; Kus, Vaclav; Salupere, Andrus24th International Congress on Sound and Vibration 2017 (ICSV 24) : London, United Kingdom, 23-27 July 2017. Vol. 32017 / p. 1970-1977 : ill https://www.iiav.org/archives_icsv_last/2017_icsv24/content/papers/papers/full_paper_867_20170403135841549.pdf

book article

180

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

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181

book article

Functional test generation for finite state machinesUbar, Raimund-Johannes; Brik, Marina; Jutman, Artur; Raik, Jaan; Bengtsson, Tomas; Kumar, ShashiBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 205-208 : ill

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182

book article

Generating optimal test cases for real-time systems using DIVINE model checkerPal, Deepak; Vain, JüriBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 99-102 : ill http://www.ester.ee/record=b2150914*est

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183

journal article EST / journal article ENG

A global survey of standardization and industry practices of automotive cybersecurity validation and verification testing processes and toolsRoberts, Andrew; Marksteiner, Stefan; Soyturk, Mujdat; Yaman, Berkay; Yang, YiSAE international journal of connected and automated vehicles2023 / art. 12-07-02-0013 https://doi.org/10.4271/12-07-02-0013 Journal metrics at Scopus Article at Scopus

journal article EST / journal article ENG

184

journal article

Guardbands in random testingKemnitz, GünterProceedings of the Estonian Academy of Sciences. Engineering1997 / 4, p. 260-270: ill

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185

book

Handbook of testing electronic systemsNovak, Ondrej; Gramatova, Elena; Ubar, Raimund-Johannes; Jutman, Artur; Raik, Jaan2005 https://www.ester.ee/record=b2102523*est

book

186

book article

Hierarchical analysis of short defects between metal lines in CMOS ICPleskacz, Witold A.; Jenihhin, Maksim; Raik, Jaan; Rakowski, Michal; Ubar, Raimund-Johannes; Kuzmicz, WieslawProceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy2008 / p. 729-734 : ill https://ieeexplore.ieee.org/document/4669309

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187

book article

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

book article

188

book article

Hierarchical test generation based on alternative graph modelUbar, Raimund-JohannesProceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 19951995 / p. 18

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189

journal article

Hierarchical test generation for combinational circuits with real defects coverageCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2002 / p. 1141-1149 : ill https://www.sciencedirect.com/science/article/pii/S002627140200080X

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190

book article

Hierarchical test generation for complex digital systems with control and data processing partsUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 43-52

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191

book article

Hierarchical test generation. SEMI show slidesUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 53-64

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192

dissertation

Hierarchical test pattern generation and untestability identification techniques for synchronous sequential circuits = Hierarhilised testintegreerimise ja mittetestitavuse identifitseerimise meetodid sünkroonsetele järjestikskeemideleRannaste, Anna2010 https://www.ester.ee/record=b2637391*est

dissertation

193

book article

Hierarchical test synthesis for digital systems using alternative graph modelUbar, Raimund-JohannesQuantitative aspects of designing and validating dependable computing systems1995

book article

194

journal article

Hierarhilisest testigenereerimisest ja mittetestitavuse analüüsistRannaste, AnnaA & A2010 / 4, lk. 38-39 https://artiklid.elnet.ee/record=b2286481*est

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195

journal article

High quality test generation for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, JaanRomanian journal of information science and technology2005 / 1, p. 73-84 : ill

journal article

196

book article

High-level combined deterministic and pseudo-exhuastive test generation for RISC processorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

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197

book article

High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

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198

book article

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

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199

book article

High-level functional test generation for microprocessor modulesOyeniran, Adeboye Stephen; Ubar, Raimund-JohannesProceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 20192019 / p. 356-361 : ill https://doi.org/10.23919/MIXDES.2019.8787131

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200

journal article

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanJournal of electronic testing : theory and applications2020 / p. 87-103 https://doi.org/10.1007/s10836-020-05856-7

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