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Cognitive disorders in patients with chronic kidney disease : specificities of clinical assessmentPepin, Marion; Ferreira, Ana Carina; Arici, Mustafa; Bachmann, Maie; Barbieri, Michelangela; Bumblyte, Inga AruneNephrology Dialysis Transplantation2022 / p. ii23-ii32 https://doi.org/10.1093/ndt/gfab262 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

77

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Combined pseudo-exhaustive and deterministic testing of array multipliersOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings2018 / 6 p. : ill https://doi.org/10.1109/AQTR.2018.8402708

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78

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Combining dynamic slicing and mutation operators for ESL correctionRepinski, Urmas; Hantson, Hanno; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France2012 / [6] p. : ill https://ieeexplore.ieee.org/document/6233020

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79

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Combining functional and structural approaches in test generation for digital systemsUbar, Raimund-JohannesMicroelectronics reliability1998 / 3, p. 317-329 : ill

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80

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Combining learning, training and research in laboratory course for design and testUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 221-224 : ill https://www.researchgate.net/publication/242397131_Combining_Learning_Training_and_Research_in_Laboratory_Course_for_Design_and_Test

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81

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Combining symbolic techniques with topological approach in test generationUbar, Raimund-JohannesProceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 19961996 / p. 377-382

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82

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Compaction of decision diagrams for describing multi-process VHDL descriptionsLeveugle, R.; Saucier, Gabriele; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 195-198: ill

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83

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Comparative analysis of sequential circuit test generation approachesRaik, Jaan; Krivenko, Anna; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 225-228 : ill

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84

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Comparative mixed-signal test method and toolsetMellik, Andres; Raik, JaanIEEE International Workshop on Open Source Test Technology Tools (IOST3)2007 / ? p

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85

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Comparative mixed-signal test method and toolsetMellik, AndresInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 153-154 : ill

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86

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Comparison of different soil compaction test methods [Electronic resource]Aavik, Andrus26th International Baltic Road Conference : Kuressaare, 28-30 August, 20062006

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87

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Comparison of genetic and random techniques for test pattern generationIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 163-166: ill

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88

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Compliance testing concept of grid-connected inverter-based resources using simulated inputDvoracek, Jiri; Drapela, Jiri; Moravek, Jan; Vojtek, Martin; Toman, Petr; Rassõlkin, Anton; Vaimann, Toomas2023 23rd International Scientific Conference on Electric Power Engineering (EPE)2023 / p. 1-6 https://doi.org/10.1109/EPE58302.2023.10149232

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89

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A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoCAppello, D.; Bernardi, P.; Giacopelli, G.; Ruberg, PriitProceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland2017 / p. 646-649 : ill https://doi.org/10.23919/DATE.2017.7927068

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90

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Concept drift and cross-device behavior : challenges and implications for effective android malware detectionGuerra Manzanares, Alejandro; Luckner, Marcin; Bahsi, HayretdinComputers & Security2022 / art. 102757, 20 p. : ill https://doi.org/10.1016/j.cose.2022.102757 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Related publications 1

Machine learning-based detection and characterization of evolving threats in mobile and IoT Systems = Masinõppepõhine arenevate ohtude tuvastamine ning kirjeldamine mobiilseadmete ja värkvõrkude jaoks

91

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Conceptual test bench for small class unmanned autonomous vehicle performance estimationPütsep, Kristjan; Rassõlkin, Anton; Vaimann, Toomas2021 IEEE 19th International Power Electronics and Motion Control Conference, The Silesian University of Technology Gliwice, Poland, 25 - 29 April, 2021 (PEMC) : proceedings2021 / p. 695-698 : ill https://doi.org/10.1109/PEMC48073.2021.9432509

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92

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Condition assessment of power plant components operating under creep by testing of miniature specimensKlevtsov, Ivan; Dedov, AndreiCreep and Fracture in High Temperature Components : April 21-23, 2009, Zurich, Swizerland2009 / p. 1126-1137

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93

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Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

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94

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Constraint-based heuristic on-line test generation from non-deterministic I/O EFSMsAhman, Danel; Kääramees, MarkoEPTCS 80 : proceedings of the 7th Workshop on Model-Based Testing : Tallinn, Estonia, 25 March 20122012 / p. 115-129 : ill https://www.semanticscholar.org/paper/Constraint-Based-Heuristic-On-line-Test-Generation-Ahman-K%C3%A4%C3%A4ramees/c798ef6753277479b79652be2a5921a1db94c74c

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95

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Constraint-based hierarchical untestability identification for synchronous sequential circuitsRaik, Jaan; Rannaste, Anna; Jenihhin, Maksim; Viilukas, Taavi; Ubar, Raimund-Johannes; Fujiwara, HideoSixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim2011 / p. 147-152

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96

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Constraint-based hierarchical untestability identification for syncronous sequential circuitsViilukas, Taavi; Raik, Jaan; Ubar, Raimund-Johannes; Rannaste, Anna; Jenihhin, Maksim; Fujiwara, HideoInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 139-142 : ill

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97

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Constraint-based test pattern generation at the register-transfer levelViilukas, Taavi; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Krivenko, AnnaProceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria2010 / p. 352-357 : ill http://dx.doi.org/10.1109/DDECS.2010.5491752

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98

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Constraint-based test scenario description languageVain, Jüri; Halling, EvelinBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 89-92 : ill

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99

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A constraint-driven gate-level test generatorRaik, Jaan; Ubar, Raimund-Johannes; Jervan, Gert; Krupnova, HelenaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 237-240: ill

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100

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Constraints analysis in hierarchical test generation for digital systemsUbar, Raimund-Johannes; Krupnova, HelenaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 313-318: ill

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