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testimine (subject term)
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76
book article
Combining dynamic slicing and mutation operators for ESL correction
Repinski, Urmas
;
Hantson, Hanno
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France
2012
/
[6] p. : ill
https://ieeexplore.ieee.org/document/6233020
book article
77
journal article
Combining functional and structural approaches in test generation for digital systems
Ubar, Raimund-Johannes
Microelectronics reliability
1998
/
p. 317-329 : ill
https://doi.org/10.1016/S0026-2714(97)00192-3
journal article
78
book article
Combining learning, training and research in laboratory course for design and test
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 221-224 : ill
https://www.researchgate.net/publication/242397131_Combining_Learning_Training_and_Research_in_Laboratory_Course_for_Design_and_Test
book article
79
book article
Combining symbolic techniques with topological approach in test generation
Ubar, Raimund-Johannes
Proceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 1996
1996
/
p. 377-382
book article
80
book article
Compaction of decision diagrams for describing multi-process VHDL descriptions
Leveugle, R.
;
Saucier, Gabriele
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 195-198: ill
book article
81
book article
Comparative analysis of sequential circuit test generation approaches
Raik, Jaan
;
Krivenko, Anna
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 225-228 : ill
book article
82
book article
Comparative mixed-signal test method and toolset
Mellik, Andres
;
Raik, Jaan
IEEE International Workshop on Open Source Test Technology Tools (IOST3)
2007
/
? p
book article
83
book article
Comparative mixed-signal test method and toolset
Mellik, Andres
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 153-154 : ill
book article
84
book article
A comparative study of battery degradation cost modeling in residential PV-battery systems for day-ahead optimization
Lekhel, Cheikh Elekbir Sidi
;
Mbayed, Rita
;
Nourollahi Hokmabad, Hossein
;
Velihorskyi, Oleksandr
;
Monmasson, Eric
2025 IECON – 51st Annual Conference of the IEEE Industrial Electronics Society
2025
/
6 p
https://doi.org/10.1109/IECON58223.2025.11221673
book article
85
book article
Comparison of different soil compaction test methods [Electronic resource]
Aavik, Andrus
26th International Baltic Road Conference : Kuressaare, 28-30 August, 2006
2006
book article
86
book article
Comparison of genetic and random techniques for test pattern generation
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 163-166: ill
book article
87
book article EST
/
book article ENG
Comparison of performances of bond lines in different small-scale tests
Vihmann, Jane Liise
;
Just, Alar
;
Aicher, Simon
14th World Conference on Timber Engineering Advancing Timber for the Future Built Environment
Proceedings from the 14th World Conference on Timber Engineering : Advancing Timber for the Future Built Environment
2025
/
p. 4676-4685
https://doi.org/10.52202/080513-0575
book article EST
/
book article ENG
88
book article
Compliance testing concept of grid-connected inverter-based resources using simulated input
Dvoracek, Jiri
;
Drapela, Jiri
;
Moravek, Jan
;
Vojtek, Martin
;
Toman, Petr
;
Rassõlkin, Anton
;
Vaimann, Toomas
2023 23rd International Scientific Conference on Electric Power Engineering (EPE)
2023
/
p. 1-6
https://doi.org/10.1109/EPE58302.2023.10149232
book article
89
book article
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC
Appello, D.
;
Bernardi, P.
;
Giacopelli, G.
;
Ruberg, Priit
Proceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland
2017
/
p. 646-649 : ill
https://doi.org/10.23919/DATE.2017.7927068
book article
90
journal article EST
/
journal article ENG
Concept drift and cross-device behavior : challenges and implications for effective android malware detection
Guerra Manzanares, Alejandro
;
Luckner, Marcin
;
Bahsi, Hayretdin
Computers & Security
2022
/
art. 102757, 20 p. : ill
https://doi.org/10.1016/j.cose.2022.102757
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Related publications
1
Machine learning-based detection and characterization of evolving threats in mobile and IoT Systems = Masinõppepõhine arenevate ohtude tuvastamine ning kirjeldamine mobiilseadmete ja värkvõrkude jaoks
91
book article
Conceptual test bench for small class unmanned autonomous vehicle performance estimation
Pütsep, Kristjan
;
Rassõlkin, Anton
;
Vaimann, Toomas
2021 IEEE 19th International Power Electronics and Motion Control Conference, The Silesian University of Technology Gliwice, Poland, 25 - 29 April, 2021 (PEMC) : proceedings
2021
/
p. 695-698 : ill
https://doi.org/10.1109/PEMC48073.2021.9432509
book article
92
book article
Condition assessment of power plant components operating under creep by testing of miniature specimens
Klevtsov, Ivan
;
Dedov, Andrei
Creep and Fracture in High Temperature Components : April 21-23, 2009, Zurich, Swizerland
2009
/
p. 1126-1137
book article
93
book article
Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600967
book article
94
book article
Constraint-based heuristic on-line test generation from non-deterministic I/O EFSMs
Ahman, Danel
;
Kääramees, Marko
EPTCS 80 : proceedings of the 7th Workshop on Model-Based Testing : Tallinn, Estonia, 25 March 2012
2012
/
p. 115-129 : ill
https://www.semanticscholar.org/paper/Constraint-Based-Heuristic-On-line-Test-Generation-Ahman-K%C3%A4%C3%A4ramees/c798ef6753277479b79652be2a5921a1db94c74c
book article
95
book article
Constraint-based hierarchical untestability identification for synchronous sequential circuits
Raik, Jaan
;
Rannaste, Anna
;
Jenihhin, Maksim
;
Viilukas, Taavi
;
Ubar, Raimund-Johannes
;
Fujiwara, Hideo
Sixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim
2011
/
p. 147-152
book article
96
book article
Constraint-based hierarchical untestability identification for syncronous sequential circuits
Viilukas, Taavi
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Rannaste, Anna
;
Jenihhin, Maksim
;
Fujiwara, Hideo
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 139-142 : ill
book article
97
book article
Constraint-based test pattern generation at the register-transfer level
Viilukas, Taavi
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria
2010
/
p. 352-357 : ill
http://dx.doi.org/10.1109/DDECS.2010.5491752
book article
98
book article
Constraint-based test scenario description language
Vain, Jüri
;
Halling, Evelin
BEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia
2012
/
p. 89-92 : ill
book article
99
book article
A constraint-driven gate-level test generator
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Krupnova, Helena
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 237-240: ill
book article
100
book article
Constraints analysis in hierarchical test generation for digital systems
Ubar, Raimund-Johannes
;
Krupnova, Helena
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 313-318: ill
book article
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