Searching - TalTech Research Portal

display

sort

26

book article EST / book article ENG

Dedicated to the memory of Prof. M. Sheinkman effect of ultrasonic treatment on the defect structure of the Si-SiO2 systemKropman, Daniel; Dolgov, Sergei; Onufrijevs, Pavels; Dauksta, EdvinsGettering and Defect Engineering in Semiconductor Technology XV2014 / p. 352-357 : ill https://doi.org/10.4028/www.scientific.net/SSP.205-206.352 Conference proceedings at Scopus Article at Scopus Conference proceedings at WOS Article at WOS

book article EST / book article ENG

27

journal article

Deep defects in Cu2ZnSnS4 monograin solar cellsKask, Erkki; Raadik, Taavi; Grossberg, Maarja; Josepson, Raavo; Krustok, JüriEnergy procedia2011 / p. 261-265

journal article

28

book article

Defect oriented fault coverage of 100stuck-at fault test setsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 511-516 : ill https://repo.pw.edu.pl/info.seam?ps=20&id=WUT7e20f35d67ae45d3b2d1264d7a4ba722&lang=en&pn=1&cid=156607

book article

29

journal article

Defect structure of Cl and Cu doped CdS heat treated in Cd and S2 vapourKukk, Peeter-Enn; Altosaar, MareJournal of solid state chemistry1983 / p. 1-11

journal article

30

book article

Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

book article

31

book article

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

book article

32

book article

Defect-oriented test generation using probabilistic estimationCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 131-136 : ill

book article

33

book article

Defects in CdTe-based photodetectorsValdna, VelloMaterials Research Society Symposia proceedings series2000 / p. 241-246 : ill

book article

34

book article

Defects in chlorine doped CdTe thin filmsValdna, Vello; Hiie, Jaan; Gavrilov, AlekseiAbstracts POLYSE2000 / p. 36

book article

35

journal article

Defects in chlorine-doped CdTe thin filmsValdna, Vello; Hiie, Jaan; Gavrilov, AlekseiSolid state phenomena2001 / p. 155-160 : ill

journal article

36

book

Defektide ja rikete seoste analüüs : lepingu Lep16039 aruanne [Võrguväljaanne]Palu, Ivo; Keel, Matti; Tammoja, Heiki2016 https://www.elektrilevi.ee/-/doc/6305157/ettevottest/defektide_rikete_aruanne.pdf

book

37

book article

Defektide tasakaalu kinnikülmutamise arvutamine tsinksulfiidisLott, Kalju; Türn, LeoXXIII Eesti keemiapäevad : teaduskonverentsi ettekannete referaadid1997 / lk. 71

book article

38

book article

DefSim-based exercises for studying defects in CMOS gatesJutman, Artur; Pleskacz, Witold A.; Boiko, Nikolai; Ubar, Raimund-JohannesEWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden2006 / p. 23-26 : ill

book article

39

journal article

Dependence of the friction coefficient on roughness parameters during early stage fretting of (Al,Ti)N coated surfacesPodgurski, Vitali; Adoberg, Eron; Surženkov, Andrei; Kimmari, Eduard; Viljus, Mart; Mikli, Valdek; Hartelt, M.; Wäsche, R.; Šima, M.; Kulu, PriitWear2011 / p. 853-858 : ill https://www.sciencedirect.com/science/article/abs/pii/S0043164811001815

journal article

40

journal article

Detection of axial cracks in pipes using focused guided wavesFletcher, Sam; Lowe, Michael John Stewart; Ratassepp, Madis; Brett, ColinJournal of nondestructive evaluation2012 / p. 56-64 : ill https://www.researchgate.net/publication/234956324_Detection_of_Axial_Cracks_in_Pipes_Using_Focused_Guided_Waves

journal article

41

journal article EST / journal article ENG

Detection of surface defects in metals : a case studyMärtens, Olev; Land, Raul; Metshein, Margus; Abdullayev, Anar; Vennikas, Henri; Le Moullec, Yannick; Rist, MarekProceedings of the Estonian Academy of Sciences2025

journal article EST / journal article ENG

42

book article

Deterministic defect-oriented test generation for combinational circuitsRaik, Jaan; Ubar, Raimund-Johannes; Sudbrock, Joachim; Kuzmicz, Wieslaw; Pleskacz, Witold A.LATW 2005 : 6th IEEE Latin-American Test Workshop : March 30 - April 2, 2005, Salvador, Bahia, Brazil : [digest of papers]2005 / p. 325-330 : ill

book article

43

book article

Diffusion acoustique d'un moyeu et d'une paleCite, Nicolas; Chati, Farid; Leon, Fernand; Maze, Gerard; Naar, Hendrik; Klauson, Aleksander10eme Congres Francais d'Acoustique : Lyon, 12-16 Avril 20102010 / [5] p. : ill https://theses.hal.science/CFA2010-APU12/hal-00537192v1

book article

44

dissertation

Doping and defect thermodynamic equilibrium in ZnSLott, Kalju2000 http://www.ester.ee/record=b1316491*est

dissertation

45

journal article

Effects of long-range forces in nonlinear dynamics of crystals : creation of defects and self-localized vibrationsHaas, Mati; Hižnjakov, Vladimir; Klopov, Mihhail; Shelkan, A.IOP conference series : materials science and engineering2010 / 1, p. 01245 : ill https://iopscience.iop.org/article/10.1088/1757-899X/15/1/012045

journal article

46

journal article EST / journal article ENG

Elastic models of defects in two-dimensional crystalsKolesnikova, Anna; Orlova, T. S.; Hussainova, Irina; Romanov, AlexeyPhysics of the solid state2014 / p. 2573-2579 : ill https://doi.org/10.1134/S1063783414120166 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

47

journal article EST / journal article ENG

Electronic structure and defect states in bismuth and antimony sulphides identified by energy-resolved electrochemical impedance spectroscopyMiliaieva, D.; Nadaždy, V.; Koltsov, M. A.; Lopez, C.; Saeeyekta, H.; Kuliček, J.; Cazorla, C.; Saucedo, E.; Grzibovskis, Raitis; Vembris, Aivars; Krunks, Malle; Spalatu, NicolaeJournal of Physics Energy2025 / art. 035012 https://doi.org/10.1088/2515-7655/add59f

journal article EST / journal article ENG

48

book article EST / book article ENG

Enhanced Crack Detection in Composite Plates : Integrating Haar Wavelet Transform with Convolutional Neural NetworksMehrparvar, Marmar; Majak, Jüri; Karjust, Kristo6th International Conference on Multidisciplinary Design Optimization and Applications (MDOA 2024)2025 / art. 01008 https://www.e3s-conferences.org/articles/e3sconf/abs/2025/31/e3sconf_mdoa2025_01008/e3sconf_mdoa2025_01008.html https://doi.org/10.1051/e3sconf/202563101008

book article EST / book article ENG

49

book article

Evaluating fault emulation on FPGAEllervee, Peeter; Raik, Jaan; Tihhomirov, Valentin; Tammemäe, KalleField-Programmable Logic and Applications : 14th International Conference, FPL 2004 : Antwerp, Belgium, August 30-September 1, 2004 : proceedings2004 / p. 354-363 : ill https://link.springer.com/chapter/10.1007/978-3-540-30117-2_37

book article

50

journal article EST / journal article ENG

Extended defects in ZnO : efficient sinks for point defectsAzarov, Alexander; Rauwel, Protima; Hallen, Anders; Monakhov, Edouard; Svensson, Bengt G.Applied physics letters2017 / p. 022103-1 - 022103-5 : ill https://doi.org/10.1063/1.4973463 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

defektid (subject term)

types of item

subject term 2