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book article

Failure times of gypsum boardsJust, Alar; Schmid, Joachim; König, J.Structures in Fire : proceedings of the 6th International Conference (SiF'10) : June 2-4, 2010, East Lansing, MI2010 / p. 593-601

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52

book article

Fatigue strength prediction of carbide composites by considering pores to be equivalent to small defects : effect of hot isostatic pressingSergejev, Fjodor; Preis, Irina; Kübarsepp, JakobBook of abstracts : International Symposium on Fatigue Design and Material Defects : Trondheim, Norway, 23-25 May 20112011 / p. 41-42

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53

book article

Ga- and In-doping of ZnSLott, Kalju; Raukas, Maie; Vishnjakov, A.; Grebennik, A.E-MRS - IUMRS 2000 Spring Meeting : European Materials Research Society 2000 Spring Meeting : May 30-June 2, 2000, Strasbourg (France) : final book of abstracts2000 / p. P-7

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54

journal article EST / journal article ENG

Generation and development of damage in double forged tungsten in different combined regimes of irradiation with extreme heat loadsPaju, Jana; Väli, Berit; Laas, Tõnu; Shirokova, Veroonika; Antonov, MaksimJournal of nuclear materials2017 / p. 91-102 : ill https://doi.org/10.1016/j.jnucmat.2017.07.042 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

55

journal article

Growth surface morphology, and electrical resistivity of fully strained substoichiometric epitaxial TiN_x (0.67 ≤ x < 1.0) layers on MgO(001)Shin, C.-S.; Rudenja, Sergei; Gall, D.; Hellgren, N.; Lee, T.-Y.; Petrov, I.; Greene, J.E.Journal of applied physics2004 / 1, p. 356-362 : ill https://www.researchgate.net/publication/228927816_Growth_surface_morphology_and_electrical_resistivity_of_fully_strained_substoichiometric_epitaxial_TiN_067_x_10_layers_on_MgO_001

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56

book article

Hierarchical analysis of short defects between metal lines in CMOS ICPleskacz, Witold A.; Jenihhin, Maksim; Raik, Jaan; Rakowski, Michal; Ubar, Raimund-Johannes; Kuzmicz, WieslawProceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy2008 / p. 729-734 : ill https://ieeexplore.ieee.org/document/4669309

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57

book article

Hierarchical approach to test generation for digital systems at system, circuit and defect levelsUbar, Raimund-Johannes45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband2000 / S. 711-716 : Ill

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58

book article

Hierarchical defect level test quality analysisBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

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59

book article

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings2000 / p. 69-74 : ill https://ieeexplore.ieee.org/document/873781

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60

book article

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 151-156 https://ieeexplore.ieee.org/document/873781

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61

journal article

Hierarchical physical defect reasoning in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Brik, MarinaEstonian journal of engineering2011 / 3, p. 185-200

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62

journal article

Hierarchical test generation for combinational circuits with real defects coverageCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2002 / p. 1141-1149 : ill https://www.sciencedirect.com/science/article/pii/S002627140200080X

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63

journal article

High temperature antistructure disorder in undoped ZnSLott, Kalju; Šinkarenko, Svetlana; Türn, Leo; Nirk, Tiit; Öpik, Andres; Kallavus, Urve; Gorokhova, Elena; Grebennik, A.; Vishnjakov, A.Physica B : condensed matter2009 / 23/24, p. 5006-5008 : ill https://www.sciencedirect.com/science/article/pii/S0921452609009910

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64

journal article

High temperature defect equilibrium in ZnS:Cu single crystalsLott, Kalju; Šinkarenko, Svetlana; Türn, Leo; Nirk, Tiit; Öpik, Andres; Kallavus, Urve; Gorokhova, Elena; Grebennik, A.; Vishnjakov, A.Physica status solidi (b)2010 / 7, p. 1662-1665

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65

journal article

High temperature investigation of ZnS:Ga and CdSe:GaLott, Kalju; Nirk, Tiit; Volobujeva, Olga; Šinkarenko, Svetlana; Türn, Leo; Kallavus, Urve; Grebennik, A.; Vishnjakov, A.Physica B2006 / Proceedings of the 23rd International Conference on Defects in Semiconductors : ICDS-23 : held in Awaji Island, Japan, 24-29 July, 2005. p. 764-766 : ill https://www.sciencedirect.com/science/article/pii/S0921452605015796

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66

book article

How to generate high quality tests for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, Jaan2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 22004 / p. 459-462 : ill http://dx.doi.org/10.1109/SMICND.2004.1403048

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67

book article

Implementation of focused guided waves to locate axial defects in pipesFletcher, Sam; Lowe, Michael John Stewart; Ratassepp, Madis; Brett, C.Review of progress in quantitative nondestructive evaluation. Volume 292010 / p. 223-230 https://doi.org/10.1063/1.3362398

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68

book article

Implementation of focused guided waves to locate axial defects in pipesFletcher, Sam; Ratassepp, Madis; Brett, C.; Lowe, Michael John StewartThe 48th Annual British Conference on NDT : Blackpool, UK, 14-17 September, 20092009 / ? p

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69

book article

Influence of point defects on optoelectronic properties of II-IV semiconductorsKukk, Peeter-Enn; Krustok, Jüri; Altosaar, Mare; Aarna, HeitiAbstract booklet of the First International Conference on Mathematical Science of chalcogenide and Diamond-structure Semiconductors, Chernovtsi, 1994. Vol. 11994 / p. 129

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70

journal article

Interaction between point defects, extended defects and impurities in the Si-SiO2 system during the process of its formationKropman, Daniel; Kärner, T.; Abru, Uno; Ugaste, Ülo; Mellikov, EnnThin solid films2004 / 1/2, p. 53-57 : ill https://www.sciencedirect.com/science/article/abs/pii/S0921510704003459

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71

journal article

Interaction between point defects, extended defects and impurities in the Si-SiO2 system during the process of its formationKropman, Daniel; Kärner, T.; Abru, Uno; Ugaste, Ülo; Mellikov, Enn; Kauk, MaritMaterials science and engineering : B2004 / p. 295-298 : ill https://www.sciencedirect.com/science/article/abs/pii/S0921510704003459

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72

book article

Interaction of point defects with impurities in the Si-SiO2 system and its influence on the properties of the interfaceKropman, Daniel; Mellikov, Enn; Lott, Kalju; Kärner, T.; Heinmaa, I.Getterring and defect engineering in semiconductor technology XIII : CADEST 2009 : proceedings of the XIIIth International Autumn Meeting, Döllnsee-Schorfheide, north of Berlin, Germany, September 26 - October 02, 20092010 / p. 145-148 : ill https://www.sciencedirect.com/science/article/abs/pii/S0040609009014564

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73

book article

Investigating defects in digital circuits by Boolean differential equationsKruus, Helena; Orasson, Elmet; Robal, Tarmo; Ubar, Raimund-JohannesThe 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)2004 / p. 432-435

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74

book article

Investigation of EXCESS Zn in ZnOLott, Kalju; Volobujeva, Olga; Raukas, Maie; Türn, Leo; Grebennik, A.; Vishnjakov, A.10th International Conference on Shallow-level Centers in Semiconductors : SLCS-10, Warsaw, Poland, July 24-27, 2002 : program & abstracts2002 / p. 43 https://onlinelibrary.wiley.com/doi/abs/10.1002/pssc.200306186

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75

journal article

Investigation of excess Zn in ZnOLott, Kalju; Volobujeva, Olga; Raukas, Maie; Türn, Leo; Grebennik, A.; Vishnjakov, A.Physica status solidi (c)2003 / 2, Proceedings 10th International Conference on Shallow Level Centers in Semiconductors (SLCS-10) : Warsaw, Poland, 24-27 July 2002, p. 622-625 : ill https://onlinelibrary.wiley.com/doi/abs/10.1002/pssc.200306186

journal article

defektid (subject term)

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