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30426

book article

Hidden champions of EstoniaRiisalu, Rein; Leppiman, AnuHidden champions in CEE and Turkey : carving out a global Niche2013 / p. 183-199 : tab

book article

30427

journal article EST / journal article ENG

The hidden power of emotions : How psychological factors influence skill development in smart technology adoptionGerli, Paolo; Clement, Jessica; Esposito, Giovanni; Mora, Luca; Crutzen, NathalieTechnological Forecasting and Social Change2022 / Article nr. 121721 https://doi.org/10.1016/j.techfore.2022.121721 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

30428

book article

Hidden secrets of transverse coastal upwelling jets revealed using a synergy of data in the Gulf of Finland, Baltic SeaDelpeche-Ellmann, Nicole Camille; Soomere, TarmoAbstracts : [BSSC 2019]2019 / p. 112 https://www.su.se/polopoly_fs/1.446756.1566224624!/menu/standard/file/abstracts_A5_ny.pdf

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30429

book article

A hierarchical algorithm for moving vehicle identification based on acoustic noise analysisAstapov, Sergei; Riid, AndriProceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2012 : Warsaw, Poland, 24-26 May, 20122012 / p. 467-472 : ill https://ieeexplore.ieee.org/document/6226235

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30430

book article

Hierarchical analysis of short defects between metal lines in CMOS ICPleskacz, Witold A.; Jenihhin, Maksim; Raik, Jaan; Rakowski, Michal; Ubar, Raimund-Johannes; Kuzmicz, WieslawProceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy2008 / p. 729-734 : ill https://ieeexplore.ieee.org/document/4669309

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30431

book article

A hierarchical approach for devising area efficient concurrent online checkersNiazmand, Behrad; Azad, Siavoosh Payandeh; Ghasempouri, Tara; Raik, Jaan; Jervan, GertProceedings 2nd IEEE International Test Conference in Asia : ITC-Asia 2018, 15-17 August 2018, Harbin, China2018 / p. 139-144 : ill https://doi.org/10.1109/ITC-Asia.2018.00034

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30432

book article

Hierarchical approach to test generation for digital systems at system, circuit and defect levelsUbar, Raimund-Johannes45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband2000 / S. 711-716 : Ill

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30433

journal article

Hierarchical approaches to test generation and fault simulationUbar, Raimund-JohannesRadioelectronics and informatics2003 / p. 204

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30434

book article

Hierarchical attention network to manage processing resources of CPSsTammemäe, KalleSelPhyS Program2017 https://www.ict.tuwien.ac.at/selphys2017/program

book article

30435

book article

A hierarchical automatic test pattern generator based on using alternative graphsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 19971997 / p. 415-420

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30436

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Hierarchical calculation of malicious faults for evaluating the fault-toleranceUbar, Raimund-Johannes; Devadze, Sergei; Jenihhin, Maksim; Raik, Jaan; Jervan, Gert; Ellervee, PeeterProceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China2008 / p. 222-227 : ill https://ieeexplore.ieee.org/document/4459544

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30437

journal article

Hierarchical conceptual clustering based on quantile method for identifying microscopic details in distributional dataUmbleja, Kadri; Ichino, Manabu; Yaguchi, HiroyukiAdvances in data analysis and classification2020 / 30 p. : ill https://doi.org/10.1007/s11634-020-00411-w

journal article

30438

book article

Hierarchical concurrent test generation for synchronous sequential circuitsUbar, Raimund-Johannes; Brik, MarinaProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 533-538 : ill

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30439

book article

Hierarchical defect level test quality analysisBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

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30440

book article

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 151-156 https://ieeexplore.ieee.org/document/873781

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30441

book article

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings2000 / p. 69-74 : ill

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30442

book article

Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patternsUbar, Raimund-Johannes; Jutman, ArturProceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 19991999 / p. 437-442 : ill

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30443

book article

Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Evartson, Teet; Lensen, Harri; Aarna, Margit5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada2007 / [6] p. [CD-ROM]

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30444

book article

Hierarchical fault simulation for finite state machinesBrik, Marina; Raik, Jaan; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 145-148 : ill

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30445

book article

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

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30446

book article

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

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30447

book article

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

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30448

book article

Hierarchical language for development of distributed algorithmsKaldma, TarmoProceedings of the Fourth Symposium on Programming Languages and Software Tools, Visegrad, Hungary, June 9-10, 19951995 / p. 195-208

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30449

book article

Hierarchical language for development of distributed algorithmsKaldma, TarmoThe 3rd Baltic Summer School on Information Technology and Systems Engineering, 1-5 August, 1995, Klaipeda : theses1995 / p. 25-28

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30450

journal article EST / journal article ENG

Hierarchical microstructures and strengthening mechanisms of nano-TiC reinforced CoCrFeMnNi high-entropy alloy composites prepared by laser powder bed fusionChen, Hongyu; Kosiba, Konrad; Lu, Twen; Yao, Ning; Liu, Yang; Wang, Yonggang; Prashanth, Konda Gokuldoss; Suryanarayana, ChallapalliJournal of Materials Science & Technology2023 / p. 245-259 : ill https://doi.org/10.1016/j.jmst.2022.06.053 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

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