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93076

book article

Tervitusi talvisest Torontost (AD 2009)Träss, OlevFraternitas 2009 : korp!Fraternitas Liviensis2010 / lk. 115

book article

93077

newspaper article

Tervitusi Tšehhimaalt : [Praha Majandusülikooli lõpetanu ning praktikavahetusprogrammis osaleja Jakub Mrazi muljeid töötamisest TTÜ rahvusvahelise õppe talituses]Mraz, JakubMente et Manu2005 / 18. mai, lk. 6 : portr https://www.ester.ee/record=b1242496*est

newspaper article

93078

book article

Teräsrakenteiden suunnittelu VenäjälläLoorits, KaljuVenäjän rakentamisen oppikirja. Osa B, Talonrakennustekniikka2001 / s. 49-95 : ill

book article

93079

book article

Tesauruse mitu paletNilbe, SirjeEesti Raamatukoguhoidjate Ühingu aastaraamat 19951996 / lk. 51-67 https://www.ester.ee/record=b1209172*est

book article

93080

journal article

Tesla ja uued surmakiiredRaadio1934 / lk. 281

journal article

93081

newspaper article

Tesla konkurendiks pürgiv Eesti superakude tootja Skeleton kutsus Tallinna Tehnikaülikooli appi maailma tippkeskust looma [Võrguväljaanne]geenius.ee2021 "Tesla konkurendiks pürgiv Eesti superakude tootja Skeleton kutsus Tallinna Tehnikaülikooli appi maailma tippkeskust looma"

newspaper article

93082

newspaper article

Tesman alustas kolledžihoone rekonstrueerimistMeie Maa2003 / 16. dets., lk. 1

newspaper article

93083

newspaper article

TEST ⟩ Kas sina tead, kuidas hinnata elektrisüsteemi seisundit ja miks rekonstrueeritakse tramme? Pane end proovile! [Võrguväljaanne], Kas sina tead, kuidas hinnata elektrisüsteemi seisundit ja miks rekonstrueeritakse tramme? Pane end proovile! [Võrguväljaanne]postimees.ee2022 "Kas sina tead, kuidas hinnata elektrisüsteemi seisundit ja miks rekonstrueeritakse tramme? Pane end proovile!"

newspaper article

93084

book

Test : inglise keele test keskastmeleKokkota, Valmar2005 https://www.ester.ee/record=b2007894*est

book

93085

book article

Test and calibration laboratories accreditation system in EstoniaKulderknup, Edi; Nanits, Mats-MaiduProceedings of the Second National DAAAM Conference in Estonia : Science'961997 / p. 63-67: ill

book article

93086

book article

A test bench to study propulsion drives of electric vehicles [Electronic resource]Rassõlkin, Anton; Vodovozov, ValeryCPE 2013 : 2013 International Conference on Compatibility and Power Electronics (CPE) : June 5-7, 2013, Ljubljana, Slovenia : conference proceedings2013 / p. 275-279 : ill [CD-ROM]

book article

93087

book article

A test bench to study propulsion drives of electric vehicles with a supercapacitor storage system [Electronic resource]Rassõlkin, Anton; Vodovozov, ValeryМеждународная Научно-Техническая Конференция "Силовая Электроника и Энергоэффективность" : 23-27.IX 2013, Алушта, Крым2013 / [3] p. : ill [CD-ROM]

book article

93088

book article

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, VineethInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 33-37 : ill

book article

93089

book article

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

book article

93090

book article

Test cost minimization for hybrid BISTJervan, Gert; Peng, Zebo; Ubar, Raimund-JohannesIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings2000 / p. 283-298 : ill https://ieeexplore.ieee.org/abstract/document/887168

book article

93091

journal article

Test cover calculation in digital systems with word-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaВестник Томского государственного университета2002 / с. 315-319 : ил

journal article

93092

book article

Test development and deployment tool-set for mixed-signal and digital devicesMellik, Andres; Raik, JaanBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 163-166 : ill

book article

93093

book article

Test driven domain modellingPiho, Gunnar; Tepandi, Jaak; Parman, Marko; Puusep, Viljam; Roost, MartMIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings2011 / p. 576-581 https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5967121

book article

93094

journal article EST / journal article ENG

A test for the generic strong-accessibility of meromorphic nonlinear systemsCarravetta, Francesco; Sarafrazi, Mohammad Amin; Bartosiewicz, Zbigniew; Kotta, ÜlleIEEE transactions on automatic control2020 / p. 867-873 https://doi.org/10.1109/TAC.2019.2921645 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

93095

book

Test für praktische deutsche GrammatikLomakina, Valentina1987 https://www.ester.ee/record=b2170574*est

book

93096

book article

Test generation : a hierarchical approachJervan, Gert; Ubar, Raimund-Johannes; Peng, Z.; Eles, PetruSystem-level test and validation of hardware/software systems2005 / p. 67-81 : ill

book article

93097

journal article

Test generation and knowledge base browsing facilities in expert system shell HELIParmakson, PriitTallinna Tehnikaülikooli Toimetised1991 / lk. 26-40: ill

journal article

93098

book article

Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill

book article

93099

book article

Test generation for digital systemsUbar, Raimund-JohannesDigest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy1983 / p. 374-377

book article

93100

book article

Test generation for digital systems at functional levelUbar, Raimund-Johannes; Kuchcinski, Ktzysztof; Peng, Z.Research report LiTH-IDA-R-90-06, Linköping University, Sweden1990 / p. 1-21

book article

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