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93101

book article

Test generation for digital systems based on alternative graphsUbar, Raimund-JohannesDependable Computing - EDCC-1 : First European Dependable Computing Conference, Berlin, Germany, October 1994 : proceedings1994 / p. 151-164: ill

book article

93102

journal article

Test generation for expert systems with fuzzy truth valuesTepandi, JaakBulletin for studies and exchanges in fuzziness and its applications1989 / p. 83-92

journal article

93103

book article

Test generation for finite state machinesUbar, Raimund-Johannes; Brik, MarinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 233-236: ill

book article

93104

book article

Test generation for microprocessor control mechanismsLohuaru, Tõnu; Ubar, Raimund-JohannesFTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)1987 / p. 305-311

book article

93105

book article

Test generation for microprocessors on alternative graphsAlango, Villem; Kont, Toomas; Ubar, Raimund-Johannes33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik1988 / p. 11-14

book article

93106

book article

Test generation for sequential digital systems based on symbolic simulationSkobtsov, Vadim; Skobtsov, Yu.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 341-344: ill

book article

93107

book article

Test generation techniques and algorithmsUbar, Raimund-Johannes; Gramatova, Elena; Fisherova, MariaHandbook of testing electronic systems2005 / p. 99-173 : ill

book article

93108

book article

Test generation with structurally synthesized BDD modelsRaik, Jaan; Ubar, Raimund-JohannesProceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 19981998 / p. 66-68

book article

93109

book article

Test method for determining radiation absorptivity and emissivity coefficients of ACSR conductorsKiitam, Ivar18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]2019 / p. 185-186 : ill https://www.ester.ee/record=b5183874*est

book article

93110

journal article

Test method for the total content of non-volatile phenols in wastewaterJohannes, Ille; Mölder, Leevi; Tiikma, LaineOil shale1998 / 3, p. 232-238

journal article

93111

journal article

Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocolsBengtsson, Tomas; Kumar, Shashi; Ubar, Raimund-Johannes; Jutman, Artur; Peng, ZeboIET computers and digital techniques2008 / 6, p. 445-460

journal article

93112

book article

Test methods for determination of design parameters for fastenersFranke, Steffen; Franke, Bettina; Tuhkanen, EeroDesign of connections in timber structures : a state-of-the-art report by COST action FP1402/WG32018 / p. 33–59 : ill https://www.costfp1402.tum.de/fileadmin/w00btl/www/All_Members/Sandhaas__C.__Munch-Andersen__J._Dietsch__P.__Design_of_Connections_in_Timber_Structures.pdf

book article

93113

book article

Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148

book article

93114

book article

Test pattern generation for microprocessor systems on the alternative graph modelUbar, Raimund-JohannesProceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 19831985 / p. 403-410

book article

93115

dissertation

Test program generation for microprocessor systemsDušina, Julia1993 https://www.ester.ee/record=b2090526*est

dissertation

93116

book article

Test results of practical value-centric business development methodologyRandmaa, Merili; Otto, Tauno; Howard, Thomas J.Proceedings of NordDesign 2014 Conference2014 / p. 642-651 : ill

book article

93117

book article

Test scenario generator learning for model-based testing of mobile robotsKanter, Gert; Liibert, Marti IngmarSystem assurances : modeling and management2022 / p. 67-84 https://doi.org/10.1016/B978-0-323-90240-3.00005-9

book article

93118

journal article EST / journal article ENG

Test scenario specification language for model-based testingHalling, Evelin; Vain, Jüri; Boyarchuk, Artem; Illiashenko, OlegInternational Journal of Computing2019 / p. 408-421 : ill http://www.computingonline.net/computing/article/view/1611 https://doi.org/10.47839/ijc.18.4.1611 Journal metrics at Scopus Article at Scopus

journal article EST / journal article ENG

93119

book article

Test set minimization using bipartite graphsMarkus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 175-178: ill

book article

93120

book article

Test setup for measuring medium voltage power cable and joint temperature in high current tests using thermocouples [Online resource]Taklaja, Paul; Kiitam, Ivar; Hyvönen, Petri; Klüss, Joni34th Electrical Insulation Conference : Hotel Bonaventure, Montreal, Qc, Canada, 19-22 June 2016 : proceedings2016 / p. 480-483 : ill https://doi.org/10.1109/EIC.2016.7548642

book article

93121

book article

Test strategy for a 486 computer multichip moduleMagnhagen, BengtBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 339-340: ill

book article

93122

book article

Test synthesis from register-transfer level descriptionsRaik, Jaan; Paomets, PriiduBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 311-314: ill

book article

93123

journal article

Test synthesis with alternative graphsUbar, Raimund-JohannesIEEE design & test of computers1996 / Spring, p. 48-57: ill

journal article

93124

journal article

Test system for fault detection and diagnosis in microprocessor control devicesUbar, Raimund-Johannes; Lohuaru, Tõnu; Männisalu, Mati; Pukk, P.; Vanamölder, E.Tallinna Tehnikaülikooli Toimetised1990 / lk. 63-77: ill

journal article

93125

book article

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China2003 / p. 318-325 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

book article

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