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Ubar, Raimund-Johannes (author)

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301

book article

Functional test program generation for digital systemsUbar, Raimund-Johannes; Dušina, Julia; Krupnova, Helena; Storožev, Sergei; Zaugarov, ViktorTestmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 19941994 / p. 14-18: ill

book article
302

book article

Funktsionaalsete alternatiivsete graafide mudeli süntees digitaallülitusteleKivi, E.; Ubar, Raimund-JohannesXXXII üliõpilaste teaduslik-tehnilise konverentsi ettekannete teesid : pühendatud V. I. Lenini 110. sünniaastapäevale : 16.-18. aprill 19801981 / lk. 91 https://www.ester.ee/record=b1322611*est

book article
303

book article

GA-based test generation for sequential circuitsBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 30-34

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304

book article

Gate-level modelling of NBTI-induced delays under process variationsCopetti, Thiago; Cardoso Medeiros, Guilherme; Bolzani Poehls, Leticia; Vargas, Fabian; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 75-80 : ill http://dx.doi.org/10.1109/LATW.2016.7483343

book article
305

book article

Generating directed tests for C programs using RTL ATPGRaik, Jaan; Drenkhan, Tiia; Jenihhin, Maksim; Viilukas, Taavi; Karputkin, Anton; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings of the IEEE 13th Workshop on RTL and High Level Testing (WRTLT'12)2012 / p. 1-6

book article
306

book article

Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault modelUbar, Raimund-Johannes; Borrione, DominiqueXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 51-54

book article
307

book article

Generic interconnect BIST for Network-on-ChipJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanDDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings2005 / p. 224-227 : ill

book article
308

journal article

Guest editorialLande, Tor Sverre; Ubar, Raimund-JohannesAnalog integrated circuits and signal processing1999 / 1, p. 5-6

journal article
309

journal article

[H. Bleeker, P.Van Den Eijnden, F.De Jong. Boundary-scan test. Boston : Kluwer Academic, 1993. 225 p. : book review]Ubar, Raimund-JohannesEngineering applications of artificial intelligence1994 / p. 86-87 https://www.ester.ee/record=b1200126*est

journal article
310

book

Handbook of testing electronic systemsNovak, Ondrej; Gramatova, Elena; Ubar, Raimund-Johannes; Jutman, Artur; Raik, Jaan2005 https://www.ester.ee/record=b2102523*est

book
311

newspaper article

Hea teaduse odav väljamüükUbar, Raimund-JohannesPostimees2017 / lk. 6

newspaper article
312

book article

Hierarchical analysis of short defects between metal lines in CMOS ICPleskacz, Witold A.; Jenihhin, Maksim; Raik, Jaan; Rakowski, Michal; Ubar, Raimund-Johannes; Kuzmicz, WieslawProceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy2008 / p. 729-734 : ill

book article
313

book article

Hierarchical approach to test generation for digital systems at system, circuit and defect levelsUbar, Raimund-Johannes45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband2000 / S. 711-716 : Ill

book article
314

journal article

Hierarchical approaches to test generation and fault simulationUbar, Raimund-JohannesRadioelectronics and informatics2003 / p. 204

journal article
315

book article

A hierarchical automatic test pattern generator based on using alternative graphsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 19971997 / p. 415-420

book article
316

book article

Hierarchical calculation of malicious faults for evaluating the fault-toleranceUbar, Raimund-Johannes; Devadze, Sergei; Jenihhin, Maksim; Raik, Jaan; Jervan, Gert; Ellervee, PeeterProceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China2008 / p. 222-227 : ill

book article
317

book article

Hierarchical concurrent test generation for synchronous sequential circuitsUbar, Raimund-Johannes; Brik, MarinaProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 533-538 : ill

book article
318

book article

Hierarchical defect level test quality analysisBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

book article
319

book article

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings2000 / p. 69-74 : ill

book article
320

book article

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 151-156 https://ieeexplore.ieee.org/document/873781

book article
321

book article

Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patternsUbar, Raimund-Johannes; Jutman, ArturProceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 19991999 / p. 437-442 : ill

book article
322

book article

Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Evartson, Teet; Lensen, Harri; Aarna, Margit5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada2007 / [6] p. [CD-ROM]

book article
323

book article

Hierarchical fault simulation for finite state machinesBrik, Marina; Raik, Jaan; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 145-148 : ill

book article
324

book article

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

book article
325

book article

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 835, displaying 301 - 325

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1. Ubar, Raimund-Johannes 1941
2. Räämet, Raimund 1918-2004
3. Aare, Johannes 1915-2000
4. Ahrenschild, Johannes (-1936)
5. Alaots, Johannes
6. Aljak, Arnold Johannes
7. Allik, Erich-Johannes
8. Avik, Eduard Johannes
9. Drechsler, Wolfgang Johannes Max
10. Ehala, Johannes 1986
11. Hint, Johannes 1914-1985
12. Johannes, Ille 1939
13. Johannson, Johannes
14. Johanson, Johannes
15. Juhans, Johannes 1874-1956
16. Kajander, Aleksi Oskar Johannes 1994
17. Kiiwet, Johannes
18. Kiivet, Johannes 1879-1967
19. Kivit, Johannes
20. Kollist, Johannes 1884-1937
21. Kollist, Johannes Theodor
22. Korv, August Johannes 1911-1981
23. Krimmer, Robert Johannes
24. Käpp, Martin Johannes
25. Langel, Johannes 1900-1985
26. Langell, Johannes
27. Livländer, Robert Johannes
28. Madise, Johannes 1920
29. Meitre, Johannes 1906-1978
30. Messer, Johannes
31. Mäll, Johannes 1911-1981
32. Mühlman, Johannes
33. Mühlmann, Johannes 1888-1936
34. Notermans, Antonius Johannes Hubertus 1959
35. Nuudi, Johannes 1895-1975
36. Palo, Johannes 1925-1960
37. Pals, Johannes 1903-1941
38. Pello, Johannes 1958
39. Pervik, Johannes 1892-1958
40. Presmann, Johannes 1942
41. Putk, Aksel-Johannes 1928-1999
42. Püümann, Mait Johannes
43. Roes, Johannes 1914
44. Russwurm, Johannes
45. Russvurm, Johannes 1855-1939
46. Russvurm, Johannes Carl Gysbert Immanuel
47. Sakeus, Johannes 1880-1934
48. Taimsalu, Johannes 1891-1942
49. Teiman, Johannes
50. Teimann, Johannes Rudolf (kuni 22.05.1935)
51. Tomson, Johannes
52. Tuulre, Feliks Johannes 1908-1987
53. Veerus, Johannes Voldemar 1897-1972
54. Verus, Johannes Voldemar
55. Vuhk, Oskar Johannes

1. Ubar, Raimund-Johannes, 1941-
2. Hagelberg, Raimund, 1927-2012
3. Räämet, Raimund, 1918-2004
4. Aare, Johannes, 1915-2000
5. Aavik, Johannes, 1880-1973
6. Avik, Eduard Johannes, 1891-1942
7. Bender, Naatan Johannes
8. Granö, Johannes Gabriel
9. Hint, Johannes, 1914-1985
10. Johannes Paulus II, paavst, 1920-2005
11. Kert, Johannes
12. Kiivet, Johannes, 1879-1967
13. Kollist, Johannes
14. Käis, Johannes
15. Lang, Johannes
16. Maide, Johannes Voldemar
17. Mossov, Johannes
18. Pals, Johannes, 1903-1941
19. Pello, Johannes
20. Putk, Aksel-Johannes
21. Rammul, Aleksander Johannes, 1875-1949
22. Steinbrunn, Johannes
23. Taimsalu, Johannes, 1891-1942
24. Talu, Martin Johannes
25. Veerus, Johannes Voldemar, 1897-1972
26. Veski, Johannes Voldemar, 1873-1968
27. Voll, Johannes

1. Johannes Mittus, vasevalamise tööstus

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