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13326

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Deep-learning based blood cells classification and initial edge device implementationIslam, Md. Raisul; Le Moullec, Yannick; Afrin, Fariha; Ahmed, Faisal2022 18th Biennial Baltic Electronics Conference (BEC)2022 / 6 p. : ill https://doi.org/10.1109/BEC56180.2022.9935610

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13327

journal article

Deep-level photoluminescence of doped CdTe in 0,8 eV regionKrustok, Jüri; Lõo, A.; Piibe, ToomasJournal of physics and chemistry of solids1991 / 8, p. 1037-1038

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13328

newspaper article

Deeptech Sandbox toob Eestisse süvatehnoloogia eksperdid tippkeskustest üle Euroopa : Järgmisel Deeptech Sandboxil on kohal valdkonna tipptegijad Cambridge’i ülikoolistdigi.geenius.ee2023 Deeptech Sandbox toob Eestisse süvatehnoloogia eksperdid tippkeskustest üle Euroopa : Järgmisel Deeptech Sandboxil on kohal valdkonna tipptegijad Cambridge’i ülikoolist

newspaper article

13329

journal article EST / journal article ENG

Deep-ultraviolet emitter : rare-earth-free ZnAl2O4 nanofibers via a simple wet chemical routeRojas Hernandez, Rocio Estefania; Rubio-Marcos, Fernando; Romet, Ivo; Del Campo, Adolfo; Gorni, Giulio; Hussainova, Irina; Fernandez, Jose Francisco; Nagirnyi, VitaliInorganic Chemistry2022 / p. 11886-11896 https://doi.org/10.1021/acs.inorgchem.2c01646 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

13330

book article

DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability AssessmentAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimIEEE European Test Symposium (ETS) : Venice, Italy, 22-26 May 2023 : proceedings2023 / 6 p. : ill https://doi.org/10.1109/ETS56758.2023.10174133

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13331

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DeepVigor+: Scalable and Accurate Semi-Analytical Fault Resilience Analysis for Deep Neural NetworksAhmadilivani, Mohammad Hasan; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimarXiv.org2024 / 14 p. : ill https://doi.org/10.48550/arXiv.2410.15742

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Related publications 1

Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks

13332

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Deering rohuniitja proovitööde valguselTehnika Põllumajanduses1939 / lk. 30

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13333

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[Deeringi reaskülvimasin]Uus Talu1927 / lk. 259 : fot

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13334

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"Deeringi" uus niidumasinPõllumees1932 / lk. 291-292 : joon

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13335

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"Deering-Mc Cormik" niidumasina 100 a. juubel 1831-1931Tehnika Põllumajanduses1931 / lk. 45-48 : fot

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13336

book article

Defect analysis of renovated facade walls with etics solutions in cold climate conditionsLiisma, Eneli; Sepri, Raili; Raado, Lembi-Merike; Lill, Irene; Witt, Emlyn David Qivitoq; Sulakatko, Virgo; Põldaru, MattiasCESB 16 - Central Europe Towards Sustainable Building 2016 : Innovations for Sustainable Future : [book of abstracts]2016 / p. 65-66

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13337

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Defect analysis of renovated facade walls with etics solutions in cold climate conditions [Online resource]Liisma, Eneli; Sepri, Raili; Raado, Lembi-Merike; Lill, Irene; Witt, Emlyn David Qivitoq; Sulakatko, Virgo; Põldaru, MattiasCESB 16 - Central Europe Towards Sustainable Building 2016 : Innovations for Sustainable Future : [electronic proceedings]2016 / p. 174-181 : ill

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13338

book article

Defect oriented fault coverage of 100stuck-at fault test setsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 511-516 : ill https://repo.pw.edu.pl/info.seam?ps=20&id=WUT7e20f35d67ae45d3b2d1264d7a4ba722&lang=en&pn=1&cid=156607

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13339

journal article

Defect structure of Cl and Cu doped CdS heat treated in Cd and S2 vapourKukk, Peeter-Enn; Altosaar, MareJournal of solid state chemistry1983 / p. 1-11

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13340

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Defect structure of Cu‐doped cadmium selenideÖpik, Andres; Varvas, JüriPhysica status solidi (a) : applications and materials science1982 / p. 467-473 : ill https://doi.org/10.1002/pssa.2210740212 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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13341

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Defect structure of silver-doped cadmium tellurideNirk, TiitTallinna Tehnikaülikooli Toimetised1994 / lk. 3-12: ill

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13342

journal article EST / journal article ENG

Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopyKask, Erkki; Grossberg, Maarja; Josepson, Raavo; Salu, Pille; Timmo, Kristi; Krustok, JüriMaterials science in semiconductor processing2013 / p. 992-996 : ill https://doi.org/10.1016/j.mssp.2013.02.009 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

13343

book article

Defect-oriented BIST quality analysisKruus, Helena; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 153-156 : ill

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13344

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Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

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13345

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Defect-oriented library builder and hierarchical test generationCibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 163-168 : ill

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13346

journal article

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

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13347

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Defect-oriented modul-level fault diagnosis in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 81-86

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13348

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Defect-oriented test- and layout-generation for standard-cell ASIC designsSudbrock, Joachim; Raik, Jaan; Ubar, Raimund-Johannes; Kuzmicz, Wieslaw; Pleskacz, Witold A.Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 79-82 : ill https://ieeexplore.ieee.org/document/1559781

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13349

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Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

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13350

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Defect-oriented test generation using probabilistic estimationCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 131-136 : ill

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