prindi

Testability guided hierarchical test generation with decision diagrams

autor
Ubar, Raimund-Johannes
Raik, Jaan
Nõmmeots, Tanel
vastutusandmed
R.Ubar, J.Raik, T.Nõmmeots
allikas
20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002
ilmumiskoht
Copenhagen
kirjastus/väljaandja
TechnoData
ilmumisaasta
2002
leheküljed
p. 265-271
Ubar, R.-J., Raik, J., Nõmmeots, T. Testability guided hierarchical test generation with decision diagrams // 20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002. Copenhagen : TechnoData, 2002. p. 265-271.