Scalable algorithm for structural fault collapsing in digital circuits
vastutusandmed
Raimund Ubar, Lembit Jürimägi, Elmet Orasson, Jaan Raik
allikas
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 171-176 : ill
konverentsi nimetus, aeg
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), October 5-7, 2015
konverentsi toimumispaik
Daejeon, Korea
võtmesõna
ISBN
978-1-4673-9140-5
märkused
Bibliogr.: 24 ref
TTÜ struktuuriüksus
keel
inglise
Ubar, R., Jürimägi, L., Orasson, E., Raik, J. Scalable algorithm for structural fault collapsing in digital circuits // 2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea. [S.l.] : IEEE, 2015. p. 171-176 : ill.