prindi

High-level test data generation for software based self-test in microprocessors

autor
Oyeniran, Adeboye Stephen
Jasnetski, Artjom
Tšertov, Anton
Ubar, Raimund-Johannes
vastutusandmed
Adeboye Stephen Oyeniran, Artjom Jasnetski, Anton Tsertov, Raimund Ubar
allikas
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
ilmumiskoht
Piscataway
kirjastus/väljaandja
IEEE
ilmumisaasta
2017
leheküljed
p. 86-91 : ill
konverentsi nimetus, aeg
6th Mediterranean Conference on Embedded Computing (MECO), 11-15 June 2017
konverentsi toimumispaik
BAR, Montenegro
leitav
https://doi.org/10.1109/MECO.2017.7977167
märksõna
mikroprotsessorid
testimine
võtmesõna
microprocessors
fault models
test generation
fault simulation
software-based self-test
ISSN
2377-5475
ISBN
978-1-5090-6741-1
märkused
Bibliogr.: 23 ref
TTÜ struktuuriüksus
arvutisüsteemide instituut
keel
inglise
Oyeniran, A.S., Jasnetski, A., Tšertov, A., Ubar, R. High-level test data generation for software based self-test in microprocessors // 2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017. Piscataway : IEEE, 2017. p. 86-91 : ill. https://doi.org/10.1109/MECO.2017.7977167