High-level test data generation for software based self-test in microprocessors
statement of authorship
Adeboye Stephen Oyeniran, Artjom Jasnetski, Anton Tsertov, Raimund Ubar
source
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
location of publication
Piscataway
publisher
year of publication
pages
p. 86-91 : ill
conference name, date
6th Mediterranean Conference on Embedded Computing (MECO), 11-15 June 2017
conference location
BAR, Montenegro
subject term
ISSN
2377-5475
ISBN
978-1-5090-6741-1
notes
Bibliogr.: 23 ref
TTÜ department
language
inglise
Oyeniran, A.S., Jasnetski, A., Tšertov, A., Ubar, R. High-level test data generation for software based self-test in microprocessors // 2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017. Piscataway : IEEE, 2017. p. 86-91 : ill.