Otsing - TalTech teadusportaal

kuva

reasta

1

artikkel kogumikus

Double phase fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Adeboye StephenDSD 2015 : 18th Euromicro Conference on Digital Systems Design : 26-28 August 2015, Funchal, Madeira, Portugal2015 / p. 700-705 : ill

artikkel kogumikus

2

artikkel kogumikus EST / artikkel kogumikus ENG

Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, JaanVLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers2016 / p. 23-45 : ill https://doi.org/10.1007/978-3-319-46097-0_2 Conference Proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

3

artikkel kogumikus

Lower bounds of the size of shared structurally synthesized BDDsUbar, Raimund-Johannes; Mironov, DmitriProceedings of the 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 23-25, 2014, Warsaw, Poland2014 / p. 77-82 : ill

artikkel kogumikus

4

artikkel kogumikus

Modeling sequential circuits with shared structurally synthesized BDDsUbar, Raimund-Johannes; Marenkov, Mihhail; Mironov, Dmitri; Viies, VladimirProceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 20142014 / p. 130-135 : ill

artikkel kogumikus

5

artikkel ajakirjas

Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 303-324 : ill http://dx.doi.org/10.2298/FUEE1103303U

artikkel ajakirjas

6

artikkel kogumikus

Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill

artikkel kogumikus

7

raamat

Structural decision diagrams in digital test : theory and applicationsUbar, Raimund-Johannes; Raik, Jaan; Jenihhin, Maksim; Jutman, Artur2024 https://doi.org/10.1007/978-3-031-44734-1 https://www.ester.ee/record=b5734441*est

raamat

8

artikkel kogumikus

Structurally synthesized multiple input BDDs for simulation of digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, Artur16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009 : Yasmine Hammamet, Tunesia, 13-19 December, 20092009 / p. 451-454 : ill http://dx.doi.org/10.1109/ICECS.2009.5410895

artikkel kogumikus

Binary Decision Diagrams (võtmesõna)

teaviku laadid

võtmesõna 120