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semiconductor device measurement (võtmesõna)
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FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedance
Priidel, Eiko
;
Pesti, Ksenija
;
Min, Mart
;
Ojarand, Jaan
;
Märtens, Olev
2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings
2021
/
5 p. : ill
https://doi.org/10.1109/I2MTC50364.2021.9460073
artikkel kogumikus
Seotud publikatsioonid
1
Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
2
artikkel ajakirjas EST
/
artikkel ajakirjas ENG
Impact of orientation on the bias of SRAM-based PUFs
Abideen, Zain Ul
;
Wang, Rui
;
Perez, Tiago Diadami
;
Schrijen, Geert-Jan
;
Pagliarini, Samuel Nascimento
IEEE design & test
2024
/
p. 14-20
https://doi.org/10.1109/MDAT.2023.3322621
Journal metrics at Scopus
Article at Scopus
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Article at WOS
artikkel ajakirjas EST
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artikkel ajakirjas ENG
Seotud publikatsioonid
1
Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina
Kirjeid leitud 2, kuvan
1 - 2
võtmesõna
163
1.
semiconductor device measurement
2.
power semiconductor device
3.
semiconductor device failure
4.
semiconductor device manufacture
5.
semiconductor device modeling
6.
Semiconductor device packaging
7.
semiconductor device reliability
8.
device-to-device (D2D)
9.
device-to-device (D2D) communication
10.
device-to-device communication
11.
cardiac device therapy
12.
cooling device performance
13.
Counter Improvised Explosive Device (C-IED)
14.
device
15.
device capacity
16.
device characterisation
17.
Device characterization
18.
device modeling
19.
device therapy
20.
Discrete power device
21.
energy saving device (ESD)
22.
energy storage device
23.
implantable medical device
24.
Improvised Explosive Device (IED)
25.
low-power device
26.
massive device connectivity
27.
medical device
28.
metal semiconductor contacts
29.
metal-oxide-semiconductor field-effect transistors (MOSFETs)
30.
microfluidic device
31.
motion-reduction device
32.
on-device transfer learning
33.
plasma-focus device
34.
Portable device
35.
power semiconductor devices
36.
power semiconductor switches
37.
projected device density of states (PDDOS)
38.
p-type transparent semiconductor
39.
Real device
40.
robotic device
41.
semiconductor
42.
semiconductor band bending
43.
semiconductor crystals
44.
semiconductor devices
45.
semiconductor diodes
46.
semiconductor doping
47.
semiconductor heterojunctions
48.
semiconductor technology
49.
Semiconductor/electrolyte contact
50.
semiconductor-metal transition
51.
storage device
52.
Superconducting device noise
53.
Wearable device
54.
wide band gap semiconductor devices
55.
advanced measurement infrastructure
56.
angle measurement
57.
atmospheric measurement uncertainty
58.
bioimpedance measurement
59.
blood pressure measurement
60.
blood sugar measurement
61.
business school learning rate measurement instrument
62.
characteristics of phasor measurement units
63.
concentration measurement
64.
Contactless conductivity measurement
65.
continuous measurement
66.
corrosion measurement
67.
current measurement
68.
Density measurement
69.
differential measurement
70.
distribution-level phasor measurement units (D-PMUs)
71.
driving dynamics measurement
72.
DTS measurement
73.
dynamic measurement feedback
74.
effect measurement
75.
efficiency measurement
76.
electric impedance measurement
77.
electrical resistance measurement
78.
electron density measurement
79.
electronic measurement
80.
employees' performance measurement
81.
Energy efficiency measurement
82.
experimental measurement
83.
filter transmission measurement
84.
flow measurement
85.
force measurement
86.
four-electrode impedance measurement
87.
frequency measurement
88.
harmonic measurement
89.
high speed measurement
90.
hygrothermal measurement and modelling
91.
impedance measurement
92.
impedance spectrum measurement
93.
Inerial Measurement Unit (IMU)
94.
inertial measurement unit
95.
inertial measurement unit (IMU)
96.
input/output current measurement
97.
light measurement
98.
lock-in measurement
99.
loss measurement
100.
losses measurement
101.
magnetic measurement
102.
maximum permissible error (deviation) of measurement result
103.
measurement
104.
measurement accuracy
105.
measurement and testing
106.
measurement by CCD cameras
107.
measurement campaign
108.
measurement coil
109.
measurement devices
110.
measurement error in household surveys
111.
Measurement errors
112.
measurement feedback
113.
measurement gaps
114.
measurement methodologies
115.
measurement model
116.
measurement standards
117.
measurement uncertainty
118.
measurement units
119.
micro characterization and surface roughness measurement
120.
mooring measurement
121.
network measurement
122.
non-contact optical measurement
123.
non-invasive measurement
124.
optical variables measurement
125.
organizational learning measurement instruments
126.
organizational learning rate measurement
127.
partial discharge measurement
128.
passive measurement
129.
perfomance measurement
130.
performance measurement
131.
performance measurement system
132.
phasor measurement
133.
phasor measurement unit
134.
Phasor measurement unit (PMU)
135.
phasor measurement units
136.
pollution measurement
137.
position measurement
138.
power measurement
139.
power quality measurement
140.
power quality measurement equipment
141.
quality performance measurement
142.
radiated EMI measurement
143.
real-time measurement
144.
residual current measurement
145.
road condition measurement
146.
road performance measurement
147.
single far-field measurement
148.
single measurement
149.
single-molecule measurement
150.
Spectrophotometric measurement
151.
static measurement feedback
152.
synchronous measurement
153.
temperature measurement
154.
testing of phasor measurement units
155.
Time measurement
156.
torque measurement
157.
tracer-gas measurement
158.
tyre velocity measurement
159.
wave height measurement
160.
wave measurement
161.
wear measurement
162.
vibration measurement
163.
voltage measurement
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